Tab mounted chip burn-in apparatus
    1.
    发明授权
    Tab mounted chip burn-in apparatus 失效
    贴片式芯片老化装置

    公开(公告)号:US4956605A

    公开(公告)日:1990-09-11

    申请号:US381623

    申请日:1989-07-18

    CPC分类号: G01R31/2863 H01L2924/0002

    摘要: A TAB package comprises an elongated tape which has a plurality of sets of beam leads emplaced thereon and a plurality of electronic devices connected to the beam leads. At least a first beam lead of each set is connected to a common potential terminal on each device, and at least a second beam lead of each set is connected to a power terminal. A common potential bus is oriented along the elongated dimension of the tape and connects to the first beam leads, while a power bus is also oriented along the elongated dimension of the tape and is connected to the second beam leads. The application of power to the power bus and the simultaneous grounding of the common potential bus enables all electronic devices on the tape to be simultaneously energized and to be then subjected to an elevated temperature environment for static burn-in testing. To improve current conduction in the power and common potential buses, a tape comprising a non-conductive carrier and a pair of interposer/conductor tapes may be emplaced over the length of the tape bearing the chips. An additional spacer tape is then emplaced over the interposer tape and forces the interposer conductors into contact with the power and common potential buses.

    Electrical connector design and contact geometry and method of use thereof and methods of fabrication thereof
    2.
    发明授权
    Electrical connector design and contact geometry and method of use thereof and methods of fabrication thereof 失效
    电连接器设计和接触几何及其使用方法及其制造方法

    公开(公告)号:US07172431B2

    公开(公告)日:2007-02-06

    申请号:US10928473

    申请日:2004-08-27

    IPC分类号: H01R12/00

    摘要: A probe or an electrical connector comprises a substrate with a surface having a plurality of electrical contact locations. A shaped elongated electrical conductor has a first end coupled to one of the electrical contact locations and a second end thereof which projects away from the electrical contact location and through an aperture in a sheet of material. The sheet is disposed to be spaced apart from the surface of the substrate. At the second end of the elongated electrical conductor there is a tip structure, which is larger than the aperture in the sheet of material. The tip structure has a pointed portion thereof. The tip structure is disposed against contact locations of a contact surface. The electronic structure is moved towards the contact surface permitting the tip structure to penetrate into the surface of the electrical contact location thereon and to move, wipe, or vibrate across the surface thereof as the shaped elongated electrical conductor flexes as a result of being compressed by the movement of the electronic structure toward the contact surface.

    摘要翻译: 探针或电连接器包括具有多个电接触位置的表面的基底。 成形细长的电导体具有联接到电接触位置之一的第一端和其第二端,其突出远离电接触位置并穿过材料片中的孔。 片材被设置成与衬底的表面间隔开。 在细长电导体的第二端,有一个尖端结构,其大于该材料片中的孔。 尖端结构具有其尖端部分。 尖端结构设置成抵靠接触表面的接触位置。 电子结构朝向接触表面移动,允许尖端结构穿过其中的电接触位置的表面并且随着成形细长电导体由于被...的压缩而弯曲而在其表面上移动,擦拭或振动 电子结构向接触表面移动。

    Current attenuator useful in a very low leakage current measuring device
    3.
    发明授权
    Current attenuator useful in a very low leakage current measuring device 失效
    电流衰减器用于非常低的漏电流测量装置

    公开(公告)号:US4739252A

    公开(公告)日:1988-04-19

    申请号:US855241

    申请日:1986-04-24

    CPC分类号: G01R31/2632 G01R19/0092

    摘要: An attenuator useful in measuring low level leakage currents is disclosed. The attenuator includes a plurality of current dividers coupled in cascade. Each current divider includes an input and two outputs between which the current entering the input is divided. The current exiting the last divider is significantly attenuated from that entering the attenuator. The attenuator output is coupled to the device under test and to one input of a differential amplifier. A known current is input to the differential amplifier and part is directed to the attenuator input and the other part to a current measuring device. The difference between the known current input to the differential amplifier and that measured is the current input to the attenuator. In the steady state, the current input to the differential amplifier from the current attenuator is about zero. Accordingly, the leakage current is equal to the known current entering the differential amplifier less the measured current divided by m, the attenuation provided by the attenuator.