Abstract:
The present invention relates to a system for measuring an absolute quantity of each component of a gas using a QMS, more particularly to a system for measuring an absolute quantity of each component of a gas using a QMS, which is capable of performing not only a qualitative analysis but also a quantitative analysis in an accurate manner, using just a trace amount of gas introduced through a pinhole. According to the present invention, the productivity of products can be improved, and production management can be performed in an efficient manner, thereby improving industrial competitiveness.
Abstract:
Provided is a method for detecting an airborne noxious substance using radio-frequency inductive coupled plasma-mass spectroscopy (ICP-MS). The method includes: supplying a gas to be detected to a radio-frequency inductive coupled plasma; supplying oxygen gas to the gas introduced to the plasma to generate the oxide ion of a noxious element; and detecting the mass of the oxide ion of the noxious element. The method requires no separate pretreatment for detecting an airborne noxious substance, uses the ambient air itself as an analyte, and allows detection of the existence and amount of a noxious substance with high accuracy in a rapid and simple manner.
Abstract:
Provided are an apparatus for collecting gas samples in a foam and an analysis method using the same, and more particularly, to an apparatus for collecting gas samples in a foam in which the foam is grinded, such that the gas sample in the foam may be effectively collected, and pressure before and after collection of the gas samples may be measured to thereby increase accuracy of gas analysis, such that characteristics of the foam may be more accurately evaluated, and an analysis method using the same.
Abstract:
A method for fabricating a process substrate includes: providing a first substrate; providing a substrate and an auxiliary substrate; contacting the substrate and the auxiliary substrate with each other in a vacuum state, thereby forming micro spaces of a vacuum state between the substrate and the auxiliary substrate; and increasing a pressure at the outside of the contacted substrate and auxiliary substrate to attach the substrate and the auxiliary substrate to each other by a pressure difference between the micro spaces and the outside of the contacted substrate and auxiliary substrate.
Abstract:
A mask for forming a black matrix for a display device that includes a data line having a bending structure with respect to a central portion of a pixel region includes a edge frame having a rectangular shape, and a base plate disposed on the edge frame and including a light-transmitting portion and a light-blocking portion, wherein the light-transmitting portion includes first light-transmitting patterns and light-controlling portions between adjacent first light-transmitting patterns, and the light-transmitting portion further includes a bending portion corresponding to the central portion of the pixel region, and wherein the bending portion is disposed with a same distance from the light-transmitting patterns adjacent thereto.
Abstract:
Provided are an apparatus for collecting gas samples in a foam and an analysis method using the same, and more particularly, to an apparatus for collecting gas samples in a foam in which the foam is grinded, such that the gas sample in the foam may be effectively collected, and pressure before and after collection of the gas samples may be measured to thereby increase accuracy of gas analysis, such that characteristics of the foam may be more accurately evaluated, and an analysis method using the same.
Abstract:
A mask for forming a black matrix for a display device that includes a data line having a bending structure with respect to a central portion of a pixel region includes a edge frame having a rectangular shape, and a base plate disposed on the edge frame and including a light-transmitting portion and a light-blocking portion, wherein the light-transmitting portion includes first light-transmitting patterns and light-controlling portions between adjacent first light-transmitting patterns, and the light-transmitting portion further includes a bending portion corresponding to the central portion of the pixel region, and wherein the bending portion is disposed with a same distance from the light-transmitting patterns adjacent thereto.
Abstract:
A method for fabricating a process substrate includes: providing a first substrate; providing a substrate and an auxiliary substrate; contacting the substrate and the auxiliary substrate with each other in a vacuum state, thereby forming micro spaces of a vacuum state between the substrate and the auxiliary substrate; and increasing a pressure at the outside of the contacted substrate and auxiliary substrate to attach the substrate and the auxiliary substrate to each other by a pressure difference between the micro spaces and the outside of the contacted substrate and auxiliary substrate.