公开(公告)号：US07227145B2

公开(公告)日：2007-06-05

申请号：US10883095

申请日：2004-07-01

申请人： Austin J. Brouns

发明人： Austin J. Brouns

IPC分类号： G01J5/00

CPC分类号： B82Y20/00 ,  G01J4/04 ,  G01J5/20 ,  G01J5/58 ,  G01J5/60 ,  G01J2005/0077 ,  H01L27/14652 ,  H01L27/14669 ,  H01L31/03046 ,  H01L31/035236 ,  H01L31/101 ,  Y02E10/544

摘要： A photodetector for detecting the polarization or wavelength of incident infrared radiation (IR) is described. The polarization sensitive photodetector operates using two sets of patches and corresponding cavities, the first set resonating with IR having a first polarization, while the second set resonates with IR having an orthogonal, second polarization. The polarization sensitive photodetector thus outputs two signals, proportional to the first and second polarizations, respectively. The wavelength sensitive photodetector operates using two sets of patches and corresponding cavities, the first set resonating at a first IR wavelength, while the second set resonates at a different IR wavelength. The wavelength sensitive photodetector thus outputs two signals, proportional to the first and second wavelengths, respectively. The patches have a length corresponding to odd multiples of the effective wavelength of the IR, while the thickness of the photodetector is typically one fourth of the effective wavelength.

摘要翻译： 描述了用于检测入射红外辐射（IR）的偏振或波长的光电检测器。 偏振敏感光电检测器使用两组贴片和相应的空腔进行操作，第一组谐振具有第一偏振的IR，而第二组谐振具有正交的第二极化的IR。 因此，偏振敏感光电检测器分别输出与第一和第二偏振成比例的两个信号。 波长敏感光电检测器使用两组贴片和相应的空腔进行操作，第一组谐振在第一IR波长，而第二组谐振在不同的IR波长。 因此，波长敏感光电检测器分别输出与第一和第二波长成比例的两个信号。 贴片具有对应于IR的有效波长的奇数倍的长度，而光电检测器的厚度通常为有效波长的四分之一。

公开(公告)号：US07138631B2

公开(公告)日：2006-11-21

申请号：US10881238

申请日：2004-06-30

申请人： Austin J. Brouns

发明人： Austin J. Brouns

IPC分类号： G01J5/00

CPC分类号： B82Y20/00 ,  G01J1/42 ,  H01L31/02327 ,  H01L31/03046 ,  H01L31/035236 ,  H01L31/1035 ,  Y02E10/544

摘要： A photodetector for detecting infrared radiation (IR) using a slab waveguide is described. The slab waveguide photodetector operates by resonating transverse magnetic or electric modes within the slab from the incident IR. An IR absorbing layer is located within the slab waveguide photodetector where the magnitude of the electric field vector is greatest. This permits the use of a thinner IR absorbing layer without sacrificing photoresponse. Multi-color slab waveguide photodetectors are permitted because multiple transverse magnetic or electric modes resonate within the slab waveguide. A reflective or transmissive grating is used to launch the IR into the IR absorbing layer through a cladding or antireflection layer.

公开(公告)号：US5477158A

公开(公告)日：1995-12-19

申请号：US130908

申请日：1993-10-04

申请人： Thomas A. Shafer ,  James H. McCurdy ,  Thomas R. Schimert ,  Austin J. Brouns

发明人： Thomas A. Shafer ,  James H. McCurdy ,  Thomas R. Schimert ,  Austin J. Brouns

IPC分类号： G01R31/265 ,  H01L21/66 ,  G01R31/26 ,  G01R27/06

CPC分类号： G01R31/2656 ,  H01L22/14

摘要： An apparatus (10) is provided for measuring the excess carrier lifetime in a semiconductor material, such as an HgCdTe wafer (MCT). The apparatus includes a computer controller (56) which automates the functions of the apparatus, including the operation of the shutter (28) to control the time the testing samples are exposed to the excitation energy from a laser (14), the laser energy intensity on the sample, the position of the wafer controlled by the computer controller operating a motorized sample positioner (39) and maintaining the temperature of the sample. Multiple samples are taken by the apparatus which are averaged and analyzed to result in a characterization of the carrier lifetime.

摘要翻译： 提供了一种用于测量诸如HgCdTe晶片（MCT）的半导体材料中的过量载流子寿命的装置（10）。 该装置包括一个计算机控制器（56），其使装置的功能自动化，包括快门（28）的操作，以控制测试样本暴露于来自激光器（14）的激发能量的时间，激光能量强度 在样品上，由操作电动样品定位器（39）的计算机控制器控制的晶片的位置并保持样品的温度。 多个样品由装置取出，其被平均和分析以导致载流子寿命的表征。