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    SIGNAL CAPTURE SYSTEM AND TEST APPARATUS INCLUDING THE SAME
    2.
    发明申请
    SIGNAL CAPTURE SYSTEM AND TEST APPARATUS INCLUDING THE SAME 有权
    信号捕获系统和测试装置，包括它们

    公开(公告)号：US20110109318A1

    公开(公告)日：2011-05-12

    申请号：US12840573

    申请日：2010-07-21

    申请人： Woon-sup Choi ,  Ho-sun Yoo ,  In-su Yang ,  Min-sung Kim ,  Jong-pill Park ,  In-ho Choi ,  Sung-yeol Kim ,  Jeong-gon Lee ,  Seung-jun Chee ,  Jae-il Lee ,  Chul-woong Jang

    发明人： Woon-sup Choi ,  Ho-sun Yoo ,  In-su Yang ,  Min-sung Kim ,  Jong-pill Park ,  In-ho Choi ,  Sung-yeol Kim ,  Jeong-gon Lee ,  Seung-jun Chee ,  Jae-il Lee ,  Chul-woong Jang

    IPC分类号： G01R31/02 ,  H05K1/18

    CPC分类号： G11C29/56 ,  G11C2029/5606 ,  H05K1/0295 ,  H05K2201/10159 ,  H05K2201/10325 ,  H05K2203/162

    摘要： A signal capture system for capturing a signal and storing the captured signal in a storage apparatus in real time, and a test apparatus including the signal capture system. The signal capture system includes a printed circuit board; a socket that is connected to the printed circuit board and on which a reference memory component is mounted; and an interposer that is mounted on the printed circuit board, is connected to the socket, an external apparatus, and a storage apparatus, receives first signals from the reference memory component and transmits the received first signals to the external apparatus and the storage apparatus, and receives second signals from the external apparatus and transmits the received second signals to the reference memory component and the storage apparatus, wherein a shape of the socket is defined according to a type of the reference memory component.

    摘要翻译： 一种用于捕获信号并将捕获的信号实时存储在存储装置中的信号捕获系统，以及包括信号捕获系统的测试装置。 信号捕获系统包括印刷电路板; 连接到印刷电路板并且其上安装有参考存储器部件的插座; 并且安装在印刷电路板上的插入件连接到插座，外部装置和存储装置，从参考存储器部件接收第一信号，并将接收的第一信号发送到外部设备和存储装置， 并接收来自外部装置的第二信号，并将接收到的第二信号发送到参考存储器部件和存储装置，其中根据参考存储器部件的类型来定义插座的形状。

    Control method of PI controller
    4.
    发明授权
    Control method of PI controller 有权
    PI控制器的控制方法

    公开(公告)号：US07085611B2

    公开(公告)日：2006-08-01

    申请号：US10634788

    申请日：2003-08-06

    申请人： Ho-sun Yoo ,  Jul-ki Seok

    发明人： Ho-sun Yoo ,  Jul-ki Seok

    IPC分类号： G05B13/02

    CPC分类号： G05B11/42 ,  G05B13/021 ,  G05B13/024

    摘要： A control method of a PI controller which selectively performs a proportional control and a proportional/integral control, the method includes Fourier transforming an output of the PI controller, calculating a spectral energy ratio of the transformed output of the PI controller of at a reference frequency for all frequency regions, performing the proportional control in response to the calculated spectral energy ratio exceeding a predetermined reference ratio, and the proportional/integral control in response to the spectral energy ratio being the predetermined reference ratio or less. Accordingly, a PI controller utilizing the method can easily detect a switching point between a proportional control and a proportional/integral control, independent of species and states of a system thereof.

    摘要翻译： 一种选择性地执行比例控制和比例/积分控制的PI控制器的控制方法，该方法包括对PI控制器的输出进行傅里叶变换，计算PI控制器的变换输出的频谱能量比，其参考频率 对于所有频率区域，响应于计算出的超过预定参考比的光谱能量比执行比例控制，并且响应于作为预定参考比率的光谱能量比率的比例/积分控制。 因此，利用该方法的PI控制器可以容易地检测比例控制和比例/积分控制之间的切换点，而与系统的种类和状态无关。

    Apparatus and method of controlling a driving speed of a motor
    5.
    发明授权
    Apparatus and method of controlling a driving speed of a motor 有权
    控制电机驱动速度的装置和方法

    公开(公告)号：US06819074B2

    公开(公告)日：2004-11-16

    申请号：US10331919

    申请日：2002-12-31

    申请人： Ho-Sun Yoo

    发明人： Ho-Sun Yoo

    IPC分类号： G05B1929

    CPC分类号： H02P6/17 ,  Y10S388/904 ,  Y10S388/912

    摘要： An apparatus for controlling a driving speed of a motor comprises a motor controller provided in the motor controlling apparatus detecting the motor driving speed in response to pulses outputted from an encoder. The motor controller adjusts a detection period for the pulses according to the motor driving speed, thereby measuring the motor driving speed. The motor controller sets the detection period so that a number of four-multiplied pulses can be a multiple of four. Although a phase difference between pulses outputted from an encoder is not constant, the motor controlling apparatus can obtain a desired response characteristic by excluding effects of a phase error between the pulses.

    摘要翻译： 用于控制电动机的驱动速度的装置包括：电动机控制装置，其设置在电动机控制装置中，响应于从编码器输出的脉冲检测电动机的行驶速度。 电机控制器根据电机驱动速度调整脉冲的检测周期，从而测量电机驱动速度。 电机控制器设置检测周期，使得四倍的脉冲数可以是四倍的倍数。 虽然从编码器输出的脉冲之间的相位差不是恒定的，但是通过排除脉冲之间的相位误差的影响，电动机控制装置可以获得期望的响应特性。

    Pattern synthesis apparatus and semiconductor test system having the same
    6.
    发明授权
    Pattern synthesis apparatus and semiconductor test system having the same 有权
    图案合成装置和半导体测试系统

    公开(公告)号：US09229057B2

    公开(公告)日：2016-01-05

    申请号：US13484481

    申请日：2012-05-31

    申请人： Sung Yeol Kim ,  In-su Yang ,  Min Sung Kim ,  Jae Hyun Baek ,  Jin-Kyu Choi ,  Ho Sun Yoo

    发明人： Sung Yeol Kim ,  In-su Yang ,  Min Sung Kim ,  Jae Hyun Baek ,  Jin-Kyu Choi ,  Ho Sun Yoo

    IPC分类号： G01R31/3183

    CPC分类号： G01R31/318371

    摘要： A semiconductor test system includes a user device configured to operate a reference device in accordance with an interface signal based on a timing signal having a variable operating frequency, a pattern synthesis apparatus configured to measure an interval between adjacent edges of the timing signal transmitted from the user device, and extract a logic value of the interface signal in accordance with the timing signal so as to generate test pattern data, and a test device configured to receive the test pattern data, reconstruct the timing signal based on the measured interval, generate a test driving signal such that the logic value is extracted from a device under test (DUT) based on the reconstructed timing signal, and apply the test driving signal to the DUT so as to determine an operating state of the DUT.

    摘要翻译： 半导体测试系统包括：用户设备，被配置为基于具有可变工作频率的定时信号根据接口信号来操作参考设备;模式合成设备，被配置为测量从所述定时信号发送的定时信号的相邻边缘之间的间隔; 用户设备，并根据定时信号提取接口信号的逻辑值，以产生测试模式数据;以及测试设备，被配置为接收测试模式数据，基于测量的间隔重构定时信号，生成 测试驱动信号，使得基于重构的定时信号从待测器件（DUT）提取逻辑值，并将测试驱动信号施加到DUT，以便确定DUT的操作状态。

    Method to predict phase current
    7.
    发明授权
    Method to predict phase current 有权
    预测相电流的方法

    公开(公告)号：US08362759B2

    公开(公告)日：2013-01-29

    申请号：US12588095

    申请日：2009-10-02

    申请人： Jung Ik Ha ,  Jong Ho Kim ,  Ho Sun Yoo ,  Hyung Sun You ,  Jang Hwan Kim

    发明人： Jung Ik Ha ,  Jong Ho Kim ,  Ho Sun Yoo ,  Hyung Sun You ,  Jang Hwan Kim

    IPC分类号： G01R13/14

    CPC分类号： H02M7/53875 ,  H02M2001/0009

    摘要： A phase current prediction method is disclosed. The phase current prediction method predicts current representative of a PWM period using a motor model which receives current measured through a single current sensor as an input, instead of the measured current, and determines the predicted current to be phase current.

    摘要翻译： 公开了一种相电流预测方法。 相电流预测方法使用接收通过单个电流传感器测量的电流作为输入而不是测量的电流来估计表示PWM周期的电流，并且将预测电流确定为相电流。

    Apparatus and method for eliminating variable offset values of current detecting signals
    9.
    发明授权
    Apparatus and method for eliminating variable offset values of current detecting signals 失效
    消除电流检测信号可变偏移值的装置和方法

    公开(公告)号：US06278255B1

    公开(公告)日：2001-08-21

    申请号：US09495479

    申请日：2000-02-01

    申请人： Ho-sun Yoo ,  In-su Yang

    发明人： Ho-sun Yoo ,  In-su Yang

    IPC分类号： H02P528

    CPC分类号： H02P23/16 ,  H02M2001/0009

    摘要： An apparatus for eliminating variable offset values of current detecting signals and its method having a current detector for detecting feedback current from a three-phase AC motor and for converting the feedback current into voltage detecting signals containing offset elements, differential amplifiers for differentially operating a feedback analog offset signal and the voltage detecting signals, output amplifiers for amplifying the differentially operated voltage detecting signals to fit within the input range for controlling, an analog/digital converter for converting the amplified signals into digital signals, a control part for adding up the digital signals to a digital offset value and for comparing the digital offset value with a predetermined offset command and for applying a proportional plus integral function to the compared result and for outputting a digital offset signal of a pulse-width modulation waveform, and a digital/analog converter for converting the digital offset signal into the analog offset signal and for providing a feedback loop of the analog offset signal to the differential amplifiers. The disclosed invention can adjust a current detecting signal to a desired level of signal even though the offset element which is contained in the detecting signal of a motor such as a current detecting signal of the ASIPM is being variably changed.

    摘要翻译： 一种用于消除电流检测信号的可变偏移值的装置及其方法，其具有用于检测来自三相AC电动机的反馈电流的电流检测器，以及用于将反馈电流转换成包含偏移元件的电压检测信号，用于差分地操作反馈的差分放大器 模拟偏移信号和电压检测信号，输出放大器，用于放大差分工作电压检测信号，以适应用于控制的输入范围;模拟/数字转换器，用于将放大的信号转换为数字信号;控制部分，用于将数字 信号到数字偏移值，并用于将数字偏移值与预定的偏移指令进行比较，并将比例积分函数应用于比较结果，并输出脉冲宽度调制波形的数字偏移信号，以及数字/模拟 用于转换数字偏移的转换器 点燃模拟偏移信号，并将模拟偏移信号的反馈环路提供给差分放大器。 所公开的发明可以将电流检测信号调整到期望的信号电平，即使包含在诸如ASIPM的电流检测信号的电动机的检测信号中的偏移元素是可变的。

    PATTERN SYNTHESIS APPARATUS AND SEMICONDUCTOR TEST SYSTEM HAVING THE SAME
    10.
    发明申请
    PATTERN SYNTHESIS APPARATUS AND SEMICONDUCTOR TEST SYSTEM HAVING THE SAME 有权
    图案合成设备和具有相同功能的半导体测试系统

    公开(公告)号：US20120326738A1

    公开(公告)日：2012-12-27

    申请号：US13484481

    申请日：2012-05-31

    申请人： Sung Yeol Kim ,  In-Su Yang ,  Min Sung Kim ,  Jae Hyun Baek ,  Jin-Kyu Choi ,  Ho Sun Yoo

    发明人： Sung Yeol Kim ,  In-Su Yang ,  Min Sung Kim ,  Jae Hyun Baek ,  Jin-Kyu Choi ,  Ho Sun Yoo

    IPC分类号： G01R31/26

    CPC分类号： G01R31/318371

    摘要： A semiconductor test system includes a user device configured to operate a reference device in accordance with an interface signal based on a timing signal having a variable operating frequency, a pattern synthesis apparatus configured to measure an interval between adjacent edges of the timing signal transmitted from the user device, and extract a logic value of the interface signal in accordance with the timing signal so as to generate test pattern data, and a test device configured to receive the test pattern data, reconstruct the timing signal based on the measured interval, generate a test driving signal such that the logic value is extracted from a device under test (DUT) based on the reconstructed timing signal, and apply the test driving signal to the DUT so as to determine an operating state of the DUT.

    摘要翻译： 半导体测试系统包括：用户设备，被配置为基于具有可变工作频率的定时信号根据接口信号来操作参考设备;模式合成设备，被配置为测量从所述定时信号发送的定时信号的相邻边缘之间的间隔; 用户设备，并根据定时信号提取接口信号的逻辑值，以产生测试模式数据;以及测试设备，被配置为接收测试模式数据，基于测量的间隔重构定时信号，生成 测试驱动信号，使得基于重构的定时信号从待测器件（DUT）提取逻辑值，并将测试驱动信号施加到DUT，以便确定DUT的操作状态。