摘要:
Data bits stored in memory cells are recognized by an ECC generator as data bit strings in a first direction and data bit strings in a second direction such that each data bit string in the first direction and each data bit string in the second direction share one data bit in common. The ECC controller identifies a data bit string in the first direction having more than one data bit in error based on a respective correction code in the first direction and identifies a data bit string in the second direction having more than one data bit in error based on a respective correction code in the second direction, and causes the data bit shared by the identified data bit string in the first direction and the identified data bit string in the second direction to be changed.
摘要:
Some embodiments include a voltage generator to generate a voltage to apply to a line used to access a memory cell of a memory device in which the voltage is applied to the line when the memory cell is not being accessed, and a power controller to cause the voltage to change during a time interval after a refresh operation of the memory device. Other embodiments including additional apparatus, systems, and methods are disclosed.
摘要:
Methods, apparatuses and systems are disclosed for preserving, verifying, and correcting data in DRAM device during a power-saving mode. In the power-saving mode, memory cells in the DRAM device may be refreshed using a self-refresh operation. This self-refresh operation may allow bit errors to occur in the DRAM device. However, by employing error correction coding (ECC), embodiments of the present invention may detect and correct these potential errors that may occur in the power-saving mode. Furthermore, a partial ECC check cycle is employed to check and correct a sub-set of the memory cells during a periodic self-refresh process that occurs during the power-saving mode.
摘要:
Provided is a fluorescent body for use in a near-ultraviolet excitation light-emitting element, comprising the compound given by formula (1), having part of element M1 and/or M2 therein replaced by an activation element (M3). M1aM2bPcO15(1) (Here, M1 represents one or more elements chosen from the group comprising Ca, Sr, and Ba; M2 represents one or more elements chosen from the group comprising Mg and Zn; a is a number between 1.5 and 2.5, inclusive; b is a number between 2.5 and 3.5, inclusive; and c is a number between 3.5 and 4.5, inclusive.) A fluorescent body in which M1 is Sr and M2 is Mg, and a fluorescent body in which M3 is Eu are preferable. Also provided are a fluorescent paste having the fluorescent body, and a near-ultraviolet excitation light-emitting element having the fluorescent body and having a high luminescent intensity.
摘要:
Various embodiments include apparatus and methods having circuitry to detect and/or assign identification information to dice arranged in a stack and coupled by conductive paths.
摘要:
Apparatus, methods, and systems are disclosed, including those that are to prevent a bias voltage from rising to a higher level than a storage node voltage as the bias voltage transitions to a ground level. For example a first voltage generator may be utilized to generate a bias voltage to bias a transistor in a memory cell in a memory array. A second voltage generator may be utilized to generate an plate voltage. The memory cell may include a transistor on a substrate and a capacitor. The capacitor connects from a drain of the transistor to the plate voltage. The storage node voltage is located at the drain of the transistor. A power controller may provide an off signal to the first and second voltage generators. The bias voltage may then transition to ground from a voltage less than zero volts. The rate of the bias voltage rise to ground is such that the bias voltage is maintained at less than or equal to the storage node voltage during the transition time period.
摘要:
Provided are phosphors that can exhibit higher emission luminance. Phosphors in which the activator is included in a compound represented by Formula xM1O.M2O.yM3O2 (wherein M1 represents one or more of a group comprising Ca, Sr and Ba, M2 represents Mg and/or Zn, M3 represents Si and/or Ge, x is a value in the range 4 to 6 and y is a value in the range 2 to 4). Phosphors represented by Formula M15(1−z)EuzM2M33O12 (wherein M1, M2 and M3 have the same meanings as above, and z is a value in the range 0.0001 to 0.3). The above phosphors have the same crystal structure as bredigite.
摘要:
To provide a display, etc. suitable for appropriately processing display in a case where it is expected, in three-dimensional graphics display, that a viewpoint will collide with an object, a storage unit (202) of a display (201) stores the coordinates of a viewpoint and an object in a virtual three-dimensional space, moving velocities, etc., an associating unit (203) associates a real time and a virtual time in the virtual three-dimensional space, a moving unit (204) calculates the coordinates of the viewpoint and object and moving velocities, etc. at the associated virtual time to update the values stored in the storage unit (202), a display unit (205) displays the state of the virtual three-dimensional space as observed from the viewpoint, and a determination unit (206) determines whether or not the viewpoint will collide with the object after a predetermined virtual threshold period elapses, and makes the elapse of the virtual time slower than the real time in a case where it is determined that a collision will occur.
摘要:
A method for forming a self-organized monomolecular film, including at least: dissolving an alkylsilane compound having at least an alkoxysilane group or a chlorosilane group at one end of a molecule in an organic solvent having a dielectric constant of 3.0 or more to 6.0 or less to obtain a solution; subsequently coating the solution on a base material or immersing the base material into the solution; and subsequently drying the solution located on the base material.
摘要:
Disclosed is a memory device including an error rate measurement circuit and a control circuit. The error rate measurement circuit, carrying a BIST circuit, reads out and writes data for an area for monitor bits every refresh period to detect an error rate (error count) with the refresh period. The control circuit performs control for elongating and shortening the refresh period so that a desired error rate will be achieved. The BIST circuit issues an internal command and an internal address and drives the DRAM from inside. The BIST circuit writes and reads out desired data, compares the monitor bits to expected values (error decision) and counts the errors.