Abstract:
The present invention is in the field of flash memory. More particularly, embodiments of the present invention may provide a negative voltage for erasing when coupled to a memory cell to be erased and provide voltages to read or program when not coupled to a memory cell that is selected to be erased. Embodiments may also provide a high magnitude negative voltage to erase; a low impedance, low voltage current to read or program; and burn little to no current when not coupled to a memory cell that is selected to be erased.
Abstract:
A method and apparatus to provide a low voltage reference generation. The apparatus includes a reference voltage generator to receive a first input voltage signal and output a reference voltage signal. A voltage level detector electrically coupled to the reference voltage generator to receive the reference voltage signal and also receive a second input voltage signal. The voltage level detector compares the second input voltage signal to the reference voltage signal for generating an output based on the compared signals.
Abstract:
A method for a VPX banked architecture. The method of one embodiment first segments a memory array into at least two banks. Each bank including memory cells. The banks are provided with a supply voltage.
Abstract:
A circuit includes (i) an N-channel device having a gate, a source connected to low voltage, and a drain connected to a memory select gate, (ii) a P-channel device having a gate, a source, and a drain connected to the drain of the N-channel device, and (iii) a voltage supply connected to the source of the P-channel device, the voltage supply switching between a first high voltage and a first lower voltage. A gate driver supplies, to the gates of the N-channel and P-channel devices, a second high voltage, a second low voltage, or an intermediary voltage between the second high voltage and second low voltage. The gate driver supplies the intermediary voltage when the voltage supply switches between the first high voltage and first lower voltage.
Abstract:
A method for a VPX banked architecture. The method of one embodiment first segments a memory array into at least two banks. Each bank including memory cells. The banks are provided with a supply voltage.
Abstract:
A negative voltage charge pump including a regulation circuit. The regulation circuit has a level shift ladder including a plurality of level shifters connected in series. One end of the level shift ladder receives a power supply voltage and the other end receives the negative output of the charge pump. A feedback voltage is generated from one of the intermediate nodes of the level shift ladder. A differential amplifier generates a regulation voltage which varies as a function of the feedback voltage and a reference voltage. The regulation voltage is applied to a frequency control input of a voltage-controlled oscillator for generating a signal that drives the charge pump. Each of the level shifters of the level shift ladder can be a triple well device that can be configured to handle negative voltages without forward biasing an internal p-n junction.