Method for fabrication of probe card for testing of semiconductor devices
    1.
    发明授权
    Method for fabrication of probe card for testing of semiconductor devices 失效
    制造用于半导体器件测试的探针卡的方法

    公开(公告)号:US5225037A

    公开(公告)日:1993-07-06

    申请号:US709954

    申请日:1991-06-04

    IPC分类号: G01R1/073

    CPC分类号: G01R1/0735

    摘要: A flexible polyimide film is used to support an array of precisely located contact bumps which are used to probe die on a wafer of semiconductor circuits, or an unmounted integrated circuit die, several integrated circuits, or hybrid devices. By utilizing a standard I/O contact pattern for the flexible film and fabricating the membrane assembly of interconnects on an aluminum substrate, it is possible to produce a more reliable probe card, while reducing the fabrication time and costs for the probe card. The polyimide film must be selected to have a CTE of 3 to 5, which is only about 1/5 to 1/7 as great as the CTE of the aluminum substrate on which the film is formed. This produces a critical degree of compressive stress in the polyimide film, and a resulting "bow" of the film when the central area of the aluminum is etched away.

    摘要翻译: 柔性聚酰亚胺膜用于支撑用于在半导体电路的晶片或未安装的集成电路管芯,多个集成电路或混合器件上探测管芯的精确定位的接触凸块阵列。 通过利用柔性膜的标准I / O接触图案和在铝基板上制造互连膜组件,可以产生更可靠的探针卡,同时减少探针卡的制造时间和成本。 必须选择聚酰亚胺膜的CTE为3〜5,与形成有膜的铝基板的CTE相比,仅为1/5〜1/7左右。 这在聚酰亚胺膜中产生临界程度的压缩应力,并且当铝的中心区域被蚀刻掉时,所得到的“弓”。