Scanning probe microscope, molecular processing method using the
scanning probe microscope and DNA base arrangement detecting method
    62.
    发明授权
    Scanning probe microscope, molecular processing method using the scanning probe microscope and DNA base arrangement detecting method 失效
    扫描探针显微镜,使用扫描探针显微镜的分子加工方法和DNA碱基排列检测方法

    公开(公告)号:US5363697A

    公开(公告)日:1994-11-15

    申请号:US875694

    申请日:1992-04-29

    Applicant: Tohru Nakagawa

    Inventor: Tohru Nakagawa

    Abstract: This invention relates to a scanning probe microscope which examines or processes directly the structure of substance surfaces at the molecular or atomic level, and a method for processing molecules using a scanning probe microscope and a method for detecting DNA base arrangement. A scanning probe microscope has a probe approaching or contacting the substance surface to detect a physical quantity between the substance surface and the probe, wherein the physical quantity is what is interacted or chemically reacted between the substance surface and the molecules or atom groups which act as a sensor and are fixed on the probe, scanning at an atomic level of precision. Therefore, surface structure within a microscopic region can be examined or processed at the molecular or atomic level. A method for detecting DNA base arrangement with any one of three or four kinds of probes fixed with any one of four different kinds of molecules interacting four kinds of bases consisting of DNA, by approaching single stranded DNA fixed on a substrate, measuring the force and scanning by an atomic force microscope at an atomic level of precision.

    Abstract translation: 本发明涉及一种扫描探针显微镜,该扫描探针显微镜直接检查分子或原子水平的物质表面的结构,以及使用扫描探针显微镜处理分子的方法和检测DNA碱基排列的方法。 扫描探针显微镜具有接近或接触物质表面的探针以检测物质表面和探针之间的物理量,其中物理量是物质表面与作为的物质表面和分子或原子团之间的相互作用或化学反应的物质 传感器并固定在探头上,以原子级精度扫描。 因此,微观区域内的表面结构可以在分子或原子水平进行检查或处理。 用四种不同种类的分子中的任何一种分离的任何一种探针中的任何一种探测DNA的检测方法,其通过接近固定在基底上的单链DNA,测量力和与 用原子力显微镜以原子精度扫描。

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