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公开(公告)号：US08829442B2
公开(公告)日：2014-09-09
申请号：US13696056
申请日：2011-05-03
CPC分类号： H01L22/12 , G01N21/3563 , G01N21/9501 , H01L2924/0002 , H01L2924/00
摘要： A system and method of non-contact measurement of the dopant content of semiconductor material by reflecting infrared (IR) radiation off of the material and splitting the radiation into two beams, passing each beam through pass band filters of differing wavelength ranges, comparing the level of energy passed through each filter and calculating the dopant content by referencing a correlation curve made up of known wafer dopant content for that system.
摘要翻译： 通过将红外（IR）辐射反射离开材料并将辐射分解成两束，将每个光束通过不同波长范围的通带滤光片，来对半导体材料的掺杂剂含量进行非接触式测量的系统和方法， 的能量通过每个滤波器并且通过参考由该系统的已知晶片掺杂剂含量组成的相关曲线来计算掺杂剂含量。
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公开(公告)号：US20120136470A1
公开(公告)日：2012-05-31
申请号：US13321813
申请日：2010-05-21
申请人： Gordon Deans , E. Michael Heaven
发明人： Gordon Deans , E. Michael Heaven
IPC分类号： G06F19/00
CPC分类号： G05B19/41875 , G05B2219/32182 , G05B2219/32191 , G05B2219/32194 , G05B2219/32195 , G05B2219/32196 , G05B2219/32198 , G05B2219/32201 , G05B2219/32212 , G05B2219/32218 , H01L31/18 , Y02P90/22 , Y02P90/86
摘要： Methods and apparatuses for manufacturing photovoltaic products include an assessment of each product in a production line for suitability, and assigning a grade based either on assessment of the product at that step, comparison to statistical analysis of assessment results of previous products at that step or comparison of previous assessment results of past steps compared to statistical analysis of cumulative assessment results of past products at those steps. Products can be associated into groups for processing as a group based on the grades and downstream equipment can be adjusted based on the grade of the group to bring the group within determined tolerances.
摘要翻译： 用于制造光伏产品的方法和装置包括评估生产线中的每种产品的适用性，并根据该步骤中的产品评估来分配等级，与该步骤或比较的先前产品的评估结果的统计分析比较 以前的步骤的评估结果与以往产品在这些步骤的累积评估结果的统计分析相比较。 产品可以根据等级组合成一组，可以根据组的等级调整下游设备，使组在确定的公差范围内。
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公开(公告)号：US6080278A
公开(公告)日：2000-06-27
申请号：US13867
申请日：1998-01-27
CPC分类号： D21G9/0027 , Y10S162/10 , Y10S162/11
摘要： A system and method of providing fast machine direction (MD) and cross direction (CD) basis weight adjustments using a simultaneous multi-point water weight sensor which provides independent MD and CD measurements is described. The water weight sensor is placed under the wire of the sheetmaking machine and provides fast wet end water weight measurements which are converted into predicted dry end basis weight information and used to control operating variables of machine elements in the sheetmaking machine to compensate for high frequency process variations. MD wet end measurements are used to control operating variables of machine elements that influence the MD dry end basis weight and CD wet end measurements are used to control operating variables of machine elements that influence CD dry end basis weight. The fast control information provided by the non-scanned water weight sensor can be used in a fast control loop which provides feedback information to wetstock source, headbox and forming elements and which can be used with a slower response control loop including a dry end sensor which provides a slower basis weight measurement and which controls system variables to compensate for larger basis weight fluctuations.
摘要翻译： 描述了使用提供独立的MD和CD测量的同时多点水重量传感器来提供快速机器方向（MD）和横向（CD）基重调节的系统和方法。 水重量传感器放置在制片机的线下，并提供快速的湿端水重量测量，将其转换为预测的干端基重信息，并用于控制制片机中的机器元件的操作变量，以补偿高频过程 变化。 MD湿端测量用于控制影响MD干端基重的机器元件的操作变量，CD湿端测量用于控制影响CD干端基重的机器元件的操作变量。 由非扫描水重量传感器提供的快速控制信息可用于快速控制回路，其提供反馈信息到湿源，流浆箱和成形元件，并且可以与慢速响应控制回路一起使用，该响应控制回路包括干端传感器 提供较慢的基重测量，并且其控制系统变量以补偿较大的基重量波动。
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公开(公告)号：US20130043393A1
公开(公告)日：2013-02-21
申请号：US13696056
申请日：2011-05-03
IPC分类号： G01J5/08
CPC分类号： H01L22/12 , G01N21/3563 , G01N21/9501 , H01L2924/0002 , H01L2924/00
摘要： A system and method of non-contact measurement of the dopant content of semiconductor material by reflecting infrared (IR) radiation off of the material and splitting the radiation into two beams, passing each beam through pass band filters of differing wavelength ranges, comparing the level of energy passed through each filter and calculating the dopant content by referencing a correlation curve made up of known wafer dopant content for that system.
摘要翻译： 通过将红外（IR）辐射反射离开材料并将辐射分解成两束，将每个光束通过不同波长范围的通带滤光片，来对半导体材料的掺杂剂含量进行非接触式测量的系统和方法， 的能量通过每个滤波器并且通过参考由该系统的已知晶片掺杂剂含量组成的相关曲线来计算掺杂剂含量。
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公开(公告)号：US06466839B1
公开(公告)日：2002-10-15
申请号：US09525229
申请日：2000-03-14
IPC分类号： G06F766
CPC分类号： D21G9/0027 , Y10S162/10 , Y10S162/11
摘要： A system of providing fast machine direction (MD) and cross direction (CD) basis weight adjustments using a simultaneous multi-point water weight sensor which provides independent MD and CD measurements is described. The water weight sensor is placed under the wire of the sheetmaking machine and provides fast wet end water weight measurements which are converted into predicted dry end basis weight information and used to control operating variables of machine elements in the sheetmaking machine to compensate for high frequency process variations. MD wet end measurements are used to control operating variables of machine elements that influence the MD dry end basis weight and CD wet end measurements are used to control operating variables of machine elements that influence CD dry end basis weight.
摘要翻译： 描述了使用提供独立的MD和CD测量的同时多点水重量传感器来提供快速机器方向（MD）和横向（CD）基重调节的系统。 水重量传感器放置在制片机的线下，并提供快速的湿端水重量测量，将其转换为预测的干端基重信息，并用于控制制片机中机器元件的操作变量，以补偿高频过程 变化。 MD湿端测量用于控制影响MD干端基重的机器元件的操作变量，CD湿端测量用于控制影响CD干端基重的机器元件的操作变量。
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公开(公告)号：US5944955A
公开(公告)日：1999-08-31
申请号：US007733
申请日：1998-01-15
申请人： David A. Bossen , E. Michael Heaven , John D. Goss
发明人： David A. Bossen , E. Michael Heaven , John D. Goss
CPC分类号： D21G9/0027 , D21F1/06 , Y10S162/06 , Y10S162/11
摘要： Apparatus and process for controlling the basis weight of paper produced in a papermaking machine are provided. In the papermaking process, a major portion of the paper stock flows through a first line that is controlled by a thick stock valve and a minor portion of the stock flow from the stuff box to the headbox is diverted through a second line that is regulated by a second valve (e.g., vernier valve). The thick stock valve is controlled by the dry end basis weight and the second valve responsive to measurements of the basis weight of the wet stock at the wire. The second line and control valve along with the wet end basis weight measurements form a fine control loop with fast response time whereas the first line and control valve that is responsive to dry end basis weight measurements form a course control loop. The dual control loops enable fast and actual basis weight control.
摘要翻译： 提供了用于控制在造纸机中生产的纸的基重的装置和方法。 在造纸过程中，纸张的主要部分流过由厚库存阀控制的第一行，并且从填料盒到流浆箱的库存流的少量部分被转移通过由第二管线调节的第二管线 第二阀（例如游标阀）。 厚的储存阀由干端基重量控制，第二阀响应于在线处的湿料的基重的测量。 第二线和控制阀以及湿端基重测量形成了具有快速响应时间的精细控制回路，而响应于干端基重测量的第一线和控制阀形成了一个过程控制回路。 双重控制回路可实现快速和实际的基重控制。
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