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1.发明授权Systems and methods for detecting and/or identifying materials based on electromagnetic radiation 有权用于基于电磁辐射检测和/或识别材料的系统和方法公开(公告)号：US08890073B2
公开(公告)日：2014-11-18
申请号：US13432606
申请日：2012-03-28
CPC分类号： G01S13/887 , G01J5/10 , G01K11/006 , G01N21/3563 , G01N21/3581
摘要： One embodiment of the invention includes a material detection and/or identification system. The system includes an electromagnetic (EM) sensor system configured to collect EM radiation from a region of interest. The collected EM radiation could comprise orthogonally-polarized EM radiation. The system also includes a processing unit configured to detect and identify a material of interest in the region of interest. As an example, the processing unit could measure reflectivity data associated with a material of interest based on the collected EM radiation and calculate a refractive index of a material of interest based on the measured reflectivity data, such that the material of interest is identified based on the refractive index. The processing unit can also be configured to calculate a surface roughness associated with the material, such that the refractive index can be calculated based on the surface roughness associated with the material.
摘要翻译： 本发明的一个实施例包括材料检测和/或识别系统。 该系统包括被配置为从感兴趣区域收集EM辐射的电磁（EM）传感器系统。 收集的EM辐射可以包括正交极化的EM辐射。 该系统还包括处理单元，该处理单元被配置为检测并识别感兴趣区域中的感兴趣的材料。 作为示例，处理单元可以基于所收集的EM辐射来测量与感兴趣的材料相关联的反射率数据，并基于所测量的反射率数据计算感兴趣的材料的折射率，使得基于 折射率。 处理单元还可以被配置为计算与材料相关联的表面粗糙度，使得可以基于与材料相关联的表面粗糙度来计算折射率。
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公开(公告)号：US08598501B2
公开(公告)日：2013-12-03
申请号：US13135268
申请日：2011-06-30
CPC分类号： F42B15/01 , F41G7/305 , F41G7/34 , G01S5/0247
摘要： A sensor system uses ground emitters to illuminate a projectile in flight with a polarized RF beam. By monitoring the polarization modulation of RF signals received from antenna elements mounted on the projectile, both angular orientation and angular rate signals can be derived and used in the inertial solution in place of the gyroscope. Depending on the spacing and positional accuracies of the RF ground emitters, position information of the projectile may also be derived, which eliminates the need for accelerometers. When RF signals of ground emitter/s are blocked from the guided projectile, the sensor deploys another plurality of RF antennas mounted on the projectile nose to determine position and velocity vectors and orientation of incoming targets.
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公开(公告)号：US20130001354A1
公开(公告)日：2013-01-03
申请号：US13135268
申请日：2011-06-30
CPC分类号： F42B15/01 , F41G7/305 , F41G7/34 , G01S5/0247
摘要： A sensor system uses ground emitters to illuminate a projectile in flight with a polarized RF beam. By monitoring the polarization modulation of RF signals received from antenna elements mounted on the projectile, both angular orientation and angular rate signals can be derived and used in the inertial solution in place of the gyroscope. Depending on the spacing and positional accuracies of the RF ground emitters, position information of the projectile may also be derived, which eliminates the need for accelerometers. When RF signals of ground emitter/s are blocked from the guided projectile, the sensor deploys another plurality of RF antennas mounted on the projectile nose to determine position and velocity vectors and orientation of incoming targets.
摘要翻译： 传感器系统使用地面发射器来照射飞行中的射弹，并使用极化RF射束。 通过监测从安装在射弹上的天线元件接收的RF信号的偏振调制，可以导出角度方向和角速率信号来代替陀螺仪在惯性解中使用。 根据射频接地发射器的间距和位置精度，也可以推导出射弹的位置信息，从而消除了加速度计的需要。 当地面发射器的射频信号被阻挡在被引导的射弹上时，传感器部署另外多个安装在射弹鼻上的射频天线，以确定输入目标的位置和速度向量和方向。
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4.发明授权Systems and methods for measuring at least one thermal property of materials based on a thermal brewster angle 有权基于热布鲁斯特角测量材料的至少一种热性质的系统和方法公开(公告)号：US08065108B2
公开(公告)日：2011-11-22
申请号：US12364848
申请日：2009-02-03
CPC分类号： G01N25/18
摘要： One embodiment of the invention includes a system for measuring at least one thermal property of a material. The system includes a thermal source configured to generate an incident thermal wave that propagates through a medium and is provided onto the material at an incident angle. The system also includes a thermal detector that is configured to receive a reflected thermal wave corresponding to the incident thermal wave reflected from the material at a reflection angle that is approximately equal to the incident angle. The system further includes a controller configured to control a magnitude of the incident angle to ascertain a thermal Brewster angle of the material and to calculate the at least one thermal property of the material based on the thermal Brewster angle.
摘要翻译： 本发明的一个实施例包括用于测量材料的至少一种热性质的系统。 该系统包括被配置为产生传播通过介质并且以入射角提供到材料上的入射热波的热源。 该系统还包括热检测器，其被配置为接收与以与入射角大致相等的反射角从材料反射的入射热波对应的反射热波。 该系统还包括控制器，其被配置为控制入射角的大小以确定材料的热布鲁斯特角，并且基于热布鲁斯特角计算材料的至少一个热性质。
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公开(公告)号：US09086483B2
公开(公告)日：2015-07-21
申请号：US13432558
申请日：2012-03-28
IPC分类号： G01J5/02 , G01S13/88 , G01N21/3581 , G01J5/10 , G01K11/00 , G01N21/3563
CPC分类号： G01S13/887 , G01J5/10 , G01K11/006 , G01N21/3563 , G01N21/3581
摘要： One embodiment of the invention includes a material detection system. The system includes a sensor system configured to collect radiation from a region of interest. The collected radiation can include a plurality of frequency bands. The system also includes a processing unit configured to detect a material of interest. The material of interest can be a concealed dielectric material, and the processing unit can be configured to decompose the collected radiation into natural resonance signals to analyze the natural resonance signals to detect an anomaly corresponding to the concealed dielectric material based on wave characteristics of the natural resonance signals. The processing unit could also include processing layers associated with the plurality of frequency bands for detecting and identifying the material of interest based on wave characteristics associated with each of the plurality of frequency bands of the collected radiation.
摘要翻译： 本发明的一个实施例包括材料检测系统。 该系统包括被配置为收集来自感兴趣区域的辐射的传感器系统。 收集的辐射可以包括多个频带。 该系统还包括被配置为检测感兴趣的材料的处理单元。 感兴趣的材料可以是隐藏的介电材料，并且处理单元可以被配置为将收集的辐射分解成天然共振信号，以分析天然共振信号，以基于天然的波的特征来检测对应于隐藏的介电材料的异常 共振信号。 处理单元还可以包括与多个频带相关联的处理层，用于基于与收集的辐射的多个频带中的每个频带相关联的波特性来检测和识别感兴趣的材料。
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公开(公告)号：US20120248313A1
公开(公告)日：2012-10-04
申请号：US13432558
申请日：2012-03-28
IPC分类号： G01J5/10
CPC分类号： G01S13/887 , G01J5/10 , G01K11/006 , G01N21/3563 , G01N21/3581
摘要： One embodiment of the invention includes a material detection system. The system includes a sensor system configured to collect radiation from a region of interest. The collected radiation can include a plurality of frequency bands. The system also includes a processing unit configured to detect a material of interest. The material of interest can be a concealed dielectric material, and the processing unit can be configured to decompose the collected radiation into natural resonance signals to analyze the natural resonance signals to detect an anomaly corresponding to the concealed dielectric material based on wave characteristics of the natural resonance signals. The processing unit could also include processing layers associated with the plurality of frequency bands for detecting and identifying the material of interest based on wave characteristics associated with each of the plurality of frequency bands of the collected radiation.
摘要翻译： 本发明的一个实施例包括材料检测系统。 该系统包括被配置为收集来自感兴趣区域的辐射的传感器系统。 收集的辐射可以包括多个频带。 该系统还包括被配置为检测感兴趣的材料的处理单元。 感兴趣的材料可以是隐藏的介电材料，并且处理单元可以被配置为将收集的辐射分解成天然共振信号，以分析天然共振信号，以基于天然的波的特征来检测对应于隐藏的介电材料的异常 共振信号。 处理单元还可以包括与多个频带相关联的处理层，用于基于与收集的辐射的多个频带中的每个频带相关联的波特性来检测和识别感兴趣的材料。
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7.发明申请公开(公告)号：US20100198549A1
公开(公告)日：2010-08-05
申请号：US12364848
申请日：2009-02-03
CPC分类号： G01N25/18
摘要： One embodiment of the invention includes a system for measuring at least one thermal property of a material. The system includes a thermal source configured to generate an incident thermal wave that propagates through a medium and is provided onto the material at an incident angle. The system also includes a thermal detector that is configured to receive a reflected thermal wave corresponding to the incident thermal wave reflected from the material at a reflection angle that is approximately equal to the incident angle. The system further includes a controller configured to control a magnitude of the incident angle to ascertain a thermal Brewster angle of the material and to calculate the at least one thermal property of the material based on the thermal Brewster angle.
摘要翻译： 本发明的一个实施例包括用于测量材料的至少一种热性质的系统。 该系统包括被配置为产生传播通过介质并且以入射角提供到材料上的入射热波的热源。 该系统还包括热检测器，其被配置为接收与以与入射角大致相等的反射角从材料反射的入射热波对应的反射热波。 该系统还包括控制器，其被配置为控制入射角的大小以确定材料的热布鲁斯特角，并且基于热布鲁斯特角计算材料的至少一个热性质。
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公开(公告)号：US20150276927A1
公开(公告)日：2015-10-01
申请号：US14159199
申请日：2014-01-20
CPC分类号： G01S13/89 , G01S13/865 , G01S17/89
摘要： One embodiment describes an imaging system. The system includes a first imaging system configured to provide first signals to a target area and to receive first response signals. The system also includes a second imaging system configured to provide second signals to the target area and to receive second response signals. The first and second signals can have separate frequency bands. The system further includes a processor configured to correct the first response signals based on the second response signals, and to generate an image based on the corrected first response signals.
摘要翻译： 一个实施例描述了一种成像系统。 该系统包括被配置为向目标区域提供第一信号并且接收第一响应信号的第一成像系统。 该系统还包括被配置为向目标区域提供第二信号并且接收第二响应信号的第二成像系统。 第一和第二信号可以具有分开的频带。 该系统还包括配置成基于第二响应信号校正第一响应信号的处理器，并且基于校正的第一响应信号产生图像。
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公开(公告)号：US09557415B2
公开(公告)日：2017-01-31
申请号：US14159199
申请日：2014-01-20
CPC分类号： G01S13/89 , G01S13/865 , G01S17/89
摘要： One embodiment describes an imaging system. The system includes a first imaging system configured to provide first signals to a target area and to receive first response signals. The system also includes a second imaging system configured to provide second signals to the target area and to receive second response signals. The first and second signals can have separate frequency bands. The system further includes a processor configured to correct the first response signals based on the second response signals, and to generate an image based on the corrected first response signals.
摘要翻译： 一个实施例描述了一种成像系统。 该系统包括被配置为向目标区域提供第一信号并且接收第一响应信号的第一成像系统。 该系统还包括被配置为向目标区域提供第二信号并且接收第二响应信号的第二成像系统。 第一和第二信号可以具有分开的频带。 该系统还包括配置成基于第二响应信号校正第一响应信号的处理器，并且基于校正的第一响应信号产生图像。
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公开(公告)号：US09330330B2
公开(公告)日：2016-05-03
申请号：US14156095
申请日：2014-01-15
CPC分类号： G06K9/4604 , G01J5/0066 , G01J5/0825 , G01J5/60 , G01J2005/0077 , G01K11/006 , G01S7/499 , G01S13/89 , G01V8/005 , G06K9/00577
摘要： A detection system includes a polarization analyzer that generates one or more null detection values if an object is sensed in a received millimeter wave (MMW) brightness temperature data set. The polarization analyzer analyzes a polarization parameter in the received MMW brightness temperature data set to generate the one or more null detection values. An object detector detects if the object is present based on a comparison of the one or more null detection values to a predetermined threshold. A singular value decomposition (SVD) unit is enabled by the object detector to decompose the MMW brightness temperature data set into a plurality of image layers. Each image layer includes at least one feature of a scene. An identification unit analyzes the plurality of image layers from the SVD unit to determine a shape or a location of the object from the scene.
摘要翻译： 检测系统包括如果在接收的毫米波（MMW）亮度温度数据集中感测到物体时产生一个或多个零检测值的偏振分析器。 偏振分析器分析所接收的MMW亮度温度数据集中的极化参数以产生一个或多个空检测值。 对象检测器基于一个或多个空检测值与预定阈值的比较来检测对象是否存在。 通过对象检测器启用奇异值分解（SVD）单元，将MMW亮度温度数据集分解为多个图像层。 每个图像层包括场景的至少一个特征。 识别单元从SVD单元分析多个图像层以确定来自场景的对象的形状或位置。
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