ENCAPSULATING RESIN SHEET AND SEMICONDUCTOR DEVICE USING THE SAME, AND MANUFACTURING METHOD FOR THE SEMICONDUCTOR DEVICE
    5.
    发明申请
    ENCAPSULATING RESIN SHEET AND SEMICONDUCTOR DEVICE USING THE SAME, AND MANUFACTURING METHOD FOR THE SEMICONDUCTOR DEVICE 审中-公开
    使用其的封装树脂片和半导体器件以及半导体器件的制造方法

    公开(公告)号:US20120205820A1

    公开(公告)日:2012-08-16

    申请号:US13364592

    申请日:2012-02-02

    Abstract: Provided are an encapsulating resin sheet having improved a connection reliability by improving a connection failure, and by suppressing intrusion of an inorganic filler between terminals of the semiconductor element and the interconnection circuit substrate, a semiconductor device using the same, and a fabricating method for the semiconductor device. The encapsulating resin sheet is an epoxy resin composition sheet having a two-layer structure of an inorganic filler containing layer and an inorganic filler non-containing layer, in which a melt viscosity of the inorganic filler containing layer is 1.0×102 to 2.0×104 Pa·s, a melt viscosity of the inorganic filler non-containing layer is 1.0×103 to 2.0×105 Pa·s, a viscosity difference between both layers is 1.5×104 Pa·s or more; and a thickness of the inorganic filler non-containing layer is ⅓ to ⅘ of a height of the connecting electrode portion formed in the semiconductor element.

    Abstract translation: 提供一种封装树脂片,其通过改善连接故障而提高连接可靠性,并且通过抑制半导体元件和互连电路基板的端子之间的无机填料的侵入,使用该封装树脂片的半导体器件及其制造方法 半导体器件。 封装树脂片是具有无机填料含有层和无机填料不含层的两层结构的无机填料含有层的熔融粘度为1.0×10 2〜2.0×10 4的环氧树脂组合物片 Pa·s时,无机填料无含水层的熔融粘度为1.0×10 3〜2.0×10 5 Pa·s,两层之间的粘度差为1.5×10 4 Pa·s以上; 无机填料不含有层的厚度为半导体元件中形成的连接电极部的高度的1/3〜。。

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