Abstract:
A leak testing device for an iodine filter according to the present embodiment includes an iodine adsorption unit including an iodine filter provided in a chamber provided in a duct, to which flue gas containing radioactive iodine is fed, and including an iodine adsorbing material that adsorbs radioactive iodine contained in the flue gas, a fluorine-containing-reagent feed unit that feeds a fluorine-containing reagent that does not contain chlorine into the duct, and a first fluorine-containing-reagent-concentration measurement unit and a second fluorine-containing-reagent-concentration measurement unit that measures a concentration of the fluorine-containing reagent on an upstream side and a downstream side of the iodine filter.
Abstract:
A leak testing device for an iodine filter according to the present embodiment includes an iodine adsorption unit including an iodine filter provided in a chamber provided in a duct, to which flue gas containing radioactive iodine is fed, and including an iodine adsorbing material that adsorbs radioactive iodine contained in the flue gas, a fluorine-containing-reagent feed unit that feeds a fluorine-containing reagent that does not contain chlorine into the duct, and a first fluorine-containing-reagent-concentration measurement unit and a second fluorine-containing-reagent-concentration measurement unit that measures a concentration of the fluorine-containing reagent on an upstream side and a downstream side of the iodine filter.
Abstract:
A radioactive iodine removal apparatus applying a radioactive iodine adsorbent according to an embodiment of the present invention includes an iodine filter that is provided in a chamber of a duct to which flue gas containing radioactive iodine is fed, and includes a radioactive iodine adsorbent that adsorbs radioactive iodine contained in the flue gas. The radioactive iodine adsorbent includes a carrier constituting a matrix and an impregnated substance with which the carrier is impregnated. The impregnated substance contains at least TEDA, and an impregnated amount of the TEDA is from 3.0% by mass to less than 10.0% by mass.
Abstract:
An electron beam system (such as a scanning electron microscope or an electron probe microanalyzer) capable of displaying backscattered electron (BSE) images at the same brightness and same contrast at all times if the atomic number differences are the same when illumination conditions including accelerating voltage and emission current are varied or when the specimens are imaged with different instruments.
Abstract:
A radioactive iodine removal apparatus applying a radioactive iodine adsorbent according to an embodiment of the present invention includes an iodine filter that is provided in a chamber of a duct to which flue gas containing radioactive iodine is fed, and includes a radioactive iodine adsorbent that adsorbs radioactive iodine contained in the flue gas. The radioactive iodine adsorbent includes a carrier constituting a matrix and an impregnated substance with which the carrier is impregnated. The impregnated substance contains at least TEDA, and an impregnated amount of the TEDA is from 3.0% by mass to less than 10.0% by mass.
Abstract:
An electron beam system (such as a scanning electron microscope or an electron probe microanalyzer) capable of displaying backscattered electron (BSE) images at the same brightness and same contrast at all times if the atomic number differences are the same when illumination conditions including accelerating voltage and emission current are varied or when the specimens are imaged with different instruments.