Verification of spare latch placement in synthesized macros
    1.
    发明授权
    Verification of spare latch placement in synthesized macros 有权
    在合成宏中验证备用锁存器位置

    公开(公告)号:US07971162B2

    公开(公告)日:2011-06-28

    申请号:US12032841

    申请日:2008-02-18

    IPC分类号: G06F17/50

    摘要: A method to assess spare latch placement in a macro, the method comprises steps of: determining a location for each spare latch in the macro; examining local clock buffers associated with the macro to locate any local clock buffers without a spare latch directly attached to clock nets driven by said local clock buffer; measuring a distance between each of the local clock buffers without spare latches and a closest spare latch; running statistics for the local clock buffers from the measuring step; and locating macros with inadequate spare latch placement using the statistics.

    摘要翻译: 一种评估宏中备用锁存器位置的方法,所述方法包括以下步骤:确定所述宏中每个备用锁存器的位置; 检查与宏相关联的本地时钟缓冲器以定位任何本地时钟缓冲器,而没有直接连接到由所述本地时钟缓冲器驱动的时钟网络的备用锁存器; 测量每个本地时钟缓冲器之间的距离,无需备用锁存器和最近的备用锁存器; 从测量步骤运行本地时钟缓冲区的统计信息; 并使用统计信息查找具有不足的备用锁存位置的宏。

    Spare gate array cell distribution analysis
    2.
    发明授权
    Spare gate array cell distribution analysis 失效
    备用门阵列电池分布分析

    公开(公告)号:US07676776B2

    公开(公告)日:2010-03-09

    申请号:US11767542

    申请日:2007-06-25

    IPC分类号: G06F17/50

    CPC分类号: G06F17/5072 G06F17/5081

    摘要: A method for determining gate array distribution includes steps or acts of: randomly placing a plurality of test boxes in a logic circuit layout; counting the number of fill cells in each of the plurality of test boxes; recording the count; grouping the plurality of test boxes into two groups: a first group with local clock buffers and a second group without local clock buffers; determining the fill cell percentage of each of the plurality of test boxes; and flagging the test boxes with a poor distribution of gate array cells.

    摘要翻译: 用于确定门阵列分布的方法包括以下步骤或动作:将多个测试盒随机放置在逻辑电路布局中; 对所述多个测试箱中的每一个中的填充单元的数量进行计数; 记录计数; 将多个测试盒分组成两组:具有本地时钟缓冲器的第一组和不具有本地时钟缓冲器的第二组; 确定所述多个测试盒中的每一个的填充单元百分比; 并标记具有较差的门阵列单元分布的测试盒。

    Verification of Spare Latch Placement in Synthesized Macros
    4.
    发明申请
    Verification of Spare Latch Placement in Synthesized Macros 有权
    验证合成宏中的备用锁存位置

    公开(公告)号:US20090210832A1

    公开(公告)日:2009-08-20

    申请号:US12032841

    申请日:2008-02-18

    IPC分类号: G06F17/50

    摘要: A method to assess spare latch placement in a macro, the method comprises steps of: determining a location for each spare latch in the macro; examining local clock buffers associated with the macro to locate any local clock buffers without a spare latch directly attached to clock nets driven by said local clock buffer; measuring a distance between each of the local clock buffers without spare latches and a closest spare latch; running statistics for the local clock buffers from the measuring step; and locating macros with inadequate spare latch placement using the statistics.

    摘要翻译: 一种评估宏中备用锁存器位置的方法,所述方法包括以下步骤:确定所述宏中每个备用锁存器的位置; 检查与宏相关联的本地时钟缓冲器以定位任何本地时钟缓冲器,而没有直接连接到由所述本地时钟缓冲器驱动的时钟网络的备用锁存器; 测量每个本地时钟缓冲器之间的距离,无需备用锁存器和最近的备用锁存器; 从测量步骤运行本地时钟缓冲区的统计信息; 并使用统计信息查找具有不足的备用锁存位置的宏。

    Spare Gate Array Cell Distribution Analysis
    5.
    发明申请
    Spare Gate Array Cell Distribution Analysis 失效
    备用阵列细胞分布分析

    公开(公告)号:US20080320430A1

    公开(公告)日:2008-12-25

    申请号:US11767542

    申请日:2007-06-25

    IPC分类号: G06F17/50

    CPC分类号: G06F17/5072 G06F17/5081

    摘要: A method for determining gate array distribution includes steps or acts of: randomly placing a plurality of test boxes in a logic circuit layout; counting the number of fill cells in each of the plurality of test boxes; recording the count; grouping the plurality of test boxes into two groups: a first group with local clock buffers and a second group without local clock buffers; determining the fill cell percentage of each of the plurality of test boxes; and flagging the test boxes with a poor distribution of gate array cells.

    摘要翻译: 用于确定门阵列分布的方法包括以下步骤或动作:将多个测试盒随机放置在逻辑电路布局中; 对所述多个测试箱中的每一个中的填充单元的数量进行计数; 记录计数; 将多个测试盒分组成两组:具有本地时钟缓冲器的第一组和不具有本地时钟缓冲器的第二组; 确定所述多个测试盒中的每一个的填充单元百分比; 并标记具有较差的门阵列单元分布的测试盒。