摘要:
A transistor for active matrix display and a method for producing the transistor (1). The transistor (1) includes a microcrystalline silicon film (5) and an insulator (3). The crystalline fraction of the microcrystalline silicon film (5) is above 80%. According to the invention, the transistor (1) includes a plasma treated interface (4) located between the insulator (3) and the microcrystalline silicon film (5) so that the transistor (1) has a linear mobility equal or superior to 1.5 cm2V−1s−1, shows threshold voltage stability and wherein the microcrystalline silicon film (5) includes grains (6) whose size ranges between 10 nm and 400 nm. The invention concerns as well a display unit having a line-column matrix of pixels that are actively addressed, each pixel comprising at least a transistor as described above.
摘要:
An apparatus for generating a plasma includes a vacuum chamber having a wall and a plasma source including one or more devices for exciting the plasma, and elements for generating a constant magnetic field around the plasma to couple microwave energy into plasma at electron cyclotron resonance, each of the devices for exciting the plasma including a coaxial microwave connector able to be connected to a microwave energy source and a loop antenna able to emit a microwave energy for exciting the plasma. The loop antenna of the one or more devices is positioned inside the vacuum chamber in order to be in contact with the plasma and the elements for generating a constant magnetic field include at least two magnetic dipoles placed on the wall of the vacuum chamber, each of the one or more devices for exciting the plasma having the two magnetic dipoles placed on both sides.
摘要:
A liquid crystal based polarimetric system, a process for the calibration of this polarimetric system, and a polarimetric measurement process intended for measuring the representative parameters of a sample in which the polarimetric system contains an excitation section emitting a light beam that passes through a polarization state generator (PSG) and onto a sample. After reflection or transmission by the sample, the beam goes through an analysis section with a polarization state detector (PSD). The PSG and PSD each have a first and a second liquid crystal elements LCj (j=1,2) having, for each LCj element of the PSG (respectively for each LCj element of the PSD), an extraordinary axis making an angle θj (resp. θ′j) with respect to the polarization direction (i), and a retardation δj (resp (δ′j) between its ordinary and extraordinary axes, the liquid crystals LCj elements being positioned in reverse order in the PSD with respect to the LCj elements of the PSG.
摘要:
The invention is about an FTIR ellipsometry device and process for characterization of samples of complex biological materials, notably micro-organisms. According to the device part of the invention, the sample is a preparation by a deposition of the biological material on a substrate, the FTIR ellipsometry device has means to illuminate the sample on the substrate with variable wavelength infrared light and to produce at each predetermined value of the variable wavelength a measurement, the measurements defining a characterization spectrum, each measurement being one of the following values: Ψ, one of ellipsometric parameters in relation to a complex reflectivity ratio; Δ, one of ellipsometric parameters in relation to a complex reflectivity ratio; a trigonometric function of Ψ and Δ; or a derivative at any order of one of the previous values.
摘要:
An electronic polarimetric imaging system for a colposcopy device designed for in vivo observation of a cervix, wherein the colposcopy device includes a light source for illuminating the observable cervix and at least visual elements for monitoring an image of the cervix, the illumination optical path towards the cervix and the image optical path coming back from the cervix being separated from one another over at least one portion of the paths thereof. The system includes a polarimetric adapter housing which is removable into the separated portion of the illumination and image optical paths, the polarimetric adapter housing including a polarisation state generator (PSG) on the illumination optical path and a polarisation analyser (PSA) on the image optical path, wherein the polarisation state generator (PSG) and the polarisation analyser (PSA) are controllable. Several levels of polarimetric characterisation are possible. An adaptor housing is also disclosed.
摘要:
A spectroscopic polarimetric system of broad spectral range, includes a light source suitable for emitting an incident light beam over a wavelength range, a polarization state generator (PSG), a polarization state analyzer (PSA), and a detector. The PSG and the PSA have respective elements for modulating the polarization of the light beam. The elements of the PSG for modulating polarization are suitable for generating a sequence of m polarization states with m>4 at each measurement wavelength, the elements of the PSA for modulating polarization are suitable for determining a sequence of n polarization states with n>4 for each measurement wavelength, and the detector elements are suitable for acquiring a sequence of N measurements with 16
摘要:
Method and a polarimetric measurement device of a planar object carrying patterns repeated regularly and forming the lines of a grid. A first measurement is carried out at zero order, under an angle of incidence θ1 and for a first azimuthal angle φ1, a second measurement at least is carried out at zero order, under an angle of incidence θ2 and for a second azimuthal angle φ2, the polarization of the incident beam is modulated and the polarization of the reflected beam is analyzed for each measurement, theoretical polarimetric data is calculated for a model object of the real object, the model object including parameters adjustable using a formalism of electromagnetism. An iterative comparison of the measurements is conducted with the theoretical polarimetric data for different values of the adjustable parameters.
摘要:
A method for characterizing or controlling the production of a thin-layered component using optical methods. Acquired signals S1 and S2 are processed in order to obtain parameters x, ∈ of the deposited layers. The stacking is represented by the product of two Abeles matrices for each direction of polarization s (perpendicular to the incidence plane) and p (parallel to the incidence plane): a known matrix Mos,p representing the support and matrix dMs,p representing a thin transparent layer being deposited. The signal variations measured, dS1 and dS2, are inverted to obtain thickness x and dielectric constant ∈ of the thin layer by the following operations: Taylor expansion as a function of variation dx of thickness x of the thin layer of the coefficients of matrix dM; the coefficients of matrix Ms,p are calculated each in the form A(∈±2)dx2+B(∈±1)dx+C and the relation S1,2=A1,2(∈±2) dx2+B1,2(∈±1) dx+C1,2 is thereby deduced which connects signals S1 and S2 to parameters ∈ and dx; dx is eliminated and a master function P(∈±4)=0 is thereby deduced; the equation is solved and the solutions are selected corresponding to values that are physically plausible in order to measure ∈ and use the ∈ value obtained to determine dx.
摘要:
In this method for the surface treatment of a metal part (12) for the purpose of deoxidizing it and/or cleaning it, a sealed chamber (16), in which the part to be treated is placed, is filled with a low-pressure reducing gas mixture, a static magnetic field is created in a region of the chamber (16) separate from the region in which the part (12) to be treated is placed and the gas mixture is excited by means of an electromagnetic wave injected into the chamber (16) so as to generate a treatment plasma in the gas, the intensity of the static magnetic field corresponding to electron cyclotron resonance established in the chamber in a distributed manner.
摘要:
This invention concerns a spectroscopic ellipsometer modulated at a frequency (.omega..sub.m) intended for taking measurements of a sample (3). The spectroscopic ellipsometer is phase modulated, the sample being excited by external means (16) producing periodic, alternating excitation at a frequency (.OMEGA..sub.e). The measurement contains the ellipsometric parameter values (.psi., .DELTA.) of the sample, respectively in the presence of (.psi..sub.1, .DELTA..sub.1) and in the absence of (.psi..sub.2, .DELTA..sub.2) excitation of the sample, as a function of excitation frequency (.OMEGA..sub.e).