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    Shoe mold structure
    1.
    发明授权
    Shoe mold structure 有权

    公开(公告)号：US09878509B2

    公开(公告)日：2018-01-30

    申请号：US15000512

    申请日：2016-01-19

    申请人： Chia-Hung Wu

    发明人： Chia-Hung Wu

    IPC分类号： B29D35/00 ,  B29D35/12

    CPC分类号： B29D35/0036 ,  B29D35/02

    摘要： A shoe mold structure contains: a base, a lower part, an upper part, a mold core, and two connecting rod assemblies. The base includes a movable space, and the lower part includes a lower cavity, a through orifice, and two guiding slots. The upper part includes an upper cavity and at least one feeding orifice, and a connecting face of the upper part and the lower part flushes with a connection section of a body and a sole of a shoe. The mold core includes a molding portion, an extension, a holding plate, and two guide plates, wherein the extension extends to the movable space from the molding portion via the through orifice. Each connecting rod assembly couples with each of the two side surfaces of the upper part and said each guide plate.

    MANUFACTURING-PROCESS EQUIPMENT
    2.
    发明申请
    MANUFACTURING-PROCESS EQUIPMENT 失效
    制造过程设备

    公开(公告)号：US20120156320A1

    公开(公告)日：2012-06-21

    申请号：US12971466

    申请日：2010-12-17

    申请人： Wen-Yuh Jywe ,  Jing-Chung Shen ,  Chin-Tien Yang ,  Chien-Hung Liu ,  Jau-Jiu Ju ,  Chia-Hung Wu ,  Chun-Chieh Huang ,  Lili Duan ,  Yuan-Chin Lee

    发明人： Wen-Yuh Jywe ,  Jing-Chung Shen ,  Chin-Tien Yang ,  Chien-Hung Liu ,  Jau-Jiu Ju ,  Chia-Hung Wu ,  Chun-Chieh Huang ,  Lili Duan ,  Yuan-Chin Lee

    IPC分类号： B29C59/16 ,  B29C37/00

    CPC分类号： B23K26/0853

    摘要： A manufacturing-process equipment has a platform assembly, a measurement feedback assembly and a laser-working assembly. The platform assembly has a base and a hybrid-moving platform. The base has a mounting frame. The hybrid-moving platform is mounted on the base and has a long-stroke moving stage and a piezo-driven micro-stage. The long-stroke moving stage has a benchmark set and a driving device. The piezo-driven micro-stage is connected to the long-stroke moving stage and has a working platform. The measurement feedback assembly is securely mounted on the platform assembly and has a laser interferometer, a reflecting device and a signal-receiving device. The laser-working assembly is mounted on the platform assembly, is electrically connected to the measurement feedback assembly and has a laser direct-writing head, a controlling interface device and a positioning interface device.

    摘要翻译： 制造过程设备具有平台组件，测量反馈组件和激光加工组件。 平台组件具有基座和混合动力平台。 底座有一个安装架。 混合动力平台安装在基座上，具有长行程移动台和压电驱动微型平台。 长冲程移动台具有基准组和驱动装置。 压电驱动微型平台连接到长行程移动台，并具有工作平台。 测量反馈组件牢固地安装在平台组件上，并具有激光干涉仪，反射装置和信号接收装置。 激光加工组件安装在平台组件上，电连接到测量反馈组件，并具有激光直写头，控制接口装置和定位接口装置。

    Optical Calibration and Testing Device for Machine Tools
    3.
    发明申请
    Optical Calibration and Testing Device for Machine Tools 失效
    机床光学校准和测试装置

    公开(公告)号：US20110261348A1

    公开(公告)日：2011-10-27

    申请号：US13075249

    申请日：2011-03-30

    申请人： Wen-Yuh Jywe ,  Chia-Hung Wu ,  I-Ching Chen ,  Tung-Hui Hsu ,  Ren-Chieh Fung ,  Teng-Yu Yang

    发明人： Wen-Yuh Jywe ,  Chia-Hung Wu ,  I-Ching Chen ,  Tung-Hui Hsu ,  Ren-Chieh Fung ,  Teng-Yu Yang

    IPC分类号： G01B11/02

    CPC分类号： G01B11/272 ,  G01B11/26

    摘要： An optical calibration and testing device for machine tools includes a light source unit, a beam splitter, and at least one photo detector. The light source emits a laser light hitting the beam splitter and is split into two beams. One is perpendicular to the foundation of the light source unit, and the other is parallel with the foundation so as to test straightness, inclination angle, verticalness, vertical column inclination, vertical column parallelism and guide bar inclination of a machine tool. If there is no tested error, the position of the testing light spot coincides with that of the initial light spot. If there is an error, the position of testing light spot varies according to the error.

    摘要翻译： 用于机床的光学校准和测试装置包括光源单元，分束器和至少一个光电检测器。 光源发射激光束击中光束分离器，并被分成两束。 一个垂直于光源单元的基础，另一个与基座平行，以测试机床的直线度，倾斜角度，垂直度，垂直列倾斜度，垂直列平行度和导杆倾斜度。 如果没有测试错误，则测试光点的位置与初始光斑的位置一致。 如果有错误，则测试光斑的位置会根据错误而有所不同。

    Optical parallelism measurement device
    4.
    发明授权
    Optical parallelism measurement device 失效
    光学平行度测量装置

    公开(公告)号：US08477321B2

    公开(公告)日：2013-07-02

    申请号：US13102137

    申请日：2011-05-06

    申请人： Wen-Yuh Jywe ,  Chia-Hung Wu ,  Yun-Feng Teng

    发明人： Wen-Yuh Jywe ,  Chia-Hung Wu ,  Yun-Feng Teng

    IPC分类号： G01B11/14

    CPC分类号： G01B11/272

    摘要： A high precision, rapidly operable optical parallelism measurement device includes a light source module, a light beam splitting module and at least two photoelectric detectors. The light source module has a light source and a light beam splitting element such that the light source module is able to produce two light beams perpendicular to each other. One of them is parallel to the moving direction, and is received by one of the detectors, while the other beam is split into two beams perpendicular to each other by the light beam splitting module. One beam is parallel to the former parallel by moving beam and is received by the other detector. With this scheme, the measurement can be performed by means of those perpendicular and parallel light beams without being affected by the structure of the machine platen to cause errors. The device can be manufactured with low cost and high precision. It is very compact in size and easy to carry and build up for rapid measurement.

    摘要翻译： 高精度，快速可操作的光学平行度测量装置包括光源模块，光束分离模块和至少两个光电探测器。 光源模块具有光源和光束分离元件，使得光源模块能够产生彼此垂直的两个光束。 它们中的一个与移动方向平行，并且被其中一个检测器接收，而另一个光束被光束分离模块分成两个彼此垂直的光束。 一个光束通过移动光束平行于前者并行，并被另一个检测器接收。 利用该方案，可以通过这些垂直和平行的光束进行测量，而不受机器压板的结构的影响，导致错误。 该装置可以以低成本和高精度制造。 它的尺寸非常紧凑，便于携带和建立快速测量。

    OPTICAL PARALLELISM MEASUREMENT DEVICE
    5.
    发明申请
    OPTICAL PARALLELISM MEASUREMENT DEVICE 失效
    光学并行测量装置

    公开(公告)号：US20110292407A1

    公开(公告)日：2011-12-01

    申请号：US13102137

    申请日：2011-05-06

    申请人： Wen-Yuh Jywe ,  Chia-Hung Wu ,  Yun-Feng Teng

    发明人： Wen-Yuh Jywe ,  Chia-Hung Wu ,  Yun-Feng Teng

    IPC分类号： G01B11/14

    CPC分类号： G01B11/272

    摘要： A high precision, rapidly operable optical parallelism measurement device includes a light source module, a light beam splitting module and at least two photoelectric detectors. The light source module has a light source and a light beam splitting element such that the light source module is able to produce two light beams perpendicular to each other. One of them is parallel to the moving direction, and is received by one of the detectors, while the other beam is split into two beams perpendicular to each other by the light beam splitting module. One beam is parallel to the former parallel by moving beam and is received by the other detector. With this scheme, the measurement can be performed by means of those perpendicular and parallel light beams without being affected by the structure of the machine platen to cause errors. The device can be manufactured with low cost and high precision. It is very compact in size and easy to carry and build up for rapid measurement.

    摘要翻译： 高精度，快速可操作的光学平行度测量装置包括光源模块，光束分离模块和至少两个光电探测器。 光源模块具有光源和光束分离元件，使得光源模块能够产生彼此垂直的两个光束。 它们中的一个与移动方向平行，并且被其中一个检测器接收，而另一个光束被光束分离模块分成两个彼此垂直的光束。 一个光束通过移动光束平行于前者并行，并被另一个检测器接收。 利用该方案，可以通过这些垂直和平行的光束进行测量，而不受机器压板的结构的影响，导致错误。 该装置可以以低成本和高精度制造。 它的尺寸非常紧凑，便于携带和建立快速测量。

    SEMICONDUCTOR DEVICE
    6.
    发明申请
    SEMICONDUCTOR DEVICE 审中-公开
    半导体器件

    公开(公告)号：US20140097457A1

    公开(公告)日：2014-04-10

    申请号：US13936093

    申请日：2013-07-05

    申请人： CHIA-HUNG WU ,  WEN-YUH JYWE ,  HUNG-TA CHIEN ,  FU-CHIANG HSU ,  FANG-HSUAN SU ,  CHUN-LIN YEH

    发明人： CHIA-HUNG WU ,  WEN-YUH JYWE ,  HUNG-TA CHIEN ,  FU-CHIANG HSU ,  FANG-HSUAN SU ,  CHUN-LIN YEH

    IPC分类号： H01L33/60

    CPC分类号： H01L33/60 ,  H01L33/007 ,  H01L33/10 ,  H01L33/12 ,  H01L33/20

    摘要： A semiconductor device includes a substrate and a semiconductor unit. The substrate includes a base and at least one pattern unit. The pattern unit includes a plurality of surrounding members disposed on the base and a central member surrounded by the surrounding members. A geometrical center is collectively defined by the surrounding members, an interval between the central member and the geometrical center is larger than zero. The semiconductor unit is disposed on the substrate and is operating with a current.

    摘要翻译： 半导体器件包括衬底和半导体单元。 基板包括基部和至少一个图案单元。 图案单元包括设置在基部上的多个周围构件和由周围构件包围的中心构件。 几何中心由周围的构件共同限定，中心构件和几何中心之间的间隔大于零。 半导体单元设置在基板上并以电流工作。

    Optical calibration and testing device for machine tools
    7.
    发明授权
    Optical calibration and testing device for machine tools 失效
    机床光学校准和测试装置

    公开(公告)号：US08542358B2

    公开(公告)日：2013-09-24

    申请号：US13075249

    申请日：2011-03-30

    申请人： Wen-Yuh Jywe ,  Chia-Hung Wu ,  I-Ching Chen ,  Tung-Hui Hsu ,  Ren-Chieh Fung ,  Teng-Yu Yang

    发明人： Wen-Yuh Jywe ,  Chia-Hung Wu ,  I-Ching Chen ,  Tung-Hui Hsu ,  Ren-Chieh Fung ,  Teng-Yu Yang

    IPC分类号： G01B11/00 ,  G01B11/26

    CPC分类号： G01B11/272 ,  G01B11/26

    摘要： An optical calibration and testing device for machine tools includes a light source unit, a beam splitter, and at least one photo detector. The light source emits a laser light hitting the beam splitter and is split into two beams. One is perpendicular to the foundation of the light source unit, and the other is parallel with the foundation so as to test straightness, inclination angle, verticalness, vertical column inclination, vertical column parallelism and guide bar inclination of a machine tool. If there is no tested error, the position of the testing light spot coincides with that of the initial light spot. If there is an error, the position of testing light spot varies according to the error.

    摘要翻译： 用于机床的光学校准和测试装置包括光源单元，分束器和至少一个光电检测器。 光源发射激光束击中光束分离器，并被分成两束。 一个垂直于光源单元的基础，另一个与基座平行，以测试机床的直线度，倾斜角度，垂直度，垂直列倾斜度，垂直列平行度和导杆倾斜度。 如果没有测试错误，则测试光点的位置与初始光斑的位置一致。 如果有错误，则测试光斑的位置会根据错误而有所不同。

    DETECTION DEVICES AND DETECTION METHOD
    9.
    发明申请
    DETECTION DEVICES AND DETECTION METHOD 审中-公开
    检测装置和检测方法

    公开(公告)号：US20110158489A1

    公开(公告)日：2011-06-30

    申请号：US12651396

    申请日：2009-12-31

    申请人： YUNG-SHUN HUANG ,  MIN SHIH ,  CHIA HUNG WU ,  YIH-NEN JENG

    发明人： YUNG-SHUN HUANG ,  MIN SHIH ,  CHIA HUNG WU ,  YIH-NEN JENG

    IPC分类号： G06K9/00 ,  G06K9/36 ,  G06K9/40

    CPC分类号： G06T7/0006 ,  G06T7/0012 ,  G06T2207/10016 ,  G06T2207/20048 ,  G06T2207/20212 ,  G06T2207/30104 ,  G06T2207/30108

    摘要： A detection device for detecting specific operation information of a subject is provided and includes an image capturing unit, an image processing unit, a signal processing unit, and a detection unit. The image capturing unit captures pictures of the subject to generate image signals respectively. Each of the image signals has gray-level values. The image processing unit sums the gray-level values of each of the image signals to obtain a brightness value of the corresponding image signal. The signal processing unit generates an action signal according to the brightness values, removes a non-periodic component of the action signal, and calculates a spectrum of the action signal whose non-periodic component is removed. The detection unit checks the spectrum according to a detection rule to obtain the specific operation information of the subject.

    摘要翻译： 提供了一种用于检测被摄体的特定操作信息的检测装置，包括图像拍摄单元，图像处理单元，信号处理单元和检测单元。 图像拍摄单元捕获被摄体的图像以分别产生图像信号。 每个图像信号都具有灰度值。 图像处理单元将每个图像信号的灰度值相加以获得相应图像信号的亮度值。 信号处理单元根据亮度值生成动作信号，去除动作信号的非周期性成分，并计算除去非周期成分的动作信号的频谱。 检测单元根据检测规则检查频谱，以获得对象的特定操作信息。