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公开(公告)号:US20080002874A1
公开(公告)日:2008-01-03
申请号:US11478281
申请日:2006-06-29
申请人: Peter Fiekowsky
发明人: Peter Fiekowsky
IPC分类号: G06K9/00
CPC分类号: G06T7/0004 , G03F1/84
摘要: Detecting defects in reference images used for optical inspections reduces false defect detections in the test image. Reference images are presumed perfect, but in practice contain defects. Defects in the reference image are detected by measuring the symmetry or randomness of pixels in the area of the suspected defect in both images. Measurements of the pixel intensity ranges, edge smoothness, and total edge slope in the two images are compared to determine if a suspect defect is actually in the reference image.
摘要翻译: 检测用于光学检查的参考图像中的缺陷可减少测试图像中的假缺陷检测。 参考图像被认为是完美的,但在实践中包含缺陷。 通过测量两个图像中可疑缺陷区域中的像素的对称性或随机性来检测参考图像中的缺陷。 比较两个图像中的像素强度范围,边缘平滑度和总边缘斜率的测量,以确定可疑缺陷是否实际上在参考图像中。
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公开(公告)号:US06252236B1
公开(公告)日:2001-06-26
申请号:US09348216
申请日:1999-07-06
申请人: Mark Trulson , David Stern , Peter Fiekowsky , Richard Rava , Ian Walton , Stephen P. A. Fodor
发明人: Mark Trulson , David Stern , Peter Fiekowsky , Richard Rava , Ian Walton , Stephen P. A. Fodor
IPC分类号: G01N2164
CPC分类号: G01N21/6452 , B01J2219/00605 , B01J2219/0061 , B01J2219/00612 , B01J2219/00637 , B01J2219/00659 , B01J2219/00702 , G01N21/6428 , G01N21/6456 , G01N2021/6417 , G01N2021/6423 , G01N2021/6441
摘要: A method and apparatus for imaging a sample are provided. An electromagnetic radiation source generates excitation radiation which is sized by excitation optics to a line. The line is directed at a sample resting on a support and excites a plurality of regions on the sample. Collection optics collect response radiation reflected from the sample I and image the reflected radiation. A detector senses the reflected radiation and is positioned to permit discrimination between radiation reflected from a certain focal plane in the sample and certain other planes within the sample.
摘要翻译: 提供了一种用于成像样品的方法和装置。 电磁辐射源产生激发辐射,该激发辐射通过激发光学器件被定尺寸至线路。 该线指向搁置在支撑体上的样品并激发样品上的多个区域。 采集光学器件收集从样品I反射的反射辐射并对反射的辐射进行成像。 检测器感测反射的辐射,并且被定位成允许区分从样品中的某个焦平面反射的辐射和样品内的某些其它平面。
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3.
公开(公告)号:US6141096A
公开(公告)日:2000-10-31
申请号:US823824
申请日:1997-03-25
申请人: David Stern , Peter Fiekowsky
发明人: David Stern , Peter Fiekowsky
IPC分类号: G01N21/64
CPC分类号: G01N21/6458 , G01N21/6428 , B01J2219/00605 , B01J2219/00612 , B01J2219/00659 , B01J2219/00702 , G01N2021/174
摘要: Fluorescently marked targets bind to a substrate 230 synthesized with polymer sequences at known locations. The targets are detected by exposing selected regions of the substrate 230 to light from a light source 100 and detecting the photons from the light fluoresced therefrom, and repeating the steps of exposure and detection until the substrate 230 is completely examined. The resulting data can be used to determine binding affinity of the targets to specific polymer sequences.
摘要翻译: 荧光标记的靶结合到在已知位置处与聚合物序列合成的底物230。 通过将衬底230的选定区域暴露于来自光源100的光并从其发荧光的光检测光子并且重复曝光和检测的步骤直到基片230被完全检查来检测靶。 所得数据可用于确定靶向特定聚合物序列的结合亲和力。
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公开(公告)号:US06025601A
公开(公告)日:2000-02-15
申请号:US871269
申请日:1997-06-09
申请人: Mark Trulson , David Stern , Peter Fiekowsky , Richard Rava , Ian Walton , Stephen P. A. Fodor
发明人: Mark Trulson , David Stern , Peter Fiekowsky , Richard Rava , Ian Walton , Stephen P. A. Fodor
IPC分类号: G01N21/64
CPC分类号: G01N21/6452 , G01N21/6428 , G01N21/6456 , B01J2219/00605 , B01J2219/0061 , B01J2219/00612 , B01J2219/00637 , B01J2219/00659 , B01J2219/00702 , G01N2021/6417 , G01N2021/6423 , G01N2021/6441
摘要: Labeled targets on a support synthesized with polymer sequences at known locations according to the methods disclosed in U.S. Pat. No. 5,143,854 and PCT WO 92/10092 or others, can be detected by exposing selected regions of sample 1500 to radiation from a source 1100 and detecting the emission therefrom, and repeating the steps of exposition and detection until the sample is completely examined.
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5.
公开(公告)号:US5631734A
公开(公告)日:1997-05-20
申请号:US195889
申请日:1994-02-10
申请人: David Stern , Peter Fiekowsky
发明人: David Stern , Peter Fiekowsky
CPC分类号: G01N21/6458 , G01N21/6428 , B01J2219/00605 , B01J2219/00612 , B01J2219/00659 , B01J2219/00702 , G01N2021/174
摘要: Fluorescently marked targets bind to a substrate 230 synthesized with polymer sequences at known locations. The targets are detected by exposing selected regions of the substrate 230 to light from a light source 100 and detecting the photons from the light fluoresced therefrom, and repeating the steps of exposure and detection until the substrate 230 is completely examined. The resulting data can be used to determine binding affinity of the targets to specific polymer sequences.
摘要翻译: 荧光标记的靶结合到在已知位置处与聚合物序列合成的底物230。 通过将衬底230的选定区域暴露于来自光源100的光并从其发荧光的光检测光子并且重复曝光和检测的步骤直到基片230被完全检查来检测靶。 所得数据可用于确定靶向特定聚合物序列的结合亲和力。
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公开(公告)号:US20050037367A9
公开(公告)日:2005-02-17
申请号:US10648819
申请日:2003-08-25
申请人: Peter Fiekowsky , Dan Bartell
发明人: Peter Fiekowsky , Dan Bartell
IPC分类号: C12N15/09 , C12Q1/68 , G01N27/327 , G01N37/00 , G06F19/20 , G06T1/00 , G06T7/00 , G01N33/48 , G01N33/50 , G06F19/00 , G06K9/00
CPC分类号: G06T7/0012 , G06F19/20 , G06K9/3216 , G06T3/60 , G06T5/20 , G06T7/70 , G06T2207/20068 , G06T2207/30072
摘要: Systems and methods for aligning scanned images are provided. A pattern is included in the scanned image so that when the image is convolved with a filter, a recognizable pattern is generated in the convolved image. The scanned image may then be aligned according to the position of the recognizable pattern in the convolved image. The filter may also act to remove the portions of the scanned image that do not correspond to the pattern in the scanned image.
摘要翻译: 提供了校准扫描图像的系统和方法。 在扫描图像中包含图案,使得当图像与滤波器卷积时,在卷积图像中生成可识别图案。 然后可以根据卷积图像中的可识别图案的位置来对扫描图像进行对准。 滤波器还可以起到去除扫描图像中与扫描图像中的图案不对应的部分的作用。
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7.
公开(公告)号:US06741344B1
公开(公告)日:2004-05-25
申请号:US09699852
申请日:2000-10-30
申请人: David Stern , Peter Fiekowsky
发明人: David Stern , Peter Fiekowsky
IPC分类号: G01N2164
CPC分类号: G01N21/6458 , B01J2219/00605 , B01J2219/00612 , B01J2219/00626 , B01J2219/00659 , B01J2219/00702 , G01N21/05 , G01N21/6428 , G01N21/645 , G01N21/6452 , G01N21/6456 , G01N2021/0346
摘要: Fluorescently marked targets bind to a substrate 230 synthesized with polymer sequences at known locations. The targets are detected by exposing selected regions of the substrate 230 to light from a light source 100 and detecting the photons from the light fluoresced therefrom, and repeating the steps of exposure and detection until the substrate 230 is completely examined. The resulting data can be used to determine binding affinity of the targets to specific polymer sequences.
摘要翻译: 荧光标记的靶结合到在已知位置处与聚合物序列合成的底物230。 通过将衬底230的选定区域暴露于来自光源100的光并从其发荧光的光检测光子并且重复曝光和检测的步骤直到基片230被完全检查来检测靶。 所得数据可用于确定靶向特定聚合物序列的结合亲和力。
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公开(公告)号:US6090555A
公开(公告)日:2000-07-18
申请号:US996737
申请日:1997-12-23
申请人: Peter Fiekowsky , Dan M. Bartell
发明人: Peter Fiekowsky , Dan M. Bartell
IPC分类号: C12N15/09 , C12Q1/68 , G01N27/327 , G01N37/00 , G06F19/20 , G06T1/00 , G06T7/00 , G06K9/32 , G06K9/60
CPC分类号: G06T7/0012 , G06K9/3216 , G06T3/60 , G06T5/20 , G06T7/004 , G06F19/20 , G06T2207/20068 , G06T2207/30072
摘要: Systems and methods for aligning scanned images are provided. A pattern is included in the scanned image so that when the image is convolved with a filter, a recognizable pattern is generated in the convolved image. The scanned image may then be aligned according to the position of the recognizable pattern in the convolved image. The filter may also act to remove the portions of the scanned image that do not correspond to the pattern in the scanned image.
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公开(公告)号:US5834758A
公开(公告)日:1998-11-10
申请号:US708335
申请日:1996-09-04
申请人: Mark Trulson , David Stern , Peter Fiekowsky , Richard Rava , Ian Walton , Stephen P. A. Fodor
发明人: Mark Trulson , David Stern , Peter Fiekowsky , Richard Rava , Ian Walton , Stephen P. A. Fodor
CPC分类号: G01N21/6452 , G01N21/6428 , G01N21/6456 , B01J2219/00605 , B01J2219/0061 , B01J2219/00612 , B01J2219/00637 , B01J2219/00659 , B01J2219/00702 , G01N2021/6417 , G01N2021/6423 , G01N2021/6441
摘要: Labeled targets on a support synthesized with polymer sequences at known locations according to the methods disclosed in U.S. Pat. No. 5,143,854 and PCT WO 92/10092 or others, can be detected by exposing selected regions of sample 1500 to radiation from a source 1100 and detecting the emission therefrom, and repeating the steps of exposition and detection until the sample is completely examined.
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公开(公告)号:US20060258002A1
公开(公告)日:2006-11-16
申请号:US11366515
申请日:2006-03-03
申请人: Peter Fiekowsky , Dan Bartell , David Stern
发明人: Peter Fiekowsky , Dan Bartell , David Stern
IPC分类号: G06F19/00
CPC分类号: G06T7/0012 , G06K9/3216 , G06T3/60 , G06T5/20 , G06T7/70 , G06T2207/20068 , G06T2207/30072 , G16B25/00
摘要: Systems and methods for aligning scanned images are provided. A pattern is included in the scanned image so that when the image is convolved with a filter, a recognizable pattern is generated in the convolved image. The scanned image may then be aligned according to the position of the recognizable pattern in the convolved image. The filter may also act to remove the portions of the scanned image that do not correspond to the pattern in the scanned image.
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