Micromaterial strain measurement apparatus and method therefor
    1.
    发明授权
    Micromaterial strain measurement apparatus and method therefor 有权
    微材料应变测量装置及其方法

    公开(公告)号:US08844367B2

    公开(公告)日:2014-09-30

    申请号:US13701402

    申请日:2011-06-01

    摘要: A measurement unit for tensile or compressive stress can includes a CCD camera for detecting an interference light, the interference light being formed with a measurement beam from a measured region and a reference beam from a reference mirror. A first objective lens can have the reference mirror. An image processing apparatus can measure the three-dimensional shape of the measured region from the position of the first objective lens at which the interference light provides the maximum contrast and can measure the distance between two gauge points on the basis of the three-dimensional shape. When strain is generated on a micromaterial, the strain against the measured tensile stress is measured on the basis of the tensile stress and the distance between the two gauge points.

    摘要翻译: 用于拉伸或压缩应力的测量单元可以包括用于检测干涉光的CCD照相机,干涉光由来自测量区域的测量光束和来自参考反射镜的参考光束形成。 第一物镜可以具有参考镜。 图像处理装置可以从干涉光提供最大对比度的第一物镜的位置测量测量区域的三维形状,并且可以基于三维形状来测量两个测量点之间的距离 。 当在微材料上产生应变时,根据拉伸应力和两个测量点之间的距离测量抵抗测量的拉伸应力的应变。

    MICROMATERIAL STRAIN MEASUREMENT APPARATUS AND METHOD THEREFOR TECHINICAL FIELD
    3.
    发明申请
    MICROMATERIAL STRAIN MEASUREMENT APPARATUS AND METHOD THEREFOR TECHINICAL FIELD 有权
    微生物菌株测定装置及其技术方法

    公开(公告)号:US20130068034A1

    公开(公告)日:2013-03-21

    申请号:US13701402

    申请日:2011-06-01

    IPC分类号: G01L1/24

    摘要: A measurement unit for tensile or compressive stress can includes a CCD camera for detecting an interference light, the interference light being formed with a measurement beam from a measured region and a reference beam from a reference mirror. A first objective lens can have the reference mirror. An image processing apparatus can measure the three-dimensional shape of the measured region from the position of the first objective lens at which the interference light provides the maximum contrast and can measure the distance between two gauge points on the basis of the three-dimensional shape. When strain is generated on a micromaterial, the strain against the measured tensile stress is measured on the basis of the tensile stress and the distance between the two gauge points.

    摘要翻译: 用于拉伸或压缩应力的测量单元可以包括用于检测干涉光的CCD照相机,干涉光由来自测量区域的测量光束和来自参考反射镜的参考光束形成。 第一物镜可以具有参考镜。 图像处理装置可以从干涉光提供最大对比度的第一物镜的位置测量测量区域的三维形状,并且可以基于三维形状测量两个测量点之间的距离 。 当在微材料上产生应变时,根据拉伸应力和两个测量点之间的距离测量抵抗测量的拉伸应力的应变。