Abstract:
To improve resolution of a built-in A/D converter by reducing the area occupied by a chip of the built-in A/D converter in a semiconductor integrated circuit that is mounted in an on-vehicle millimeter wave radar device and which incorporates an A/D converter and an MPU. In the semiconductor integrated circuit, a plurality of reception signals of the radar device is A/D-converted by a single digital correction type A/D converter. The digital correction type A/D converter of the single A/D converter is a foreground digital correction type A/D converter that sequentially A/D-converts the reception signals output from a multiplexer of a receiving interface. The single A/D converter includes a pipeline type A/D converter having a plurality of cascade-coupled converters. The semiconductor integrated circuit comprises a correction signal generating unit, a digital correction D/A converter, and a digital correction unit for digital correction.
Abstract:
To improve resolution of a built-in A/D converter by reducing the area occupied by a chip of the built-in A/D converter in a semiconductor integrated circuit that is mounted in an on-vehicle millimeter wave radar device and which incorporates an A/D converter and an MPU. In the semiconductor integrated circuit, a plurality of reception signals of the radar device is A/D-converted by a single digital correction type A/D converter. The digital correction type A/D converter of the single A/D converter is a foreground digital correction type A/D converter that sequentially A/D-converts the reception signals output from a multiplexer of a receiving interface. The single A/D converter includes a pipeline type A/D converter having a plurality of cascade-coupled converters. The semiconductor integrated circuit comprises a correction signal generating unit, a digital correction D/A converter, and a digital correction unit for digital correction.
Abstract:
A high speed, accurate AD converter operable at low supply voltage, even with low gain amplifiers, particularly for a serial-parallel or pipelined AD converter, has a sub AD converter in each block of the second and subsequent stages provided with an adjuster for adjusting the full scale reference voltage in accordance with the gain of the error amplifier of the preceding stage. Analog switches are rendered immune to low operating voltage by being supplied separate voltage higher than the supply voltage of the other components in their circuit.
Abstract:
A voltage comparator is provided including a differential amplifier, first, second and third switches, and first and second capacitors. A fourth switch is connected in series between the second and third switches and an input terminal of the differential amplifier. A first input voltage is sampled and held at the first capacitor through the first switch and at the second capacitor through the second and fourth switches, respectively. Thereafter, since the third switch is turned on and the fourth switch is turned off, the first input voltage is sampled and held at the input capacitor of the differential amplifier. Thereafter, the third switch is turned off and the fourth switch turned on. As a result, an on and off operation of the fourth switch is controlled so that a second input voltage which has been sampled at the second capacitor immediately before the switch is turned off is applied to the input capacitor of the differential amplifier.
Abstract:
A resistor-string divided into plural sets of unit-resistors generates plural reference voltages for the upper bits, while each divided set generates plural reference voltages for the lower bits. A first and second differential input are generated in direct and inverse proportion to the analog input voltage. Differential comparators for the upper bits compare two differential voltages from between the two reference voltages and the first and second differential input votlages. Two of the divided sets are selected according to the upper bit digital value and one reference voltage from each selected set is switched to a differential comparator for the lower order bits. Lower order bit comparison is similar to the high order comparison described above. Final digital value is obtained by linking the upper and lower bits digital value.
Abstract:
There is disclosed a pipelined A/D converter including a plurality of A/D-D/A sub-blocks and one A/D sub-block successively connected in cascade form to determine a conversion output by several partial bits beginning from the most significant bit. Each of A/D-D/A sub-blocks includes a sample-and-hold circuit for successively sampling and holding an input analog signal fed to the sub-block, a partial A/D converter for performing A/D conversion on a hold output of this sample-and-hold circuit, a latch circuit for latching outputs of the partial A/D converter, a D/A converter for inversely converting outputs of the latch circuit to an analog signal, and a chopper amplifier for sampling the hold output of the sample-and-hold circuit with a delay of half a period, amplifying a difference between the sampled value and the inverse conversion output of the D/A converter during a succeeding interval of amplify mode, and outputting the amplified difference to a sub-block of a succeeding stage as a conversion residue.