Sealable Bag
    2.
    发明申请
    Sealable Bag 审中-公开
    密封袋

    公开(公告)号:US20130077894A1

    公开(公告)日:2013-03-28

    申请号:US13243410

    申请日:2011-09-23

    IPC分类号: B65D33/16

    CPC分类号: B65D33/2508 B65D33/20

    摘要: A sealable plastic bag has a first panel and a second panel. The first and second panels are joined to each other along three edges to define a bag interior and an opening permitting access to the bag interior. A resealable sealing structure extends continuously between the first and second side edges of at least one of the panels and is configured to repeatedly and nondestructively seal and unseal the first and second panels to close and open the bag interior. A secondary sealing structure extends continuously between the first and second side edges of both of the panels below the resealable sealing structure but spaced toward the top edges of the panels. The secondary sealing structure is also configured to repeatedly and nondestructively seal and unseal the first and second panels together to close and open the bag interior.

    摘要翻译: 可密封的塑料袋具有第一面板和第二面板。 第一和第二面板沿着三个边缘彼此连接以限定袋子内部和允许进入袋子内部的开口。 可重新密封的密封结构在至少一个面板的第一和第二侧边缘之间连续延伸,并且被配置为重复地和非破坏性地密封和开封第一和第二面板以关闭和打开袋内部。 二次密封结构在可再密封的密封结构下面的两个面板的第一和第二侧边缘之间连续延伸,但是朝向面板的顶部边缘间隔开。 二次密封结构还被构造成将第一和第二面板重复地和非破坏性地密封和开封在一起以封闭和打开袋内部。

    Particle detection system
    3.
    发明授权
    Particle detection system 有权
    粒子检测系统

    公开(公告)号:US08237125B2

    公开(公告)日:2012-08-07

    申请号:US12764890

    申请日:2010-04-21

    IPC分类号: G01T1/28

    摘要: This invention provides a design to process a large range of detection beam current at low noise with a single detector. With such a design, the detection system can generate up to 1010 gain and maximum signal output at more than mini Ampere (mA) level.

    摘要翻译: 本发明提供了利用单个检测器处理低噪声的大范围检测光束电流的设计。 通过这样的设计,检测系统可以以超过小于安培(mA)的电平产生多达1010个增益和最大信号输出。

    Movable Detector for Charged Particle Beam Inspection or Review
    4.
    发明申请
    Movable Detector for Charged Particle Beam Inspection or Review 有权
    用于带电粒子束检测或检查的可移动检测器

    公开(公告)号:US20110291007A1

    公开(公告)日:2011-12-01

    申请号:US12787139

    申请日:2010-05-25

    IPC分类号: G01N23/22 H01J37/244

    摘要: The present invention generally relates to a detection unit of a charged particle imaging system. More particularly, portion of the detection unit can move into or out of the detection system as imaging condition required. With the assistance of a Wein filter (also known as an E×B charged particle analyzer) and a movable detector design, the present invention provides a stereo imaging system that suitable for both low current, high resolution mode and high current, high throughput mode. Merely by way of example, the invention has been applied to a scanning electron beam inspection system. But it would be recognized that the invention could apply to other system using charged particle beam as an observation tool.

    摘要翻译: 本发明一般涉及带电粒子成像系统的检测单元。 更具体地,检测单元的一部分可以作为所需的成像条件移入或移出检测系统。 在Wein滤波器(也称为E×B带电粒子分析仪)和可移动检测器设计的帮助下,本发明提供了一种适用于低电流,高分辨率模式和高电流,高通量模式的立体成像系统 。 仅作为示例,本发明已经应用于扫描电子束检查系统。 但是应当认识到,本发明可以应用于使用带电粒子束作为观测工具的其它系统。

    Charged particle system including segmented detection elements
    5.
    发明授权
    Charged particle system including segmented detection elements 失效
    带电粒子系统包括分段检测元件

    公开(公告)号:US07928383B2

    公开(公告)日:2011-04-19

    申请号:US12204282

    申请日:2008-09-04

    IPC分类号: H01J49/00 B01D59/44

    摘要: A charged particle detector consists of a plurality independent light guide modules assembled together to form a segmented in-lens on-axis annular detector, with a center hole for allowing the primary charged particle beam to pass through. One side of the assembly facing the specimen is coated with or bonded to scintillator material as the charged particle detection surface. Each light guide module is coupled to a photomultiplier tube to allow light signals transmitted through each light guide module to be amplified and processed separately. A charged particle detector is made from a single block of light guide material processed to have a cone shaped circular cutout from one face, terminating on the opposite face to an opening to allow the primary charged particle beam to pass through. The opposite face is coated with or bonded to scintillator material as the charged particle detection surface. The outer region of the light guide block is shaped into four separate light guide output channels and each light guide output channel is coupled to a photomultiplier tube to allow light signal output from each channel to be amplified and processed separately.

    摘要翻译: 带电粒子检测器由多个独立的光导模块组成,组合在一起以形成分段的透镜内轴环形探测器,其中心孔用于允许初级带电粒子束通过。 面向样品的组件的一侧作为带电粒子检测表面涂覆或结合到闪烁体材料。 每个光导模块耦合到光电倍增管,以允许通过每个光导模块传输的光信号被单独放大和处理。 带电粒子检测器由一块光导材料制成,被处理成具有从一个面的锥形圆形切口,终止在与开口相对的面上以允许初级带电粒子束通过。 相反的面被涂覆或与闪烁体材料结合,作为带电粒子检测表面。 导光块的外部区域被成形为四个分开的光导输出通道,并且每个光导输出通道耦合到光电倍增管,以允许来自每个通道的光信号输出被单独放大和处理。

    ELECTRON BEAM APPARATUS
    7.
    发明申请
    ELECTRON BEAM APPARATUS 有权
    电子束设备

    公开(公告)号:US20100102227A1

    公开(公告)日:2010-04-29

    申请号:US12257304

    申请日:2008-10-23

    IPC分类号: G01N23/00 H01J3/20

    摘要: The present invention relates to a charged particle beam apparatus which employs a scanning electron microscope for sample inspection and defect review.The present invent provides solution of improving imaging resolution by utilizing a field emission cathode tip with a large tip radius, applying a large accelerating voltage across ground potential between the cathode and anode, positioning the beam limit aperture before condenser lens, utilizing condenser lens excitation current to optimize image resolution, applying a high tube bias to shorten electron travel time, adopting and modifying SORIL objective lens to ameliorate aberration at large field of view and under electric drifting and reduce the urgency of water cooling objective lens while operating material analysis.The present invent provides solution of improving throughput by utilizing fast scanning ability of SORIL and providing a large voltage difference between sample and detectors.

    摘要翻译: 本发明涉及采用扫描电子显微镜进行样品检查和缺陷检查的带电粒子束装置。 本发明提供了通过利用具有大的尖端半径的场致发射阴极尖端来提高成像分辨率的解决方案,在阴极和阳极之间的地电位上施加大的加速电压,将光束极限孔定位在聚光透镜之前,利用聚光透镜激发电流 优化图像分辨率,应用高管偏压缩短电子行进时间,采用和修正SORIL物镜,以改善大视野和电漂移下的像差,并减少水冷物镜在操作材料分析时的紧迫性。 本发明提供了通过利用SORIL的快速扫描能力并在样品和检测器之间提供大的电压差来提高产量的解决方案。

    Vibration resistent, energy efficient lamp
    8.
    发明申请
    Vibration resistent, energy efficient lamp 有权
    耐振,节能灯

    公开(公告)号:US20080258620A1

    公开(公告)日:2008-10-23

    申请号:US11788883

    申请日:2007-04-23

    IPC分类号: H01K1/50 H01J5/00 H01K1/14

    CPC分类号: H01K1/00

    摘要: A vibration resistant, energy efficient lamp (10) that is suitable for, for example, ceiling fan operation where vibration is always a concern. The lamp (10) comprises an envelope (12) of a suitable transparent glass, for example, a borosilicate glass, having a substantially spherical upper body (14) with a given diameter D, a substantially cylindrical waist (16) having a diameter W of about 38% of the given diameter; a neck portion (18) having a diameter N of about 31 to about 32% of the given diameter and a threaded base (20) having a diameter B of about 25 to 27% of the given diameter. The base (20) has a skirt portion (22) adjacent the neck portion having diameter S substantially equal to the neck portion (18) diameter N and larger than the diameter B of the base (20). The skirt (22) provides a broader attachment area for the neck (18), thus strengthening the coupling and providing a stronger joint that is more suited to operations in those functions where vibration can be encountered, especially in those areas where the lamp is mounted base-up.

    摘要翻译: 一种耐振动,节能的灯(10),适用于例如总是关注振动的吊扇操作。 灯(10)包括合适的透明玻璃(例如硼硅酸盐玻璃)的外壳(12),其具有具有给定直径D的基本上球形的上体(14),具有直径W的基本上圆柱形的腰部(16) 约为给定直径的38%; 直径N为给定直径的约31至约32%的颈部(18)和直径B为所述给定直径的约25至27%的螺纹底座(20)。 基部(20)具有与颈部相邻的裙部(22),其具有基本上等于颈部(18)直径N并且大于基部(20)的直径B的直径S。 裙部(22)为颈部(18)提供更宽的附接区域,因此加强了联接并提供了更适合在可能遇到振动的功能中操作的更强的接头,特别是在那些安装有灯的区域 基地。

    Gate coupling electrostatic discharge protection circuit with redundant structures
    9.
    发明授权
    Gate coupling electrostatic discharge protection circuit with redundant structures 有权
    栅极耦合静电放电保护电路具有冗余结构

    公开(公告)号:US07440247B2

    公开(公告)日:2008-10-21

    申请号:US11059517

    申请日:2005-02-17

    CPC分类号: H01L27/0274

    摘要: A gate coupling electrostatic discharge protection circuit is disclosed. The protection circuit that is connected an ESD structure with gate coupling to a first level circuit and other ESD structures with gate coupling to a derived circuit derived from the first level circuit in parallel could be used to drain the electrostatic discharge. The resistance of the first level circuit and the resistance of derived circuit are matched in draining the electrostatic discharge, whereby the current wouldn't concentrate on a certain portion of these cascades structures.

    摘要翻译: 公开了一种栅极耦合静电放电保护电路。 将与ESD耦合的ESD结构连接到第一电平电路的保护电路以及与从第一电平电路并联导出的导出电路的栅极耦合的其他ESD结构可以用于排出静电放电。 第一级电路的电阻和导出电路的电阻在排放静电放电时匹配,从而电流将不会集中在这些级联结构的某一部分上。

    SYSTEM AND METHOD FOR A CHARGED PARTICLE BEAM
    10.
    发明申请
    SYSTEM AND METHOD FOR A CHARGED PARTICLE BEAM 有权
    充电颗粒束的系统和方法

    公开(公告)号:US20080121810A1

    公开(公告)日:2008-05-29

    申请号:US11923012

    申请日:2007-10-24

    IPC分类号: H01J1/50

    摘要: System and method for charged particle beam. According an embodiment, the present invention provides a charged particle beam apparatus. The apparatus includes a charged particle source for generating a primary charged particle beam. The apparatus also includes at least one condenser lens for pre-focusing the primary charge particle beam. Furthermore, the apparatus includes a compound objective lens for forming the magnetic field and the electrostatic field to focus the primary charged particle beam onto a specimen in the charged particle beam path. The specimen includes a specimen surface. The compound objective lens includes a conical magnetic lens, an immersion magnetic lens, and an electrostatic lens, the conical magnetic lens including an upper pole piece, a shared pole piece being electrically insulated from the upper pole piece, and an excitation coil.

    摘要翻译: 带电粒子束的系统和方法。 根据实施例,本发明提供一种带电粒子束装置。 该装置包括用于产生初级带电粒子束的带电粒子源。 该装置还包括用于预聚焦初级充电粒子束的至少一个聚光透镜。 此外,该装置包括用于形成磁场的复合物镜和静电场,以将初级带电粒子束聚焦到带电粒子束路径中的样本上。 样品包括样品表面。 复合物镜包括锥形磁性透镜,浸没式磁透镜和静电透镜,该圆锥形磁性透镜包括上极片,与上极片电绝缘的共用极片和励磁线圈。