公开(公告)号：US08610171B2

公开(公告)日：2013-12-17

申请号：US13139238

申请日：2009-12-08

申请人： Philippe Bois ,  Olivier Parillaud ,  Xavier Marcadet ,  Michel Papuchon

发明人： Philippe Bois ,  Olivier Parillaud ,  Xavier Marcadet ,  Michel Papuchon

IPC分类号： H01L31/072 ,  H01L31/109 ,  H01L31/0328 ,  H01L31/0336

CPC分类号： H01L31/105 ,  H01L31/03046 ,  Y02E10/544 ,  Y02P70/521

摘要： A semiconductor-based SWIR infrared detector sensitive to wavelengths shorter than about 2.5 microns comprises a stack of semiconductor layers based on III-V materials forming a PIN photodiode. The stack includes a naked electrical contact, called a lower electrical contact, serving as an optical window; and a detection layer sensitive to said wavelengths. The lower contact comprises at least one layer of indirect-bandgap III-V material(s) doped n-type, pseudomorphic or lattice matched with a substrate intended to serve as a temporary substrate possibly being made of a III-V material such as InP or GaAs or of silicon or germanium.

摘要翻译： 对于短于约2.5微米的波长敏感的基于半导体的SWIR红外检测器包括基于形成PIN光电二极管的III-V材料的堆叠的半导体层。 堆叠包括用作光学窗口的称为下部电触点的裸电触点; 以及对所述波长敏感的检测层。 下接触包括至少一层掺杂n型，假晶格或晶格匹配的间接带隙III-V材料，该衬底旨在用作可能由III-V材料制成的临时衬底，例如InP 或GaAs或硅或锗。

公开(公告)号：US20100108861A1

公开(公告)日：2010-05-06

申请号：US12605188

申请日：2009-10-23

申请人： Alexandru Nedelcu ,  Philippe Bois ,  Eric Costard

发明人： Alexandru Nedelcu ,  Philippe Bois ,  Eric Costard

IPC分类号： H01L31/0352 ,  H01L27/146

CPC分类号： H01L27/14625 ,  B82Y20/00 ,  G01J3/0259 ,  G01J3/1804 ,  G01J3/36 ,  G01J2003/1861 ,  H01L27/14621 ,  H01L27/14649 ,  H01L31/02327 ,  H01L31/035236 ,  H01L31/101

摘要： The invention relates to a multispectral imaging device comprising a multiple-quantum-well structure operating on inter-sub-band transitions by absorbing radiation at a wavelength λ lying within a set of wavelengths to which said structure is sensitive, said structure comprising a matrix of individual detection pixels, characterized in that the matrix is organized in subsets (Eij) of four individual detection pixels, a first individual detection pixel (Pλ1) comprising a first diffraction grating (Rλ1) sensitive to a first subset of wavelengths, a second individual detection pixel (Pλ2) comprising a second diffraction grating (Rλ2) sensitive to a second subset of wavelengths, a third individual detection pixel (Pλ3) comprising a third diffraction grating (Rλ3) sensitive to a third subset of wavelengths and a fourth individual detection pixel (PΔλ) not comprising a wavelength-selective diffraction grating, the first, second and third subsets of wavelengths belonging to the set of wavelengths to which said structure is sensitive.

摘要翻译： 本发明涉及一种多光谱成像装置，其包括通过吸收位于所述结构敏感的一组波长内的波长λ的辐射而在子带间跃迁上操作的多量子阱结构，所述结构包括： 单个检测像素，其特征在于，矩阵被组织在四个单独检测像素的子集（Eij）中，第一个体检测像素（Pλ1）包括对第一波长子集敏感的第一衍射光栅（Rλ1），第二个体检测 包括对第二波长子集敏感的第二衍射光栅（Rλ2）的像素（Pλ2），包括对第三子波长敏感的第三衍射光栅（Rλ3）的第三个别检测像素（Pλ3）和第四单独检测像素 P＆Dgr;λ）不包括波长选择性衍射光栅，第一，第二和第三波长子集属于se 所述结构敏感的波长t。

公开(公告)号：US07622703B2

公开(公告)日：2009-11-24

申请号：US10582796

申请日：2004-12-07

申请人： Alfredo De Rossi ,  Mathieu Carras ,  Philippe Bois

发明人： Alfredo De Rossi ,  Mathieu Carras ,  Philippe Bois

IPC分类号： H01L29/06

CPC分类号： H01L31/0352 ,  H01L31/0236 ,  Y02E10/50

摘要： The field of the invention is that of photodetectors (10), and more precisely so-called quantum well photodetectors operating in the medium infrared, known by the acronym QWIP standing for Quantum Well Infrared Photodetector.It is an object of the invention to increase the detectivity of the detectors by significantly reducing the surface area of the detection zone while conserving the incident flux. This result is obtained by arranging a structure (4) or grating on the active zone (31) of the photodetector (10), which couples the incident wave and confines it on the active zone (31).The major features of this structure (4) or this grating are that it comprises patterns or grooves having a first spatial frequency and a second spatial frequency, and also comprising a central defect.

摘要翻译： 本发明的领域是光电检测器（10），更准确地说是所谓的量子阱光电探测器，其操作在中红外线，由称为QWIP的量子阱红外光检测器所称。 本发明的一个目的是通过显着地减小检测区的表面面积同时保护入射通量来增加检测器的检测能力。 该结果通过在光电检测器（10）的有源区（31）上布置结构（4）或光栅来获得，该结构（4）或光栅耦合入射波并将其限制在有源区（31）上。 该结构（4）或该光栅的主要特征在于其包括具有第一空间频率和第二空间频率的图案或凹槽，并且还包括中心缺陷。

公开(公告)号：US5719670A

公开(公告)日：1998-02-17

申请号：US555323

申请日：1995-11-08

申请人： Jean-Yves Duboz ,  Philippe Bois

发明人： Jean-Yves Duboz ,  Philippe Bois

IPC分类号： G01S3/784 ,  G01B11/26

CPC分类号： G01S3/784

摘要： Disclosed is an integrated direction finder that can be used to determine the direction of a light beam and, in particular, a laser beam. This direction finder has a substrate transparent to the light beam and means on the rear face to channel a part of the light flux received on this face to the front face which has several photodetector elements. Application to optical measurements.

摘要翻译： 公开了一种可用于确定光束的方向，特别是激光束的集成测向器。 该测向器具有对光束透明的基板和背面上的装置，以将接收在该表面上的光通量的一部分引导到具有若干光电检测器元件的正面。 应用于光学测量。

公开(公告)号：US08378301B2

公开(公告)日：2013-02-19

申请号：US12605188

申请日：2009-10-23

申请人： Alexandru Nedelcu ,  Philippe Bois ,  Eric Costard

发明人： Alexandru Nedelcu ,  Philippe Bois ,  Eric Costard

IPC分类号： H01L29/06 ,  H01L29/732

CPC分类号： H01L27/14625 ,  B82Y20/00 ,  G01J3/0259 ,  G01J3/1804 ,  G01J3/36 ,  G01J2003/1861 ,  H01L27/14621 ,  H01L27/14649 ,  H01L31/02327 ,  H01L31/035236 ,  H01L31/101

摘要： The invention relates to a multispectral imaging device comprising a multiple-quantum-well structure operating on inter-sub-band transitions by absorbing radiation at a wavelength λ lying within a set of wavelengths to which said structure is sensitive, said structure comprising a matrix of individual detection pixels, characterized in that the matrix is organized in subsets (Eij) of four individual detection pixels, a first individual detection pixel (Pλ1) comprising a first diffraction grating (Rλ1) sensitive to a first subset of wavelengths, a second individual detection pixel (Pλ2) comprising a second diffraction grating (Rλ2) sensitive to a second subset of wavelengths, a third individual detection pixel (Pλ3) comprising a third diffraction grating (Rλ3) sensitive to a third subset of wavelengths and a fourth individual detection pixel (PΔλ) not comprising a wavelength-selective diffraction grating, the first, second and third subsets of wavelengths belonging to the set of wavelengths to which said structure is sensitive.

摘要翻译： 本发明涉及一种多光谱成像装置，其包括通过吸收位于所述结构敏感的一组波长内的波长λ的辐射而在子带间跃迁上操作的多量子阱结构，所述结构包括： 单个检测像素，其特征在于，矩阵被组织在四个单独检测像素的子集（Eij）中，第一个体检测像素（Pλ1）包括对第一波长子集敏感的第一衍射光栅（Rλ1），第二个体检测 包括对第二波长子集敏感的第二衍射光栅（Rλ2）的像素（Pλ2），包括对第三子波长敏感的第三衍射光栅（Rλ3）的第三个别检测像素（Pλ3）和第四单独检测像素 P＆Dgr;λ）不包括波长选择性衍射光栅，第一，第二和第三波长子集属于se 所述结构敏感的波长t。

公开(公告)号：US07741594B2

公开(公告)日：2010-06-22

申请号：US10558187

申请日：2004-05-26

申请人： Philippe Bois ,  Eric Costard ,  Alfredo De Rossi ,  Alexandru Nedelcu

发明人： Philippe Bois ,  Eric Costard ,  Alfredo De Rossi ,  Alexandru Nedelcu

IPC分类号： H01L31/00

CPC分类号： B82Y20/00 ,  H01L31/02327 ,  H01L31/035236

摘要： The invention relates to a detector comprising a multiple quantum well structure operating on interband or intersubband transitions by absorption of radiation having a wavelength λ having a polarization comprising a component perpendicular to the plane of the multiple quantum well structure, and comprising optical coupling means for coupling said radiation, wherein the coupling means comprise a set of first diffractive lamellar features that are distributed along at least a first direction and a set of second diffractive lamellar features that are distributed along at least a second direction, said first and second directions being mutually perpendicular and lying in a plane parallel to the plane of the multiple quantum well structure.

摘要翻译： 本发明涉及一种检测器，其包括通过吸收具有波长λ的波长的辐射而在带间或子带间跃迁上工作的多量子阱结构，该波长包括垂直于多量子阱结构的平面的分量的偏振，并且包括用于耦合的光耦合装置 所述辐射，其中所述耦合装置包括沿着至少第一方向分布的一组第一衍射层状特征和沿着至少第二方向分布的一组第二衍射层状特征，所述第一和第二方向是相互垂直的 并且位于平行于多量子阱结构的平面的平面中。

公开(公告)号：US07687760B2

公开(公告)日：2010-03-30

申请号：US10558247

申请日：2004-05-26

申请人： Philippe Bois ,  Nadia Briere De L'Isle ,  Eric Costard ,  Alfredo De Rossi

发明人： Philippe Bois ,  Nadia Briere De L'Isle ,  Eric Costard ,  Alfredo De Rossi

IPC分类号： H01L31/00

CPC分类号： B82Y20/00 ,  H01L31/02327 ,  H01L31/035236

摘要： The invention relates to an optical coupling structure intended to couple electromagnetic radiation to the surface of a photodetector, wherein a coupling surface paved along mutually perpendicular first and second directions by a set of N series (M1i, M2i, . . . . Mni) of first features, second features, . . . nth features, the features being identical within any one series, the features being distributed along the first and second directions, the distance between the centers of two adjacent features or the inter-reticular distances between two adjacent features being variable. The subject of the invention is also a detector or a laser source comprising said coupling structure.

摘要翻译： 本发明涉及一种用于将电磁辐射耦合到光电检测器的表面的光耦合结构，其中通过一系列N系列（M1i，M2i，...，Mni），沿着相互垂直的第一和第二方向铺设的耦合表面 第一个功能，第二个功能，。 。 。 第n个特征，特征在任何一个系列中是相同的，特征沿着第一和第二方向分布，两个相邻特征的中心之间的距离或两个相邻特征之间的网间距离是可变的。 本发明的主题还是包括所述耦合结构的检测器或激光源。

公开(公告)号：US06534758B2

公开(公告)日：2003-03-18

申请号：US09900873

申请日：2001-07-10

申请人： Eric Costard ,  Philippe Bois ,  Marcel-Francis Audier

发明人： Eric Costard ,  Philippe Bois ,  Marcel-Francis Audier

IPC分类号： H01L2700

CPC分类号： H01L27/14652

摘要： The basic idea is as follows: operational simulations of subtractive focal planes, based on the French patent No. 2 756 666, have shown that the optimal subtraction rate should not be total in order to preserve the dynamic range of the system. In this case, the low-frequency fluctuations of the temperature of the focal plane of the bias voltages will be amplified and will give rise to a fluctuation of the mean gray level of the signal at output of the multiplexer. This variation can be corrected simply by: the making of several columns of subtractive pixels without diffraction grating, for which the integrated signal is directly the residual level of the thermal current; the integration of a comparator circuit at input of the electronic card to subtract the signal generated in the reference pixels from the signals integrated into the active pixels.

摘要翻译： 基本思想如下：基于法国专利号756666的减法焦平面的操作模拟表明，为了保持系统的动态范围，最佳减法率不应该是完全的。 在这种情况下，偏置电压的焦平面的温度的低频波动将被放大，并且将引起多路复用器的输出处的信号的平均灰度级的波动。 这种变化可以简单地通过以下方式来进行修正：制作几列不具有衍射光栅的减色像素，其中积分信号直接是热电流的剩余电平;比较器电路在电子卡的输入处的积分，以减去 信号在参考像素中从集成到有源像素的信号中产生。

公开(公告)号：US5228777A

公开(公告)日：1993-07-20

申请号：US788354

申请日：1991-11-06

申请人： Emmanuel Rosencher ,  Philippe Bois

发明人： Emmanuel Rosencher ,  Philippe Bois

IPC分类号： H01L31/0352

CPC分类号： G01J5/20 ,  B82Y20/00 ,  H01L31/0352 ,  H01L31/035236

摘要： An electronic bolometer comprises at least a quantum well between two barrier layers. It has an input side parallel to the quantum-well layer and receiving a beam at a quasi-normal incidence angle. Two electrodes disposed perpendicularly to the quantum-well layers allow to measure a change in the resistivity of said quantum well.

摘要翻译： 电子测辐射热谱计包括两个阻挡层之间的至少一个量子阱。 它具有与量子阱层平行的输入侧，并且以准正入射角接收光束。 垂直于量子阱层设置的两个电极允许测量所述量子阱的电阻率的变化。

公开(公告)号：US06627868B2

公开(公告)日：2003-09-30

申请号：US09852211

申请日：2001-05-10

申请人： Philippe Bois ,  Eric Costard ,  Marcel-Francis Audier ,  Eric Herniou

发明人： Philippe Bois ,  Eric Costard ,  Marcel-Francis Audier ,  Eric Herniou

IPC分类号： H01L2714

CPC分类号： B82Y20/00 ,  H01L27/14649

摘要： A bi-functional optical detector including a first active photoconduction detection element configured to detect light within first and second wavelength ranges, a first diffraction grating associated with the first detection element and configured to couple the light within the first wavelength range so that the first active photoconducting detection element detects the light in the first wavelength range, a second active photoconduction detection element configured to detect light within the first and second wavelength ranges, and a second diffraction grating associated with the second detection element and configured to couple the light within the second wavelength range so that the second active photoconduction detection element detects the light in the second wavelength range. Also included is a third active photoconduction detection element associated with the first detection element and configured to detect the light within the first and second wavelength ranges, a fourth active photoconduction detection element associated with the second detection element and configured to detect the light within the first and second wavelength ranges, and a common contact layer separating the first and second detection elements from the third and fourth detection elements.

摘要翻译： 一种双功能光学检测器，包括被配置为检测第一和第二波长范围内的光的第一有源光电导检测元件，与第一检测元件相关联并被配置为将光耦合在第一波长范围内的第一衍射光栅， 光电导检测元件检测第一波长范围内的光，配置成检测第一和第二波长范围内的光的第二有源光电导检测元件，以及与第二检测元件相关联的第二衍射光栅， 使得第二有源光电导检测元件检测第二波长范围内的光。 还包括与第一检测元件相关联并被配置为检测第一和第二波长范围内的光的第三有源光电导检测元件，与第二检测元件相关联并被配置为检测第一和第二波长范围内的光的第四有源光电导检测元件， 和第二波长范围，以及将第一和第二检测元件与第三和第四检测元件分开的公共接触层。