摘要:
A condensation particle counter is capable of efficiently measuring the number and size of fine particles. The condensation particle counter includes a saturator, a condenser and an optical particle counters. The saturator is designed to generate a saturated gas by saturating a gas in which fine particles are suspended with working fluid. The condenser is connected to a downstream side of the saturator to condense the saturated gas so that liquid droplets can grow around the fine particles. The optical particle counter is connected to downstream sides of the condenser to optically detect the liquid droplets supplied from the condensers. The condenser has a condenser tube for interconnecting the saturator and the optical particle counter. The present condensation particle counter can use water as working fluid and also can optically measure fine particles in an easy and accurate manner by forming or installing an inner surface of a condenser tube with a hydrophilic tube.
摘要:
A condensation particle counter is capable of efficiently measuring the number and size of fine particles. The condensation particle counter includes a saturator, a plurality of condensers and a plurality of optical particle counters. The saturator is designed to generate a saturated gas by saturating a gas in which fine particles are suspended with working fluid. The condensers are connected to a downstream side of the saturator to condense the saturated gas so that liquid droplets can grow around the fine particles. The optical particle counters are connected to downstream sides of the condensers to optically detect the liquid droplets supplied from the condensers. Each of the condensers has a condenser tube for interconnecting the saturator and each of the optical particle counters. The condenser tube is provided with a hydrophilic tube installed inside surface of the condenser tube.
摘要:
A device for collecting dust using highly charged hyperfine liquid droplets formed through an electro-hydrodynamic atomization process is disclosed. In the dust collecting device of this invention, a high voltage is applied to capillaries, set within a dust guide duct and having nozzles at their tips. An electric field is thus formed between the capillaries and the duct, and allows the nozzles to spray highly charged hyperfine liquid droplets. Such liquid droplets absorb dust laden in air, flowing in the duct by suction force of a fan. An electrostatic dust collector is detachably coupled to the duct while being insulated from the duct, and forms an electric field having polarity opposite to that of the highly charged liquid droplets, thus electrostatically collecting and removing the dust absorbed by the highly charged liquid droplets. The dust collecting device of this invention easily and effectively removes fine dust having a size smaller than 0.1 cm. This device is also preferably operable at low cost while achieving a desired dust collection effect, and is collaterally advantageous in that it humidifies discharged air, when water is used as the liquid for atomization of the hyperfine liquid droplets.
摘要:
A condensation particle counter is capable of efficiently measuring the number and size of fine particles. The condensation particle counter includes a saturator, a plurality of condensers and a plurality of optical particle counters. The saturator is designed to generate a saturated gas by saturating a gas in which fine particles are suspended with working fluid. The condensers are connected to a downstream side of the saturator to condense the saturated gas so that liquid droplets can grow around the fine particles. The optical particle counters are connected to downstream sides of the condensers to optically detect the liquid droplets supplied from the condensers. Each of the condensers has a condenser tube for interconnecting the saturator and each of the optical particle counters. The condenser tube is provided with a hydrophilic tube installed inside surface of the condenser tube.
摘要:
A condensation particle counter is capable of efficiently measuring the number and size of fine particles. The condensation particle counter includes a saturator, a condenser and an optical particle counters. The saturator is designed to generate a saturated gas by saturating a gas in which fine particles are suspended with working fluid. The condenser is connected to a downstream side of the saturator to condense the saturated gas so that liquid droplets can grow around the fine particles. The optical particle counter is connected to downstream sides of the condenser to optically detect the liquid droplets supplied from the condensers. The condenser has a condenser tube for interconnecting the saturator and the optical particle counter. The present condensation particle counter can use water as working fluid and also can optically measure fine particles in an easy and accurate manner by forming or installing an inner surface of a condenser tube with a hydrophilic tube.
摘要:
An ultra-fine particle manufacturing apparatus and method is capable of producing nanometer-sized ultra-fine particles from reaction gases with high energy light beams, corona discharge and an electric field. High energy light beams are irradiated into a chamber of a housing through the use of a high energy light source. Reaction gases are supplied from a reaction gas supply device to a reaction gas inlet tube. The reaction gases are then introduced through the reaction gas inlet tube into the chamber of the housing to produce a large quantity of ultra-fine particles through the reaction of the reaction gases with the high energy light beams. A voltage is applied to the reaction gas inlet tube by means of a power supply device. The ultra-fine particles flowing within the chamber of the housing are collected by means of a collecting plate.
摘要:
The present invention relates to a high flow particles atomizer for atomizing a liquid and drying atomized particles to produce the atomized particles at high flow rate. The atomizer of the present invention comprises a container for containing liquid to be atomized, a nozzle positioned at the center above a liquid surface of the liquid contained in the container for injecting a large amount of gas, a liquid supply device for supplying the liquid into the gas injected by the nozzle, and an atomized particle discharge tube communicating with the container for allowing atomized particles injected by the nozzle to be discharged to the outside of the container. In addition, the atomizer further comprises a drying device for drying the atomized particles discharged through the atomized particle discharge tube.
摘要:
Provided is apparatus for controlling flow rate of gases used in semiconductor device by differential pressure by generating differential pressure in a fluid path. A differential pressure generation element generates pressure difference in the fluid path of gases used in semiconductor device fabrication, a pressure, sensor which is installed at a bypass of the fluid path detects the pressure difference, and a central processing unit (CPU) measures and controls a flow rate of the gases, thereby the present invention is capable of controlling the flow rate precisely and rapidly, and enhancing the degree of purity of the gases by the filtering function of the differential pressure generation element itself.
摘要:
An apparatus and method for manufacturing particles using corona discharge is disclosed. A discharge electrode is provided within a guide duct and reaction gases are supplied into the guide duct. A high voltage is applied to the discharge electrode and a low voltage is applied to the guide duct to generate a voltage difference therebetween. When heat energy is applied to the reaction gases, chemical reactions occur in the gases and particles are made by the chemical reactions. The particles form new particles centering around ions as nuclei which are generated by corona discharge and moves along the guide duct. A collecting plate positioned in front of the guide duct collects the particles.
摘要:
A condensation particle counter measures the number of ultra-fine particles by growing the ultra-fine particles through a condensing process. The counter includes a capillary in which vapor of operating liquid is condensed and the ultra-fine particles grow. An insulating material surrounds the capillary to shut out heat flow between the capillary and the environment. The condensation particle counter can use various operating liquids including alcohol and water, and can be also applied to semiconductor clean rooms.