摘要:
A method and semiconductor memory device for precharging a local input/output line. The semiconductor memory device, which may have an open bit line structure, transmits data through local input/output lines that are coupled to bit lines of first to n-th memory cell array blocks (n being a natural number). The semiconductor memory device may include a precharge unit configured to generate a plurality of precharge signals and a controller configured to control precharging of the at least one local input/output line responsive to block information corresponding to activation of at least one of the memory cell array blocks and responsive to at least one of the precharge signals.
摘要:
A semiconductor memory device is provided. A memory cell array has a plurality of memory cells connected between a plurality of word lines and a plurality of bit-line pairs. A sense amplifier unit has a plurality of sense amplifiers connected with the bit-line pairs respectively and amplifies data of the bit-line pairs to a sensing voltage level. A command decoder decodes a command applied from the outside and outputs the decoded command. A plurality of input/output (I/O) gates electrically connects the bit-line pairs with corresponding I/O line pairs in response to a voltage level applied through a plurality of corresponding column selection lines. A column decoder decodes a column address and drives at least one of the column selection lines to a plurality of different voltages levels.
摘要:
A sense amplifier includes a reference signal providing unit and an internal sense amplification unit. The reference signal providing unit provides a reference bit line signal in response to a reference control signal. The internal sense amplification unit receives the reference bit line signal and data signals that correspond to the data. The received signals are provided through bit lines connected to the memory cell array. The internal sense amplification unit senses the received reference bit line signal and the data signals and amplifies the sensed signals. The sense amplifier senses data stored in memory cells connected to dummy bit lines of the outmost memory cell array of a semiconductor memory device such that the memory cells that are not used can be used. Accordingly, the design area and cost of the semiconductor memory device can be reduced.
摘要:
A sense amplifier includes a reference signal providing unit and an internal sense amplification unit. The reference signal providing unit provides a reference bit line signal in response to a reference control signal. The internal sense amplification unit receives the reference bit line signal and data signals that correspond to the data. The received signals are provided through bit lines connected to the memory cell array. The internal sense amplification unit senses the received reference bit line signal and the data signals and amplifies the sensed signals. The sense amplifier senses data stored in memory cells connected to dummy bit lines of the outmost memory cell array of a semiconductor memory device such that the memory cells that are not used can be used. Accordingly, the design area and cost of the semiconductor memory device can be reduced.
摘要:
A frequency detection circuit and method of detecting the frequency of a clock signal, and a latency signal generation circuit for a semiconductor memory device that includes the frequency detection circuit. The frequency detection circuit includes a frequency detector and an output controller, which determines whether or not the frequency of the clock signal is higher than a predetermined value. Embodiments of the invention have an increased accuracy, increased efficiency, and a reduced current consumption over conventional art.
摘要:
A control unit for a semiconductor memory device, a semiconductor memory device and a method for controlling the same. The control unit of a semiconductor memory device includes control signal circuits, each control signal circuit to receive a master signal and to generate at least one of a plurality of control signals in response to the master signal, each of the plurality of core control signals to be generated after a delay specific to the core control signals after a transition of the master signal, the plurality of control signals to control the semiconductor memory device.
摘要:
The present invention discloses a semiconductor memory device that includes first and second memory banks. A first control signal generating circuit generates a first control signal responsive to an external clock. A first data output circuit transmits a first output data responsive to the first control signal. An internal clock signal generating circuit outputs first and second buffered clock signals responsive to the external clock. A second control signal generating circuit generates a second control signal responsive to the first buffered clock signal and the first control signal. A second data output circuit transmits a second output data responsive to the second control signal. A third data output circuit transmits a third output data responsive to the first and second buffered clock signals. The present invention prevents data read errors resulting from variations in power supply voltage and temperature.
摘要:
A bitline precharge voltage generator comprises a leakage trimming unit and a bitline precharge voltage providing unit. The leakage trimming unit applies a leakage current to an output node to place a bitline precharge voltage at an edge of a dead zone. The bitline precharge voltage providing unit provides the bitline precharge voltage to the output node, and sets the bitline precharge voltage to a target level. The bitline precharge voltage generator generates the bitline precharge voltage having a distribution including the dead zone.
摘要:
A semiconductor memory device is provided. A memory cell array has a plurality of memory cells connected between a plurality of word lines and a plurality of bit-line pairs. A sense amplifier unit has a plurality of sense amplifiers connected with the bit-line pairs respectively and amplifies data of the bit-line pairs to a sensing voltage level. A command decoder decodes a command applied from the outside and outputs the decoded command. A plurality of input/output (I/O) gates electrically connects the bit-line pairs with corresponding I/O line pairs in response to a voltage level applied through a plurality of corresponding column selection lines. A column decoder decodes a column address and drives at least one of the column selection lines to a plurality of different voltages levels.
摘要:
The present invention discloses a semiconductor memory device that includes first and second memory banks. A first control signal generating circuit generates a first control signal responsive to an external clock. A first data output circuit transmits a first output data responsive to the first control signal. An internal clock signal generating circuit outputs first and second buffered clock signals responsive to the external clock. A second control signal generating circuit generates a second control signal responsive to the first buffered clock signal and the first control signal. A second data output circuit transmits a second output data responsive to the second control signal. A third data output circuit transmits a third output data responsive to the first and second buffered clock signals. The present invention prevents data read errors resulting from variations in power supply voltage and temperature.