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185 条记录 (耗时 0.031 秒)

    Electropolishing process means for an inner surface of a long tube
    71.
    发明授权
    Electropolishing process means for an inner surface of a long tube 失效
    电解抛光工艺用于长管的内表面

    公开(公告)号：US06660138B2

    公开(公告)日：2003-12-09

    申请号：US10076289

    申请日：2002-02-19

    申请人： Chun-Hung Lin ,  Chen-Der Tsai ,  Yun-Sheng Chung ,  Chin-Ching Wu ,  Yuh-Feng Chen ,  Hann-Tsong Wang

    发明人： Chun-Hung Lin ,  Chen-Der Tsai ,  Yun-Sheng Chung ,  Chin-Ching Wu ,  Yuh-Feng Chen ,  Hann-Tsong Wang

    IPC分类号： B23H1100

    CPC分类号： C25F3/16 ,  C25F7/00

    摘要： The present invention is an electropolishing process and device for electropolishing an inner surface of a long tube, especially applied to a long tube of greater than two meters and a diameter range between 0.3 and 5 cm. Wherein, the present invention comprises at least one tube, and one complex electrode. An inner surface of the tube is for electropolishing process, and it is an anode as well. The electrode is a cathode and placed on a center of a partition. An end of electrode connects to a cable, the cable is driven by an axial mechanism to be moved the electrode toward the axial mechanism itself. Inside of the tube is full o electrolyte, which is an electrifying medium to connect both anode and cathode. Further, electrolyte cooperates with the electrode to perform the electropolishing process on the inner surface of tube.

    摘要翻译： 本发明是用于电解抛光长管的内表面的电抛光方法和装置，特别是应用于大于2米的长管和0.3和5cm之间的直径范围。 其中，本发明包括至少一个管和一个复合电极。 管的内表面用于电解抛光工艺，它也是阳极。 电极是阴极并放置在隔板的中心。 电极的一端连接到电缆，电缆由轴向机构驱动，以将电极移向轴向机构本身。 管内是全o电解质，它是连接阳极和阴极的通电介质。 此外，电解质与电极配合以在管的内表面上进行电解抛光处理。

    NOVEL REPLICASE CYCLING REACTION (RCR)
    73.
    发明申请
    NOVEL REPLICASE CYCLING REACTION (RCR) 有权

    公开(公告)号：US20230099592A1

    公开(公告)日：2023-03-30

    申请号：US17930292

    申请日：2022-09-07

    申请人： Shi-Lung LIN ,  Sam Lin ,  Chun-Hung Lin

    发明人： Shi-Lung LIN ,  Sam Lin ,  Chun-Hung Lin

    IPC分类号： C12N15/10 ,  A61P31/12

    摘要： This invention relates to a novel composition and method for RNA/mRNA production as well as amplification using viral RNA replicase and/or RNA-dependent RNA polymerase (RdRp) enzymes and the use of associated RNA/mRNA products thereof. The present invention can be used for manufacturing and amplifying all varieties of RNA/mRNA sequences carrying at least a replicase/RdRp-binding site in the 5′- or 3′-end, or both. The RNA/mRNA so obtained is useful for not only producing mRNA vaccines and/or RNA-based medicines but for generating the mRNA-associated proteins, peptides, and/or antibodies under an in-vitro as well as in-cell translation condition. Principally, the present invention is a novel RNA replicase/RdRp-mediated RNA/mRNA amplification method, namely Replicase Cycling Reaction (RCR). The RNA replicases involved in RCR include but not limited to viral and/or bacteriophage RNA-dependent RNA polymerases (RdRp) in either modified or non-modified mRNA and/or protein compositions, particularly coronaviral (e.g. COVID-19) and hepatitis C viral (HCV) RdRp enzymes.

    Integrated circuit test units with integrated physical and electrical test regions
    76.
    发明授权
    Integrated circuit test units with integrated physical and electrical test regions 有权
    集成电路测试单元，具有集成的物理和电气测试区域

    公开(公告)号：US08674355B2

    公开(公告)日：2014-03-18

    申请号：US12980865

    申请日：2010-12-29

    申请人： Huan-Chi Tseng ,  Heng-Hsin Liu ,  Shu-Cheng Kuo ,  Chien-Chang Lee ,  Chun-Hung Lin

    发明人： Huan-Chi Tseng ,  Heng-Hsin Liu ,  Shu-Cheng Kuo ,  Chien-Chang Lee ,  Chun-Hung Lin

    IPC分类号： H01L23/58

    CPC分类号： H01L23/544 ,  H01L22/34 ,  H01L23/4824 ,  H01L2223/54426 ,  H01L2924/0002 ,  H01L2924/00

    摘要： A device includes a test unit in a die. The test unit includes a physical test region including an active region, and a plurality of conductive lines over the active region and parallel to each other. The plurality of conductive lines has substantially a uniform spacing, wherein no contact plugs are directly over and connected to the plurality of conductive lines. The test unit further includes an electrical test region including a transistor having a gate formed of a same material, and at a same level, as the plurality of conductive lines; and contact plugs connected to a source, a drain, and the gate of the transistor. The test unit further includes an alignment mark adjacent the physical test region and the electrical test region.

    摘要翻译： 一种装置包括在模具中的测试单元。 测试单元包括物理测试区域，该物理测试区域包括有源区域和在该有源区域上并且彼此平行的多个导电线。 多个导线具有基本上均匀的间隔，其中没有接触插塞直接在多个导线上并连接到多个导线。 测试单元还包括电测试区域，该电测试区域包括晶体管，该晶体管具有由相同材料形成的栅极，并且处于与多个导线相同的电平; 以及连接到晶体管的源极，漏极和栅极的接触插塞。 测试单元还包括邻近物理测试区域和电测试区域的对准标记。

    Stacked solid-state electrolytic capacitor with multi-directional product lead frame structure
    78.
    发明授权
    Stacked solid-state electrolytic capacitor with multi-directional product lead frame structure 有权
    堆叠式固态电解电容器具有多方向产品引线框架结构

    公开(公告)号：US08390991B2

    公开(公告)日：2013-03-05

    申请号：US12833421

    申请日：2010-07-09

    申请人： Chi-Hao Chiu ,  Yui-Shin Fran ,  Ching-Feng Lin ,  Chun-Chia Huang ,  Chun-Hung Lin ,  Wen-Yen Huang

    发明人： Chi-Hao Chiu ,  Yui-Shin Fran ,  Ching-Feng Lin ,  Chun-Chia Huang ,  Chun-Hung Lin ,  Wen-Yen Huang

    IPC分类号： H01G9/04 ,  H01G9/15 ,  H01G4/228

    CPC分类号： H01G9/00

    摘要： A stacked solid state solid electrolytic capacitor includes a plurality of capacitor units, a substrate unit and a package unit. The substrate unit includes a positive guiding substrate and a negative guiding substrate. The positive guiding substrate has a positive exposed end integrally extended therefrom along a first predetermined direction. The negative guiding substrate has a first negative exposed end integrally extended therefrom along a second predetermined direction, a second negative exposed end integrally extended therefrom along a third predetermined direction, and a third negative exposed end integrally extended therefrom along a fourth predetermined direction. The first, the second, the third and the fourth predetermined directions are different. The capacitor units are stacked on top of one another and disposed on the negative guiding substrate. The package unit encloses the capacitor units, one part of the positive and one part of the negative guiding substrate.

    摘要翻译： 堆叠的固态固体电解电容器包括多个电容器单元，基板单元和封装单元。 基板单元包括正引导基板和负引导基板。 正引导基板具有沿着第一预定方向从其一体延伸的正露出端。 负引导基板具有沿着第二预定方向从其一体地延伸的第一负外露端，沿着第三预定方向从其一体地延伸的第二负外露端，以及沿着第四预定方向从其一体地延伸的第三负外露端。 第一，第二，第三和第四预定方向是不同的。 电容器单元堆叠在彼此的顶部并且设置在负引导基板上。 封装单元包围电容器单元，正极的一部分和负引导基板的一部分。

    Solar cell with two exposed surfaces of ARC layer disposed at different levels
    79.
    发明授权
    Solar cell with two exposed surfaces of ARC layer disposed at different levels 失效
    具有ARC层的两个暴露表面的太阳能电池处于不同的水平

    公开(公告)号：US08253010B2

    公开(公告)日：2012-08-28

    申请号：US12100786

    申请日：2008-04-10

    申请人： Sheng Yung Liu ,  Chin-Tien Yang ,  Chun-Hung Lin

    发明人： Sheng Yung Liu ,  Chin-Tien Yang ,  Chun-Hung Lin

    IPC分类号： H01L31/00

    CPC分类号： H01L31/022433 ,  H01L31/02168 ,  Y02E10/50 ,  Y02E10/52

    摘要： A solar cell includes a substrate, a conductor layer and an anti-reflection coating (ARC) layer. The substrate has a front side, a back side and a doped region adjacent to the front side. The conductor layer has a first portion embedded into the doped region and a second portion other than the first portion. The ARC layer has first and second exposed surfaces, first and second side surfaces and a bottom surface. The first side surface is connected to the first and second exposed surfaces. The second side surface is connected to the second exposed surface and the bottom surface disposed on the front side. The second portion is disposed in the ARC layer. The conductor layer has an exposed surface, which is exposed out of the ARC layer, and higher than the second exposed surface and substantially flush with an exposed surface of the ARC layer.

    摘要翻译： 太阳能电池包括基板，导体层和抗反射涂层（ARC）层。 衬底具有与前侧相邻的前侧，后侧和掺杂区。 导体层具有嵌入掺杂区域中的第一部分和除第一部分之外的第二部分。 ARC层具有第一和第二暴露表面，第一和第二侧表面和底表面。 第一侧表面连接到第一和第二暴露表面。 第二侧表面连接到第二暴露表面和设置在前侧的底表面。 第二部分设置在ARC层中。 导体层具有暴露于ARC层之外的暴露表面，并且高于第二暴露表面并且基本上与ARC层的暴露表面齐平。

    Integrated Circuit Test Units with Integrated Physical and Electrical Test Regions
    80.
    发明申请
    Integrated Circuit Test Units with Integrated Physical and Electrical Test Regions 有权
    具有综合物理和电气测试区域的集成电路测试单元

    公开(公告)号：US20120168751A1

    公开(公告)日：2012-07-05

    申请号：US12980865

    申请日：2010-12-29

    申请人： Huan-Chi Tseng ,  Heng-Hsin Liu ,  Shu-Cheng Kuo ,  Chien-Chang Lee ,  Chun-Hung Lin

    发明人： Huan-Chi Tseng ,  Heng-Hsin Liu ,  Shu-Cheng Kuo ,  Chien-Chang Lee ,  Chun-Hung Lin

    IPC分类号： H01L23/58

    CPC分类号： H01L23/544 ,  H01L22/34 ,  H01L23/4824 ,  H01L2223/54426 ,  H01L2924/0002 ,  H01L2924/00

    摘要： A device includes a test unit in a die. The test unit includes a physical test region including an active region, and a plurality of conductive lines over the active region and parallel to each other. The plurality of conductive lines has substantially a uniform spacing, wherein no contact plugs are directly over and connected to the plurality of conductive lines. The test unit further includes an electrical test region including a transistor having a gate formed of a same material, and at a same level, as the plurality of conductive lines; and contact plugs connected to a source, a drain, and the gate of the transistor. The test unit further includes an alignment mark adjacent the physical test region and the electrical test region.

    摘要翻译： 一种装置包括在模具中的测试单元。 测试单元包括物理测试区域，该物理测试区域包括有源区域和在该有源区域上并且彼此平行的多个导电线。 多个导线具有基本上均匀的间隔，其中没有接触插塞直接在多个导线上并连接到多个导线。 测试单元还包括电测试区域，该电测试区域包括晶体管，该晶体管具有由相同材料形成的栅极，并且处于与多个导线相同的电平; 以及连接到晶体管的源极，漏极和栅极的接触插塞。 测试单元还包括邻近物理测试区域和电测试区域的对准标记。