公开(公告)号：US07671579B1

公开(公告)日：2010-03-02

申请号：US11470898

申请日：2006-09-07

申请人： Yan Chong ,  Joseph Huang ,  Chiakang Sung ,  Eric Choong-Yin Chang ,  Peter Boyle ,  Adam J. Wright

发明人： Yan Chong ,  Joseph Huang ,  Chiakang Sung ,  Eric Choong-Yin Chang ,  Peter Boyle ,  Adam J. Wright

IPC分类号： G01R23/175 ,  G08B23/00

CPC分类号： H03K5/135 ,  G01R31/3016 ,  G01R31/31725 ,  G01R31/318516 ,  H03K5/14 ,  H03K5/1504

摘要： Delay associated with each of two signals along respective transmission paths is accurately measured using a delay measurement circuit that is fabricated in situ on the actual device where the circuitry for propagating the two signals is fabricated. Thus, the measured delay associated with each of the two signals is subject to the same fabrication-dependent attributes that affect the actual circuitry through which the two signals will be propagated during operation of the device. The skew between the two signals is quantified as the difference in the measured delays. Coarse and fine delay modules are defined within the transmission path of each of the two signals. Based on the measured skew between the two signals, the coarse and fine delay modules are appropriately set to compensate for the skew. The appropriately settings for the coarse and fine delay modules can be stored in non-volatile memory elements.

摘要翻译： 使用延迟测量电路精确测量与各传输路径中的两个信号中的每一个相关的延迟，该延迟测量电路在实际设备上制造，其中制造用于传播两个信号的电路。 因此，与两个信号中的每一个相关联的测量的延迟受到影响在设备操作期间两个信号将被传播的实际电路的相同制造相关属性。 两个信号之间的偏差被量化为测量延迟的差。 在两个信号中的每一个的传输路径内定义粗略和精细的延迟模块。 基于两个信号之间的测量偏差，粗调和精细延迟模块被适当地设置以补偿偏斜。 粗略和精细延迟模块的适当设置可以存储在非易失性存储器元件中。

公开(公告)号：US08779754B2

公开(公告)日：2014-07-15

申请号：US13019277

申请日：2011-02-01

申请人： Yan Chong ,  Joseph Huang ,  Chiakang Sung ,  Eric Choong-Yin Chang ,  Peter Boyle ,  Adam J. Wright

发明人： Yan Chong ,  Joseph Huang ,  Chiakang Sung ,  Eric Choong-Yin Chang ,  Peter Boyle ,  Adam J. Wright

IPC分类号： H03K5/14 ,  H03K5/13 ,  H03K5/15

CPC分类号： H03K5/135 ,  G01R31/3016 ,  G01R31/31725 ,  G01R31/318516 ,  H03K5/14 ,  H03K5/1504

摘要： Delay associated with each of two signals along respective transmission paths is accurately measured using a delay measurement circuit that is fabricated in situ on the actual device where the circuitry for propagating the two signals is fabricated. Thus, the measured delay associated with each of the two signals is subject to the same fabrication-dependent attributes that affect the actual circuitry through which the two signals will be propagated during operation of the device. The skew between the two signals is quantified as the difference in the measured delays. Coarse and fine delay modules are defined within the transmission path of each of the two signals. Based on the measured skew between the two signals, the coarse and fine delay modules are appropriately set to compensate for the skew. The appropriately settings for the coarse and fine delay modules can be stored in non-volatile memory elements.

摘要翻译： 使用延迟测量电路精确测量与各传输路径中的两个信号中的每一个相关的延迟，该延迟测量电路在实际设备上制造，其中制造用于传播两个信号的电路。 因此，与两个信号中的每一个相关联的测量的延迟受到影响在设备操作期间两个信号将被传播的实际电路的相同制造相关属性。 两个信号之间的偏差被量化为测量延迟的差。 在两个信号中的每一个的传输路径内定义粗略和精细的延迟模块。 基于两个信号之间的测量偏差，粗调和精细延迟模块被适当地设置以补偿偏斜。 粗略和精细延迟模块的适当设置可以存储在非易失性存储器元件中。

公开(公告)号：US07884619B1

公开(公告)日：2011-02-08

申请号：US12566157

申请日：2009-09-24

申请人： Yan Chong ,  Joseph Huang ,  Chiakang Sung ,  Eric Choong-Yin Chang ,  Peter Boyle ,  Adam J. Wright

发明人： Yan Chong ,  Joseph Huang ,  Chiakang Sung ,  Eric Choong-Yin Chang ,  Peter Boyle ,  Adam J. Wright

IPC分类号： G01R35/00 ,  G01R23/175 ,  G08B23/00 ,  H03L7/00

CPC分类号： H03K5/135 ,  G01R31/3016 ,  G01R31/31725 ,  G01R31/318516 ,  H03K5/14 ,  H03K5/1504

摘要： Delay associated with each of two signals along respective transmission paths is accurately measured using a delay measurement circuit that is fabricated in situ on the actual device where the circuitry for propagating the two signals is fabricated. Thus, the measured delay associated with each of the two signals is subject to the same fabrication-dependent attributes that affect the actual circuitry through which the two signals will be propagated during operation of the device. The skew between the two signals is quantified as the difference in the measured delays. Coarse and fine delay modules are defined within the transmission path of each of the two signals. Based on the measured skew between the two signals, the coarse and fine delay modules are appropriately set to compensate for the skew. The appropriately settings for the coarse and fine delay modules can be stored in non-volatile memory elements.

摘要翻译： 使用延迟测量电路精确测量与各传输路径中的两个信号中的每一个相关的延迟，该延迟测量电路在实际设备上制造，其中制造用于传播两个信号的电路。 因此，与两个信号中的每一个相关联的测量的延迟受到影响在设备操作期间两个信号将被传播的实际电路的相同制造相关属性。 两个信号之间的偏差被量化为测量延迟的差。 在两个信号中的每一个的传输路径内定义粗略和精细的延迟模块。 基于两个信号之间的测量偏差，粗调和精细延迟模块被适当地设置以补偿偏斜。 粗略和精细延迟模块的适当设置可以存储在非易失性存储器元件中。

公开(公告)号：US07277346B1

公开(公告)日：2007-10-02

申请号：US11012877

申请日：2004-12-14

申请人： Irfan Rahim ,  Peter J. McElheny ,  Eric Choong-Yin Chang

发明人： Irfan Rahim ,  Peter J. McElheny ,  Eric Choong-Yin Chang

IPC分类号： G11C17/18

CPC分类号： G11C17/18 ,  G11C17/14 ,  G11C29/42 ,  G11C29/4401 ,  G11C2029/0409

摘要： A semiconductor system and method for repairing failures of a packaged integrated circuit system are provided. The method includes detecting a failure associated with a packaged integrated circuit system after the packaged integrated circuit system is packaged, and repairing the failure by activating a redundancy circuit in the packaged integrated circuit system and deactivating a defective circuit associated with the failure. The process for repairing the failure includes applying a repair voltage to a polysilicon fuse to change a conductivity state of the polysilicon fuse from a first state to a second state. In another embodiment, the polysilicon fuse is replaced by a metal fuse, an anti-fuse, or a non-volatile random access memory.

摘要翻译： 提供了一种用于修复封装集成电路系统的故障的半导体系统和方法。 该方法包括在打包的集成电路系统被封装之后检测与封装的集成电路系统相关联的故障，以及通过激活封装的集成电路系统中的冗余电路来修复故障，并且去激活与故障相关的故障电路。 修复故障的过程包括将修复电压施加到多晶硅熔丝以将多晶硅熔丝的导电状态从第一状态改变到第二状态。 在另一个实施例中，多晶硅熔丝由金属熔断器，反熔丝或非易失性随机存取存储器代替。

公开(公告)号：US20110221497A1

公开(公告)日：2011-09-15

申请号：US13019277

申请日：2011-02-01

申请人： Yan Chong ,  Joseph Huang ,  Chiakang Sung ,  Eric Choong-Yin Chang ,  Peter Boyle ,  Adam J. Wright

发明人： Yan Chong ,  Joseph Huang ,  Chiakang Sung ,  Eric Choong-Yin Chang ,  Peter Boyle ,  Adam J. Wright

IPC分类号： H03L7/00 ,  H03H11/26

CPC分类号： H03K5/135 ,  G01R31/3016 ,  G01R31/31725 ,  G01R31/318516 ,  H03K5/14 ,  H03K5/1504

摘要： Delay associated with each of two signals along respective transmission paths is accurately measured using a delay measurement circuit that is fabricated in situ on the actual device where the circuitry for propagating the two signals is fabricated. Thus, the measured delay associated with each of the two signals is subject to the same fabrication-dependent attributes that affect the actual circuitry through which the two signals will be propagated during operation of the device. The skew between the two signals is quantified as the difference in the measured delays. Coarse and fine delay modules are defined within the transmission path of each of the two signals. Based on the measured skew between the two signals, the coarse and fine delay modules are appropriately set to compensate for the skew. The appropriately settings for the coarse and fine delay modules can be stored in non-volatile memory elements.

摘要翻译： 使用延迟测量电路精确测量与各传输路径中的两个信号中的每一个相关的延迟，该延迟测量电路在实际设备上制造，其中制造用于传播两个信号的电路。 因此，与两个信号中的每一个相关联的测量的延迟受到影响在设备操作期间两个信号将被传播的实际电路的相同制造相关属性。 两个信号之间的偏差被量化为测量延迟的差。 在两个信号中的每一个的传输路径内定义粗略和精细的延迟模块。 基于两个信号之间的测量偏差，粗调和精细延迟模块被适当地设置以补偿偏斜。 粗略和精细延迟模块的适当设置可以存储在非易失性存储器元件中。