Method of precharging local input/output line and semiconductor memory device using the method
    1.
    发明授权
    Method of precharging local input/output line and semiconductor memory device using the method 失效
    使用该方法对本地输入/输出线和半导体存储器件进行预充电的方法

    公开(公告)号:US07872932B2

    公开(公告)日:2011-01-18

    申请号:US12187269

    申请日:2008-08-06

    IPC分类号: G11C7/00

    CPC分类号: G11C7/1048 G11C7/12 G11C8/18

    摘要: A method and semiconductor memory device for precharging a local input/output line. The semiconductor memory device, which may have an open bit line structure, transmits data through local input/output lines that are coupled to bit lines of first to n-th memory cell array blocks (n being a natural number). The semiconductor memory device may include a precharge unit configured to generate a plurality of precharge signals and a controller configured to control precharging of the at least one local input/output line responsive to block information corresponding to activation of at least one of the memory cell array blocks and responsive to at least one of the precharge signals.

    摘要翻译: 一种用于对本地输入/输出线进行预充电的方法和半导体存储器件。 可以具有开放位线结构的半导体存储器件通过耦合到第一至第n存储器单元阵列块(n为自然数)的位线的本地输入/输出线传输数据。 半导体存储器件可以包括:预充电单元,其被配置为产生多个预充电信号;以及控制器,被配置为响应于对应于至少一个存储单元阵列的激活来控制至少一个本地输入/输出线的预充电 并且响应于至少一个预充电信号。

    Semiconductor Memory Device
    2.
    发明申请
    Semiconductor Memory Device 失效
    半导体存储器件

    公开(公告)号:US20100177582A1

    公开(公告)日:2010-07-15

    申请号:US12686176

    申请日:2010-01-12

    摘要: A semiconductor memory device is provided. A memory cell array has a plurality of memory cells connected between a plurality of word lines and a plurality of bit-line pairs. A sense amplifier unit has a plurality of sense amplifiers connected with the bit-line pairs respectively and amplifies data of the bit-line pairs to a sensing voltage level. A command decoder decodes a command applied from the outside and outputs the decoded command. A plurality of input/output (I/O) gates electrically connects the bit-line pairs with corresponding I/O line pairs in response to a voltage level applied through a plurality of corresponding column selection lines. A column decoder decodes a column address and drives at least one of the column selection lines to a plurality of different voltages levels.

    摘要翻译: 提供半导体存储器件。 存储单元阵列具有连接在多个字线和多个位线对之间的多个存储单元。 读出放大器单元具有分别与位线对连接的多个读出放大器,并将位线对的数据放大到感测电压电平。 命令解码器解码从外部施加的命令并输出解码的命令。 响应于通过多个相应的列选择线施加的电压电平,多个输入/输出(I / O)门将位线对与对应的I / O线对电连接。 列解码器解码列地址并将列选择线中的至少一个驱动到多个不同的电压电平。

    Sense amplifier, semiconductor memory device including the same, and data sensing method
    3.
    发明授权
    Sense amplifier, semiconductor memory device including the same, and data sensing method 有权
    感测放大器,包括其的半导体存储器件和数据感测方法

    公开(公告)号:US07652942B2

    公开(公告)日:2010-01-26

    申请号:US11757099

    申请日:2007-06-01

    IPC分类号: G11C7/00

    摘要: A sense amplifier includes a reference signal providing unit and an internal sense amplification unit. The reference signal providing unit provides a reference bit line signal in response to a reference control signal. The internal sense amplification unit receives the reference bit line signal and data signals that correspond to the data. The received signals are provided through bit lines connected to the memory cell array. The internal sense amplification unit senses the received reference bit line signal and the data signals and amplifies the sensed signals. The sense amplifier senses data stored in memory cells connected to dummy bit lines of the outmost memory cell array of a semiconductor memory device such that the memory cells that are not used can be used. Accordingly, the design area and cost of the semiconductor memory device can be reduced.

    摘要翻译: 读出放大器包括参考信号提供单元和内部检测放大单元。 参考信号提供单元响应于参考控制信号提供参考位线信号。 内部检测放大单元接收对应于数据的参考位线信号和数据信号。 接收的信号通过连接到存储单元阵列的位线来提供。 内部感测放大单元感测接收的参考位线信号和数据信号并放大所感测的信号。 感测放大器感测存储在连接到半导体存储器件的最外存储单元阵列的虚拟位线的存储器单元中的数据,使得可以使用未使用的存储器单元。 因此,可以减少半导体存储器件的设计面积和成本。

    SENSE AMPLIFIER, SEMICONDUCTOR MEMORY DEVICE INCLUDING THE SAME, AND DATA SENSING METHOD
    4.
    发明申请
    SENSE AMPLIFIER, SEMICONDUCTOR MEMORY DEVICE INCLUDING THE SAME, AND DATA SENSING METHOD 有权
    感测放大器,包括其的半导体存储器件和数据传感方法

    公开(公告)号:US20080056039A1

    公开(公告)日:2008-03-06

    申请号:US11757099

    申请日:2007-06-01

    IPC分类号: G11C7/06

    摘要: A sense amplifier includes a reference signal providing unit and an internal sense amplification unit. The reference signal providing unit provides a reference bit line signal in response to a reference control signal. The internal sense amplification unit receives the reference bit line signal and data signals that correspond to the data. The received signals are provided through bit lines connected to the memory cell array. The internal sense amplification unit senses the received reference bit line signal and the data signals and amplifies the sensed signals. The sense amplifier senses data stored in memory cells connected to dummy bit lines of the outmost memory cell array of a semiconductor memory device such that the memory cells that are not used can be used. Accordingly, the design area and cost of the semiconductor memory device can be reduced.

    摘要翻译: 读出放大器包括参考信号提供单元和内部检测放大单元。 参考信号提供单元响应于参考控制信号提供参考位线信号。 内部检测放大单元接收对应于数据的参考位线信号和数据信号。 接收的信号通过连接到存储单元阵列的位线来提供。 内部感测放大单元感测接收的参考位线信号和数据信号并放大所感测的信号。 感测放大器感测存储在连接到半导体存储器件的最外存储单元阵列的虚拟位线的存储器单元中的数据,使得可以使用未使用的存储器单元。 因此,可以减少半导体存储器件的设计面积和成本。

    Circuit and method for detecting frequency of clock signal and latency signal generation circuit of semiconductor memory device with the circuit
    5.
    发明授权
    Circuit and method for detecting frequency of clock signal and latency signal generation circuit of semiconductor memory device with the circuit 失效
    用于检测具有电路的半导体存储器件的时钟信号和等待时间信号产生电路的频率的电路和方法

    公开(公告)号:US07259595B2

    公开(公告)日:2007-08-21

    申请号:US11120804

    申请日:2005-05-02

    申请人: Myeong-O Kim

    发明人: Myeong-O Kim

    IPC分类号: G01R23/02

    摘要: A frequency detection circuit and method of detecting the frequency of a clock signal, and a latency signal generation circuit for a semiconductor memory device that includes the frequency detection circuit. The frequency detection circuit includes a frequency detector and an output controller, which determines whether or not the frequency of the clock signal is higher than a predetermined value. Embodiments of the invention have an increased accuracy, increased efficiency, and a reduced current consumption over conventional art.

    摘要翻译: 检测时钟信号的频率的频率检测电路和方法,以及包括频率检测电路的半导体存储器件的等待时间信号产生电路。 频率检测电路包括频率检测器和输出控制器,其确定时钟信号的频率是否高于预定值。 与常规技术相比,本发明的实施例具有增加的精度,增加的效率和降低的电流消耗。

    Semiconductor memory device and method for controlling the same
    6.
    发明申请
    Semiconductor memory device and method for controlling the same 有权
    半导体存储器件及其控制方法

    公开(公告)号:US20060146619A1

    公开(公告)日:2006-07-06

    申请号:US11327247

    申请日:2006-01-05

    摘要: A control unit for a semiconductor memory device, a semiconductor memory device and a method for controlling the same. The control unit of a semiconductor memory device includes control signal circuits, each control signal circuit to receive a master signal and to generate at least one of a plurality of control signals in response to the master signal, each of the plurality of core control signals to be generated after a delay specific to the core control signals after a transition of the master signal, the plurality of control signals to control the semiconductor memory device.

    摘要翻译: 一种用于半导体存储器件的控制单元,半导体存储器件及其控制方法。 半导体存储器件的控制单元包括控制信号电路,每个控制信号电路接收主信号并响应于主信号产生多个控制信号中的至少一个,多个核心控制信号中的每一个至 在主信号转换之后的核心控制信号的特定延迟之后产生多个控制信号以控制半导体存储器件。

    Semiconductor memory device and data read method of the same
    7.
    发明申请
    Semiconductor memory device and data read method of the same 失效
    半导体存储器件和数据读取方法相同

    公开(公告)号:US20050122830A1

    公开(公告)日:2005-06-09

    申请号:US10993577

    申请日:2004-11-19

    IPC分类号: G11C11/40 G11C7/10 G11C8/00

    摘要: The present invention discloses a semiconductor memory device that includes first and second memory banks. A first control signal generating circuit generates a first control signal responsive to an external clock. A first data output circuit transmits a first output data responsive to the first control signal. An internal clock signal generating circuit outputs first and second buffered clock signals responsive to the external clock. A second control signal generating circuit generates a second control signal responsive to the first buffered clock signal and the first control signal. A second data output circuit transmits a second output data responsive to the second control signal. A third data output circuit transmits a third output data responsive to the first and second buffered clock signals. The present invention prevents data read errors resulting from variations in power supply voltage and temperature.

    摘要翻译: 本发明公开了一种包括第一和第二存储体的半导体存储器件。 第一控制信号产生电路响应外部时钟产生第一控制信号。 第一数据输出电路响应于第一控制信号发送第一输出数据。 内部时钟信号发生电路响应于外部时钟输出第一和第二缓冲时钟信号。 第二控制信号发生电路响应于第一缓冲时钟信号和第一控制信号产生第二控制信号。 第二数据输出电路响应于第二控制信号发送第二输出数据。 第三数据输出电路响应于第一和第二缓冲时钟信号发送第三输出数据。 本发明防止由电源电压和温度变化引起的数据读取错误。

    Semiconductor memory device
    9.
    发明授权
    Semiconductor memory device 失效
    半导体存储器件

    公开(公告)号:US08107308B2

    公开(公告)日:2012-01-31

    申请号:US12686176

    申请日:2010-01-12

    IPC分类号: G11C7/06 G11C8/10

    摘要: A semiconductor memory device is provided. A memory cell array has a plurality of memory cells connected between a plurality of word lines and a plurality of bit-line pairs. A sense amplifier unit has a plurality of sense amplifiers connected with the bit-line pairs respectively and amplifies data of the bit-line pairs to a sensing voltage level. A command decoder decodes a command applied from the outside and outputs the decoded command. A plurality of input/output (I/O) gates electrically connects the bit-line pairs with corresponding I/O line pairs in response to a voltage level applied through a plurality of corresponding column selection lines. A column decoder decodes a column address and drives at least one of the column selection lines to a plurality of different voltages levels.

    摘要翻译: 提供半导体存储器件。 存储单元阵列具有连接在多个字线和多个位线对之间的多个存储单元。 读出放大器单元具有分别与位线对连接的多个读出放大器,并将位线对的数据放大到感测电压电平。 命令解码器解码从外部施加的命令并输出解码的命令。 响应于通过多个相应的列选择线施加的电压电平,多个输入/输出(I / O)门将位线对与对应的I / O线对电连接。 列解码器解码列地址并将列选择线中的至少一个驱动到多个不同的电压电平。

    Semiconductor memory device and data read method of the same
    10.
    发明授权
    Semiconductor memory device and data read method of the same 失效
    半导体存储器件和数据读取方法相同

    公开(公告)号:US07106653B2

    公开(公告)日:2006-09-12

    申请号:US10993577

    申请日:2004-11-19

    IPC分类号: G11C8/00

    摘要: The present invention discloses a semiconductor memory device that includes first and second memory banks. A first control signal generating circuit generates a first control signal responsive to an external clock. A first data output circuit transmits a first output data responsive to the first control signal. An internal clock signal generating circuit outputs first and second buffered clock signals responsive to the external clock. A second control signal generating circuit generates a second control signal responsive to the first buffered clock signal and the first control signal. A second data output circuit transmits a second output data responsive to the second control signal. A third data output circuit transmits a third output data responsive to the first and second buffered clock signals. The present invention prevents data read errors resulting from variations in power supply voltage and temperature.

    摘要翻译: 本发明公开了一种包括第一和第二存储体的半导体存储器件。 第一控制信号产生电路响应外部时钟产生第一控制信号。 第一数据输出电路响应于第一控制信号发送第一输出数据。 内部时钟信号发生电路响应于外部时钟输出第一和第二缓冲时钟信号。 第二控制信号发生电路响应于第一缓冲时钟信号和第一控制信号产生第二控制信号。 第二数据输出电路响应于第二控制信号发送第二输出数据。 第三数据输出电路响应于第一和第二缓冲时钟信号发送第三输出数据。 本发明防止由电源电压和温度变化引起的数据读取错误。