Abstract:
A system and method for region-of-interest-based bit-allocation scheme for video coding is provided. A method for encoding an image sequence of inter-frames and intra-frames includes grouping the inter-frames and the intra-frames in at least one group of pictures (GOP), and performing a frame-level bit-allocation to inter-frames and the intra-frames in the GOP. For each frame of the inter-frames and the intra-frames in the GOP, the method also includes partitioning the frame into a plurality of macroblocks, identifying macroblocks in the plurality of macroblocks as having regions of interest (ROI), and performing a macroblock level bit-allocation for the frame based on macroblocks identified as having ROI. The method further includes encoding the image sequence based on the bit-allocations, thereby producing an encoded image sequence, and outputting the encoded image sequence.
Abstract:
A graphene nanomesh includes a sheet of graphene having a plurality of periodically arranged apertures, wherein the plurality of apertures have a substantially uniform periodicity and substantially uniform neck width. The graphene nanomesh can open up a large band gap in a sheet of graphene to create a semiconducting thin film. The periodicity and neck width of the apertures formed in the graphene nanomesh may be tuned to alter the electrical properties of the graphene nanomesh. The graphene nanomesh is prepared with block copolymer lithography. Graphene nanomesh field-effect transistors (FETs) can support currents nearly 100 times greater than individual graphene nanoribbon devices and the on-off ratio, which is comparable with values achieved in nanoribbon devices, can be tuned by varying the neck width. The graphene nanomesh may also be incorporated into FET-type sensor devices.
Abstract:
Embodiments of the disclosed technology comprise software-based techniques that can be used to improve scan chain test pattern generation and scan chain failure diagnosis resolution. For example, certain embodiments can be used to generate high quality chain diagnosis test patterns that are able to isolate a scan chain defect to a single scan cell. Such embodiments can be used to generate a “complete” test set—that is, a set of chain diagnosis test patterns that is able to isolate any scan chain defect in a faulty scan chain to a single scan cell.
Abstract:
Disclosed herein are processes for removing water from organic compounds, especially polar compounds such as alcohols. The processes include a membrane-based dehydration step, using a membrane that has a dioxole-based polymer selective layer or the like and a hydrophilic selective layer, and can operate even when the stream to be treated has a high water content, such as 10 wt % or more. The processes are particularly useful for dehydrating ethanol.
Abstract:
Processes for removing water from organic solvents, such as ethanol. The processes include distillation in two columns operated at sequentially higher pressure, followed by treatment of the overhead vapor by one or two membrane separation steps.
Abstract:
Processes for dehydrating an organic/water solution by pervaporation or vapor separation using fluorinated membranes. The processes are particularly useful for treating mixtures containing light organic components, such as ethanol, isopropanol or acetic acid.
Abstract:
In accordance with an embodiment, a method of inserting advertisements into video content includes electronically filtering a first list of advertisements according to user preference data to determine a second list of advertisements. The video content has a plurality of segments, each segment of which is associated with a category from the plurality of categories. Furthermore, each advertisement in the first list of advertisements is associated with a video category from a plurality of categories, and electronically filtering includes filtering the first list of advertisements for the plurality of video segments on a segment by segment basis. The method further includes transmitting the second list of advertisements to a user device for insertion with the video content.
Abstract:
Systems and methods for communication systems with compressive sensing are disclosed. In one embodiment, a method of signal processing includes receiving a data packet at a processor. The data packet includes compressively measured data in wavelet transform coefficients of a signal. The signal is reconstructed using a clustering property of the wavelet transform coefficients.
Abstract:
Methods, apparatus, and systems for performing fault diagnosis are disclosed herein. In one exemplary embodiment, a failure log is received comprising entries indicative of compressed test responses to chain patterns and compressed test responses to scan patterns. A faulty scan chain in the circuit-under-test is identified based at least in part on one or more of the entries indicative of the compressed test responses to chain patterns. One or more faulty scan cell candidates in the faulty scan chain are identified based at least in part on one or more of the entries indicative of the compressed test responses to scan patterns. The one or more identified scan cell candidates can be reported. Computer-readable media comprising computer-executable instructions for causing a computer to perform any of the disclosed methods are also provided. Likewise, computer-readable media storing lists of fault candidates identified by any of the disclosed methods are also provided.
Abstract:
Technologies disclosed herein can be used to diagnose defects on die having both scan chain and system logic defects, including in situations where the presence of one or more faults in the system logic potentially obscures the detectability of one or more faults in the scan chains (or channels) and vice versa. At least some embodiments employ an iterative approach where at least some scan chain faults are identified, these chain faults are used to identify system logic faults, and then additional chain faults are identified using the system logic faults and vice versa. Failing bits can be partitioned into at least two groups: failing bits determined as being caused by system logic failures, and failing bits determined as being possibly caused by chain defects, system logic defects, or the compound effects of both types of defects.