Abstract:
A NOR flash nonvolatile memory device provides the memory cell size and a low current program process of a NAND flash nonvolatile memory device and the fast, asynchronous random access of a NOR flash nonvolatile memory device. The NOR flash nonvolatile memory device has an array of NOR flash nonvolatile memory circuits. Each NOR flash nonvolatile memory circuit includes a plurality of charge retaining transistors serially connected in a NAND string. A drain of a topmost charge retaining transistor is connected to a bit line associated with the serially connected charge retaining transistors and a source of a bottommost charge retaining transistor is connected to a source line associated with the charge retaining transistors. Each control gate of the charge retaining transistors on each row is commonly connected to a word line. The charge retaining transistors are programmed and erased with a Fowler-Nordheim tunneling process.
Abstract:
Embodiments of the invention provide a system and method for automatically managing a network port based on a calendar function. In one embodiment, a discovery protocol is provided for automatically discovering at least one port of at least one switch in a network. Furthermore, a management protocol is provided. The management protocol is configured to automatically manage the at least one port of the at least one switch in the network based on a programmable calendar function. In addition, a reconfiguration protocol is also provided. The reconfiguration protocol is configured to reconfigure the calendar function of the automatic management of the at least one port of the at least one switch in the network.
Abstract:
A control apparatus programs, reads, and erases trapped charges representing multiple data bits from a charge trapping region of a NMOS dual-sided charge-trapping nonvolatile memory cell includes a programming circuit, an erasing circuit, and a reading circuit. The programming circuit provides a negative medium large program voltage to cell's gate along with positive drain and source voltage to inject hot carriers of holes to two charge trapping regions, one of a plurality of threshold adjustment voltages representing a portion of the multiple data bits to the drain and source regions to set the hot carrier charge levels to the two charge trapping regions. The erasing circuit provides a very large positive erase voltage to tunnel the electrons from cell's channel to whole trapping layer including the two charge trapping regions. The reading circuit generates one of a plurality of threshold detection voltages to detect one of a plurality of programmed threshold voltages representative of multiple data bits, generates a drain voltage level to activate the charge-trapping nonvolatile memory cell.
Abstract:
A nonvolatile memory array includes a plurality of dual-sided charge-trapping nonvolatile memory cells arranged in rows and columns. The dual-sided charge-trapping nonvolatile memory cells on each column form at least one grouping that is arranged in a NAND series string of dual-sided charge-trapping nonvolatile memory cells. Each NAND series string has a top select transistor and a bottom select transistor. A plurality of bit lines is connected in a cross connective columnar bit line structure such that each column of the dual-sided charge-trapping nonvolatile memory cells is connected to an associated pair of bit lines. The first of the associated pair of bit lines is further connected to a first adjacent column of dual-sided charge-trapping nonvolatile memory cells and the second of the associated pair of bit lines is further associated with a second adjacent column of the dual-sided charge-trapping nonvolatile memory cells.
Abstract:
A flexible cable for an optical disk drive is disposed at a case comprising an upper case and a lower case. The flexible cable comprises a fastening part fixed at the lower case and a moving part extended in the reverse direction of one end of the fastening part to form a beginning end fixed at the case. An intensive area comprised of elastic material is disposed at the surface of the beginning end and nearby the beginning end of the moving part. A smooth layer is disposed at the inside of the upper case and located on the moving path of the intensive area disposed at the moving part to be touched by the intensive area when the moving part is bent reversely. A secondary intensive area is disposed at the moving part, and is extended or separated from the intensive area, to prevent the flexible cable drooping.
Abstract:
A combination EEPROM and Flash memory is described containing cells in which the stacked gate transistor of the Flash cell is used in conjunction with a select transistor to form an EEPROM cell. The select transistor is made sufficiently small so as to allow the EEPROM cells to accommodate the bit line pitch of the Flash cell, which facilitates combining the two memories into memory banks containing both cells. The EEPROM cells are erased by byte while the Flash cells erased by block. The small select transistor has a small channel length and width, which is compensated by increasing gate voltages on the select transistor and pre-charge bitline during CHE program operation.
Abstract:
A combination EEPROM and Flash memory is described containing cells in which the stacked gate transistor of the Flash cell is used in conjunction with a select transistor to form an EEPROM cell. The select transistor is made sufficiently small so as to allow the EEPROM cells to accommodate the bit line pitch of the Flash cell, which facilitates combining the two memories into memory banks containing both cells. The EEPROM cells are erased by byte while the Flash cells erased by block. The small select transistor has a small channel length and width, which is compensated by increasing gate voltages on the select transistor and pre-charge bitline during CHE program operation.
Abstract:
A novel FLASH-based EEPROM cell, decoder, and layout scheme are disclosed to eliminate the area-consuming divided triple-well in cell array and allows byte-erase and byte-program for high P/E cycles. Furthermore, the process-compatible FLASH cell for EEPROM part can be integrated with FLASH and ROM parts so that a superior combo, monolithic, nonvolatile memory is achieved. Unlike all previous arts, the novel combo nonvolatile memory of the present invention of ROM, EEPROM and FLASH or combination of any two is made of one unified, fully compatible, highly-scalable BN+ cell and unified process. In addition, its cell operation schemes have zero array overhead and zero disturbance during P/E operations. The novel combo nonvolatile memory is designed to meet the need in those markets requiring flexible write size in units of bytes, pages and blocks at a lower cost.
Abstract:
Disclosed are pellicle compositions and methods of making such pellicle compositions. The pellicle compositions provided include highly fluorinated polymers as well as fluorinated polymer/PVDF co-polymers.
Abstract:
A wind generator has a post, a rail mounted on the post and a blade assembly mounted rotatably on a top of the post. The blade assembly includes multiple blades radially formed around a base. Each blade has multiple vents, a slat and multiple relief valves. The slat is controllable mounted to open or close the vents, so as to adjust a force of wind applied to the blades. The relief valves are mounted pivotally to selectively cover valve holes formed through the blades to prevent the wind resistance force applied to the blades. Therefore, the wind generator can work in both turbulent and with a low wind force without breaking.