Lithographic apparatus and device manufacturing method
    7.
    发明申请
    Lithographic apparatus and device manufacturing method 有权
    平版印刷设备和器件制造方法

    公开(公告)号:US20060103827A1

    公开(公告)日:2006-05-18

    申请号:US10990317

    申请日:2004-11-17

    IPC分类号: G03B27/54

    CPC分类号: G03F7/70425 G03F7/70291

    摘要: In a maskless lithography apparatus light deflected by a patterning array out of a path towards a substrate is directed onto a detector that detects malfunctions of the patterning array. If the patterning array is of a type which selectively diverts radiation in order to pattern the beam, the detector can use the radiation that is diverted out of the beam. Alternatively, a second beam of radiation, additional to the exposure radiation, can be provided.

    摘要翻译: 在无掩模光刻设备中,通过图案化阵列偏转到朝向衬底的路径的光被引导到检测器,其检测图案化阵列的故障。 如果图形阵列是选择性地转移辐射以便对光束进行图案化的类型,则检测器可以使用从光束转出的辐射。 或者,可以提供除了曝光辐射之外的第二辐射束。