摘要:
An apparatus comprising a voltage controlled oscillator, a first charge pump, a second charge pump, a switch circuit and a comparator circuit. The voltage controlled oscillator may be configured to generate an output signal oscillating at a first frequency in response to a control signal. The charge pump circuit may be configured to generate a first component of the control signal in response to a first adjustment signal and a second adjustment signal. The second charge pump may be configured to generate a second component of the control signal in response to a first intermediate signal and a second intermediate signal. The switch circuit may be configured to generate the first intermediate signal and the second intermediate signal in response to the first adjustment signal and the second adjustment signal. The comparator circuit may be configured to generate the first and second adjustment signals in response to a comparison between (i) an input signal having a second frequency and (ii) the output signal.
摘要:
An apparatus comprising a voltage controlled oscillator, a first charge pump, a second charge pump, a switch circuit and a comparator circuit. The voltage controlled oscillator may be configured to generate an output signal oscillating at a first frequency in response to a control signal. The charge pump circuit may be configured to generate a first component of the control signal in response to a first adjustment signal and a second adjustment signal. The second charge pump may be configured to generate a second component of the control signal in response to a first intermediate signal and a second intermediate signal. The switch circuit may be configured to generate the first intermediate signal and the second intermediate signal in response to the first adjustment signal and the second adjustment signal. The comparator circuit may be configured to generate the first and second adjustment signals in response to a comparison between (i) an input signal having a second frequency and (ii) the output signal.
摘要:
An apparatus comprising a first comparator circuit, a second comparator circuit, a third comparator circuit, and a difference circuit. The first comparator circuit may be configured to generate a first intermediate current in response to a first input voltage and a second input voltage. The second comparator circuit may be configured to generate a second intermediate current in response to the first input voltage and the second input voltage. The third comparator circuit may be configured to generate an intermediate reference current in response to a first reference voltage and a second reference voltage. The difference circuit may be configured to generate a first compare voltage and a second compare voltage in response to the first intermediate current, the second intermediate current, and the intermediate reference current. The apparatus may indicate a squelch condition when the first compare voltage is greater than the second compare voltage.
摘要:
An apparatus comprising a voltage controlled oscillator, a first charge pump, a second charge pump, a switch circuit and a comparator circuit. The voltage controlled oscillator may be configured to generate an output signal oscillating at a first frequency in response to a control signal. The charge pump circuit may be configured to generate a first component of the control signal in response to a first adjustment signal and a second adjustment signal. The second charge pump may be configured to generate a second component of the control signal in response to a first intermediate signal and a second intermediate signal. The switch circuit may be configured to generate the first intermediate signal and the second intermediate signal in response to the first adjustment signal and the second adjustment signal. The comparator circuit may be configured to generate the first and second adjustment signals in response to a comparison between (i) an input signal having a second frequency and (ii) the output signal.
摘要:
An apparatus comprising a first comparator circuit, a second comparator circuit, a third comparator circuit, and a difference circuit. The first comparator circuit may be configured to generate a first intermediate current in response to a first input voltage and a second input voltage. The second comparator circuit may be configured to generate a second intermediate current in response to the first input voltage and the second input voltage. The third comparator circuit may be configured to generate an intermediate reference current in response to a first reference voltage and a second reference voltage. The difference circuit may be configured to generate a first compare voltage and a second compare voltage in response to the first intermediate current, the second intermediate current, and the intermediate reference current. The apparatus may indicate a squelch condition when the first compare voltage is greater than the second compare voltage.
摘要:
Methods, apparatus and computer program products for modeling integrated circuits having dense devices therein that experience linewidth (e.g., gate electrodes) reductions during fabrication are provided. For dense devices having electrical paths therein and first and second gate electrodes that overlie the electrical path, operations include determining an electrical gate length of the first gate electrode by evaluating a change in current through the electrical path relative to a change in gate length of the second gate electrode. The operation to determine the electrical gate length of the first gate electrode includes evaluating a change in simulated drain-to-source current through the electrical path relative to a change in the electrical gate length of the second gate electrode.
摘要:
In one embodiment, a method of forming a ripple suppressor circuit includes a configuring the ripple suppressor circuit to receive a first signal that is representative of a requested voltage and a second signal that is a filtered value of the first signal. The method also includes configuring the ripple suppressor circuit to determine a peak value of the second signal responsively to the first signal and to determine a minimum value of the second signal responsively to the first signal. The method may also include configuring the ripple suppressor circuit to form an average value of the peak value and the minimum value.
摘要:
In one embodiment, a method of forming a ripple suppressor circuit includes a configuring the ripple suppressor circuit to receive a first signal that is representative of a requested voltage and a second signal that is a filtered value of the first signal. The method also includes configuring the ripple suppressor circuit to determine a peak value of the second signal responsively to the first signal and to determine a minimum value of the second signal responsively to the first signal. The method may also include configuring the ripple suppressor circuit to form an average value of the peak value and the minimum value.
摘要:
An apparatus comprising a voltage controlled oscillator, a first charge pump, a second charge pump, a switch circuit and a comparator circuit. The voltage controlled oscillator may be configured to generate an output signal oscillating at a first frequency in response to a control signal. The charge pump circuit may be configured to generate a first component of the control signal in response to a first adjustment signal and a second adjustment signal. The second charge pump may be configured to generate a second component of the control signal in response to a first intermediate signal and a second intermediate signal. The switch circuit may be configured to generate the first intermediate signal and the second intermediate signal in response to the first adjustment signal and the second adjustment signal. The comparator circuit may be configured to generate the first and second adjustment signals in response to a comparison between (i) an input signal having a second frequency and (ii) the output signal.
摘要:
A method and apparatus for testing semiconductor wafers is disclosed in which a test circuit is used that includes a waveform generator. The test circuit can test a single transistor or can test multiple transistors. A testing method is disclosed in which a supply voltage is applied to the waveform generator to produce pulses that are applied to the gate of a transistor to be tested. A bias voltage is applied to the source and drain of the transistor to be tested, and the charge pumping current that is generated at the substrate is then measured. The process can be repeated at different bias voltage levels to obtain additional current measurements, indicating the maximum charge pumping current for the transistor that is being tested. The determined maximum charge pumping current can then be used for determining whether there is excessive 1/f noise in the device under test.