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公开(公告)号:US11410973B2
公开(公告)日:2022-08-09
申请号:US16939756
申请日:2020-07-27
Applicant: Micron Technology, Inc.
Inventor: Owen R. Fay , Randon K. Richards , Aparna U. Limaye , Dong Soon Lim , Chan H. Yoo , Bret K. Street , Eiichi Nakano , Shijian Luo
IPC: H01L25/065 , H01L25/18 , H01L23/00 , H01L23/552 , H01L23/64 , H01L21/78 , H01L21/66 , H01L25/00 , H01L23/66 , H01Q1/22 , H01Q1/48
Abstract: Disclosed is a microelectronic device assembly comprising a substrate having conductors exposed on a surface thereof. Two or more microelectronic devices are stacked on the substrate, each microelectronic device comprising an active surface having bond pads operably coupled to conductive traces extending over a dielectric material to via locations beyond at least one side of the stack, and vias extending through the dielectric materials at the via locations and comprising conductive material in contact with at least some of the conductive traces of each of the two or more electronic devices and extending to exposed conductors of the substrate. Methods of fabrication and related electronic systems are also disclosed.
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公开(公告)号:US20210183842A1
公开(公告)日:2021-06-17
申请号:US16715242
申请日:2019-12-16
Applicant: Micron Technology, Inc.
Inventor: Owen R. Fay , Chan H. Yoo
Abstract: An interposer comprises a semiconductor material and includes cache memory under a location on the interposer for a host device. Memory interface circuitry may also be located under one or more locations on the interposer for memory devices. Microelectronic device assemblies incorporating such an interposer and comprising a host device and multiple memory devices are also disclosed, as are methods of fabricating such microelectronic device assemblies.
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公开(公告)号:US11037910B2
公开(公告)日:2021-06-15
申请号:US16933649
申请日:2020-07-20
Applicant: Micron Technology, Inc.
Inventor: Chan H. Yoo , Ashok Pachamuthu
IPC: H01L25/065 , H01L25/00
Abstract: Semiconductor devices including stacked semiconductor dies and associated systems and methods are disclosed herein. In one embodiment, a semiconductor device includes a first semiconductor die coupled to a package substrate and a second semiconductor die stacked over the first semiconductor die and laterally offset from the first semiconductor die. The second semiconductor die can accordingly include an overhang portion that extends beyond a side of the first semiconductor die and faces the package substrate. In some embodiments, the second semiconductor die includes bond pads at the overhang portion that are electrically coupled to the package substrate via conductive features disposed therebetween. In certain embodiments, the first semiconductor die can include second bond pads electrically coupled to the package substrate via wire bonds.
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公开(公告)号:US10943860B2
公开(公告)日:2021-03-09
申请号:US16351816
申请日:2019-03-13
Applicant: Micron Technology, Inc.
Inventor: Chan H. Yoo , Eiichi Nakano
IPC: H01L23/498 , H01L23/00 , H01L21/56 , H01R12/77 , H01L41/047 , H01L23/538 , H01L23/31 , H01L21/683 , H01R12/62 , H01R12/71 , H01R12/70
Abstract: A semiconductor device assembly that includes a flexible member having a first portion connected to a substrate and a connector attached to a second portion of the flexible member. The connector is electrically connected to the substrate via a conducting layer within the flexible member. The substrate may be a semiconductor device, such as a chip. The connector may be configured to connect the semiconductor device to another semiconductor device assembly or a system board, such as a printed circuit board. A material may encapsulate at least a portion of the substrate of the semiconductor assembly. The semiconductor device assembly may be formed by selectively connecting the flexible member to a first substrate. A second substrate and connector may then be connected to the flexible member. A release layer may be used to release the assembly of the second substrate, flexible member, and connector from the first substrate.
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公开(公告)号:US20210036125A1
公开(公告)日:2021-02-04
申请号:US16530757
申请日:2019-08-02
Applicant: Micron Technology, Inc.
Inventor: Chan H. Yoo , George E. Pax , Yogesh Sharma , Gregory A. King , Thomas H. Kinsley , Randon K. Richards
IPC: H01L29/66 , H05K1/11 , H01L23/495
Abstract: Systems, apparatuses, and methods relating to memory devices and packaging are described. A device, such as a dual inline memory module (DIMM) or other electronic device package, may include a substrate with a layer of graphene configured to conduct thermal energy (e.g., heat) away from components mounted or affixed to the substrate. In some examples, a DIMM includes an uppermost or top layer of graphene that is exposed to the air and configured to allow connection of memory devices (e.g., DRAMs) to be soldered to the conducting pads of the substrate. The graphene may be in contact with parts of the memory device other than the electrical connections with the conducting pads and may thus be configured as a heat sink for the device. Other thin, conductive layers of may be used in addition to or as an alternative to graphene. Graphene may be complementary to other heat sink mechanisms.
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公开(公告)号:US10861782B2
公开(公告)日:2020-12-08
申请号:US16106791
申请日:2018-08-21
Applicant: Micron Technology, Inc.
Inventor: Hyunsuk Chun , Chan H. Yoo , Tracy N. Tennant
IPC: H01L23/498 , H01L21/48 , H01L23/31 , H01L23/00
Abstract: Embodiments of a redistribution layer structure comprise a low-k dielectric material and incorporating a reinforcement structure proximate and inward of a peripheral edge thereof, the reinforcement structure comprising conductive material electrically isolated from conductive paths through the RDL structure. Semiconductor packages including an embodiment of the RDL structure and methods of fabricating such RDL structures are also disclosed.
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公开(公告)号:US20200350293A1
公开(公告)日:2020-11-05
申请号:US16933649
申请日:2020-07-20
Applicant: Micron Technology, Inc.
Inventor: Chan H. Yoo , Ashok Pachamuthu
IPC: H01L25/065 , H01L25/00
Abstract: Semiconductor devices including stacked semiconductor dies and associated systems and methods are disclosed herein. In one embodiment, a semiconductor device includes a first semiconductor die coupled to a package substrate and a second semiconductor die stacked over the first semiconductor die and laterally offset from the first semiconductor die. The second semiconductor die can accordingly include an overhang portion that extends beyond a side of the first semiconductor die and faces the package substrate. In some embodiments, the second semiconductor die includes bond pads at the overhang portion that are electrically coupled to the package substrate via conductive features disposed therebetween. In certain embodiments, the first semiconductor die can include second bond pads electrically coupled to the package substrate via wire bonds.
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公开(公告)号:US10770398B2
公开(公告)日:2020-09-08
申请号:US16180538
申请日:2018-11-05
Applicant: Micron Technology, Inc.
Inventor: Chan H. Yoo , Owen R. Fay
IPC: H01L23/538 , H01L27/108 , H01L27/092 , H01L25/18
Abstract: A semiconductor device assembly that includes a second side of an interposer being connected to a first side of a substrate. A plurality of interconnects may be connected to a second side of the substrate. First and second semiconductor devices are connected directly to the first side of the interposer. The interposer is configured to enable the first semiconductor device and the second semiconductor device to communicate with each other through the interposer. The interposer may be a silicon interposer that includes complementary metal-oxide-semiconductor circuits. The first semiconductor device may be a processing unit and the second semiconductor device may be a memory device, which may be a high bandwidth memory device. A method of making a semiconductor device assembly includes attaching both a memory device and a processing unit directly to a first side of an interposer and connecting a second side of the interposer to a substrate.
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公开(公告)号:US20190252342A1
公开(公告)日:2019-08-15
申请号:US16397800
申请日:2019-04-29
Applicant: Micron Technology, Inc.
Inventor: Ashok Pachamuthu , Chan H. Yoo , Szu-Ying Ho , John F. Kaeding
IPC: H01L23/00 , H01L21/56 , H01L25/065 , H01L23/538 , H01L21/768 , H01L23/31 , H01L25/00 , H01L21/683
Abstract: Semiconductor device modules may include a semiconductor die and posts located laterally adjacent to the semiconductor die. A first encapsulant may laterally surround the semiconductor die and the posts. Electrical connectors may extend laterally from the posts, over the first encapsulant, to bond pads on an active surface of the semiconductor die. A protective material may cover the electrical connectors. A second encapsulant may cover the protective material and the electrical connectors. The second encapsulant may be in direct contact with the first encapsulant, the electrical connectors, and the protective material.
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公开(公告)号:US10276487B1
公开(公告)日:2019-04-30
申请号:US15787471
申请日:2017-10-18
Applicant: Micron Technology, Inc.
Inventor: Chan H. Yoo , Eiichi Nakano
IPC: H01L23/498 , H01R12/77 , H01L23/538 , H01L41/047 , H01L23/00 , H01L21/56 , H01R12/71 , H01R12/70
Abstract: A semiconductor device assembly that includes a flexible member having a first portion connected to a substrate and a connector attached to a second portion of the flexible member. The connector is electrically connected to the substrate via a conducting layer within the flexible member. The substrate may be a semiconductor device, such as a chip. The connector may be configured to connect the semiconductor device to another semiconductor device assembly or a system board, such as a printed circuit board. A material may encapsulate at least a portion of the substrate of the semiconductor assembly. The semiconductor device assembly may be formed by selectively connecting the flexible member to a first substrate. A second substrate and connector may then be connected to the flexible member. A release layer may be used to release the assembly of the second substrate, flexible member, and connector from the first substrate.
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