Microreplication on a complex surface
    2.
    发明授权
    Microreplication on a complex surface 有权
    复杂表面微复制

    公开(公告)号:US08030591B2

    公开(公告)日:2011-10-04

    申请号:US11461156

    申请日:2006-07-31

    IPC分类号: B23H1/04 B23H7/30

    摘要: A cutting tool assembly using a machined tool operating in a plunge mode of electrical discharge machining to make microreplicated features in a work piece having a complex surface. The microreplicated features can be non-adjacent and can have any geometric configuration and micron-scaled dimensions, as determined by the microstructured features in the tool. The machined work piece can be used as a master tool in order to make microreplicated articles such as optical films, friction control films, plasma display panel molds, or micro-fasteners.

    摘要翻译: 一种切割工具组件,其使用以放电加工的插入模式操作的加工工具,以使具有复杂表面的工件中的微复制特征。 微复制特征可以是不相邻的,并且可以具有由工具中的微结构特征确定的任何几何构型和微米级尺寸。 加工的工件可以用作主工具,以便制造诸如光学膜,摩擦控制膜,等离子体显示面板模具或微型紧固件的微复制品。

    High-intensity rotary peening particle support and method of making same
    6.
    发明授权
    High-intensity rotary peening particle support and method of making same 失效
    高强度旋转喷丸颗粒支撑及其制作方法

    公开(公告)号:US5179852A

    公开(公告)日:1993-01-19

    申请号:US788498

    申请日:1991-11-06

    摘要: An improved high-intensity rotary peening particle support of the type having a plurality of peening particles metallurgically secured to an exposed face thereof is presented, the support having a base composition consisting essentially of from about 0.08 to about 0.34 weight percent carbon, the balance iron, and a Ni-enriched layer which provides a hard, wear resistant surface. A method of producing such a support is also described, the method including cold forming a peening particle support base composition as described, stress relieving, brazing peening particles to an exposed face of the support, austenitizing, quenching, and tempering the support to form a support having a Ni-enriched layer which is harder than the base composition.

    摘要翻译: 提供了具有冶金固定到其暴露表面上的多个喷丸颗粒类型的改进的高强度旋转喷丸颗粒载体,所述载体具有基本上由约0.08至约0.34重量百分比的碳组成的基础组合物,余量为 ,以及提供硬的耐磨表面的富镍层。 还描述了制备这种载体的方法,该方法包括将如上所述的喷丸颗粒载体基础组合物冷却成形,将应力消除,钎焊喷丸颗粒施加到载体的暴露面上,奥氏体化,淬火和回火以形成载体 支撑体具有比基体组合物更硬的Ni富集层。

    Aligned multi-diamond cutting tool assembly for creating microreplication tools
    7.
    发明授权
    Aligned multi-diamond cutting tool assembly for creating microreplication tools 失效
    用于创建微复制工具的对齐多金刚石切割工具组件

    公开(公告)号:US07757591B2

    公开(公告)日:2010-07-20

    申请号:US11253496

    申请日:2005-10-19

    IPC分类号: B23B27/20 B26D1/00

    摘要: The disclosure is directed to a cutting tool assembly used for creating grooves in a microreplication tool. The cutting tool assembly includes a mounting structure and multiple diamonds aligned in the mounting structure to a tolerance of less than 10 microns. For example, first and second tool shanks having first and second diamond tips can be positioned in the mounting structure such that a cutting location of the first diamond tip is identical to a cutting location of the second diamond tip. However, the second diamond tip may be a defined distance further away from the mounting structure than the first diamond tip, or the second diamond tip may have a different shape than the first diamond tip. In this manner, the first diamond tip may cut a groove into a work piece and the second diamond tip may cut a sub-feature into the groove to create a multi-featured groove.

    摘要翻译: 本发明涉及一种用于在微复制工具中产生凹槽的切割工具组件。 切割工具组件包括安装结构和在安装结构中对准的多个金刚石,其公差小于10微米。 例如,具有第一和第二金刚石尖端的第一和第二工具柄可以定位在安装结构中,使得第一金刚石尖端的切割位置与第二金刚石刀片的切割位置相同。 然而,第二金刚石尖端可以是比第一金刚石尖端更远离安装结构的限定距离,或者第二金刚石尖端可以具有与第一金刚石尖端不同的形状。 以这种方式,第一金刚石尖端可以将凹槽切割成工件,并且第二金刚石尖端可以将子特征切割到凹槽中以形成多功能凹槽。

    DIMENSIONAL CONTROL IN ELECTROFORMS
    8.
    发明申请
    DIMENSIONAL CONTROL IN ELECTROFORMS 有权
    电子学中的尺寸控制

    公开(公告)号:US20090277794A1

    公开(公告)日:2009-11-12

    申请号:US12117880

    申请日:2008-05-09

    IPC分类号: C25D1/20

    CPC分类号: C25D1/20 C25D5/022

    摘要: A method includes placing a conductive mold in a first bath of electroforming solution, the solution including metal and having a selected temperature. A current is provided to the electroforming solution so that metal deposits onto the mold, thereby forming an electroformed element on the mold, the electroformed element and the mold being a composite assembly. The method further includes removing the composite assembly from the electroforming solution and transferring the composite assembly to a second bath having the same selected temperature. Thereafter, the electroformed element is separated from the mold while the composite assembly is in the second bath.

    摘要翻译: 一种方法包括将导电模具放置在电铸溶液的第一浴中,溶液包括金属并具有选定的温度。 向电铸溶液提供电流,使得金属沉积到模具上,从而在模具上形成电铸元件,电铸元件和模具是复合组件。 该方法还包括从电铸溶液中除去复合组件并将复合组件转移到具有相同选定温度的第二槽中。 此后,电铸元件与模具分离,而复合组件处于第二槽中。

    MICROREPLICATION ON A COMPLEX SURFACE
    9.
    发明申请
    MICROREPLICATION ON A COMPLEX SURFACE 有权
    复合表面的微观化

    公开(公告)号:US20080023446A1

    公开(公告)日:2008-01-31

    申请号:US11461156

    申请日:2006-07-31

    IPC分类号: B23H1/04 B23H7/30

    摘要: A cutting tool assembly using a machined tool operating in a plunge mode of electrical discharge machining to make microreplicated features in a work piece having a complex surface. The microreplicated features can be non-adjacent and can have any geometric configuration and micron-scaled dimensions, as determined by the microstructured features in the tool. The machined work piece can be used as a master tool in order to make microreplicated articles such as optical films, friction control films, plasma display panel molds, or micro-fasteners.

    摘要翻译: 一种切割工具组件,其使用以放电加工的插入模式操作的加工工具,以使具有复杂表面的工件中的微复制特征。 微复制特征可以是不相邻的,并且可以具有由工具中的微结构特征确定的任何几何构型和微米级尺寸。 加工的工件可以用作主工具,以便制造诸如光学膜,摩擦控制膜,等离子体显示面板模具或微型紧固件的微复制品。

    Working liquids and methods for modifying structured wafers suited for semiconductor fabrication
    10.
    发明授权
    Working liquids and methods for modifying structured wafers suited for semiconductor fabrication 有权
    用于修改适用于半导体制造的结构晶片的工作液体和方法

    公开(公告)号:US06238592B1

    公开(公告)日:2001-05-29

    申请号:US09266208

    申请日:1999-03-10

    IPC分类号: C09K1300

    摘要: A family of working liquids useful in modifying exposed surfaces of wafers for semiconductor fabrication are provided along with methods of modifying exposed surfaces of wafers for semiconductor fabrication utilizing such a family of working liquids, and semiconductor wafers made according the foregoing process. The working liquid of the invention is a solution of initial components, the components comprising: an oxidizing agent; an ionic buffer; a passivating agent; a chelating agent selected from iminodiacetic acid and salts thereof; and water. The method of the invention comprises the steps of: a) providing a wafer comprising a first material having a surface etched to form a pattern and a second material deployed over the surface of the first material; b) contacting the second material of the wafer with abrasive in the presence of the working liquid; and c) relatively moving the wafer while the second material is in contact with the abrasive until an exposed surface of the wafer is planar and comprises at least one area of exposed first material and one area of exposed second material.

    摘要翻译: 提供了可用于修改用于半导体制造的晶片的暴露表面的一系列工作液体,以及利用这样的工作液体族和根据前述方法制造的半导体晶片修改用于半导体制造的晶片的暴露表面的方法。 本发明的工作液是初始组分的溶液,其组分包括:氧化剂; 离子缓冲液 钝化剂; 选自亚氨基二乙酸及其盐的螯合剂; 和水。 本发明的方法包括以下步骤:a)提供包括第一材料的晶片,所述第一材料具有被蚀刻以形成图案的表面和在第一材料的表面上展开的第二材料; b)在工作液体的存在下使晶片的第二材料与研磨剂接触; 以及c)当所述第二材料与所述研磨剂接触时相对移动所述晶片,直到所述晶片的暴露表面是平面的并且包括暴露的第一材料和暴露的第二材料的一个区域的至少一个区域。