摘要:
An interrupt power supply control unit 5 monitors interrupts 11, 21, 31 issued from function blocks 1, 2, 3, and also, a power supply control instruction 41 issued from a CPU 4. When either an interrupt or an instruction is issued, the interrupt power supply control unit 5 performs a power supply control operation in accordance with a content of an interrupt power supply control table 50. In the power supply control operation, ON/OFF-control operations of power supply switches 12, 22, 32, 42 are carried out, and also, control signals 581 and 582 are outputted to power supply cutoff solving elements 81 and 82. When electric power of the power supply is supplied to a necessary function block in accordance with the power supply control operation, the interrupt power supply control unit 5 initiates the relevant function block in accordance with the content of the interrupt power supply control table 50.
摘要:
In a method for thermal stabilization of a probe card, a probe card is adjusted to a prescribed temperature in a short time by making a heat source directly contact the probe card and is accurately determined whether the probe card is thermally stable. A heat transfer substrate is mounted on a mounting table. The temperature of the heat transfer substrate is adjusted through the mounting table. The mounting table is raised, and a plurality of probes is brought into contact with the heat transfer substrate at a prescribed target load. The contact load between the heat transfer substrate and the probes, which changes according to the thermal changes in the probe card, is detected. The mounting table is controlled vertically through a vertical drive mechanism such that the contact load becomes the target load until the probe card is thermally stable.
摘要:
A probe apparatus includes a movable mounting table for supporting an object to be tested; a probe card disposed above the mounting table and having a plurality of probes to come into contact with electrodes of the object; a support body for supporting the probe card; and a control unit for controlling the mounting table. Electrical characteristics of the object are tested based on a signal from a tester by bringing the object and the probes into electrical contact with each other by overdriving the mounting table in a state where a test head is electrically connected with the probe card by a predetermined load. Further, one or more distance measuring devices for measuring a current overdriving amount of the mounting table are provided at one or more locations of the test head or the probe card.
摘要:
A probe apparatus includes a movable mounting table for supporting an object to be tested; a probe card disposed above the mounting table and having a plurality of probes to come into contact with electrodes of the object; a support body for supporting the probe card; and a control unit for controlling the mounting table. Electrical characteristics of the object are tested based on a signal from a tester by bringing the object and the probes into electrical contact with each other by overdriving the mounting table in a state where a test head is electrically connected with the probe card by a predetermined load. Further, one or more distance measuring devices for measuring a current overdriving amount of the mounting table are provided at one or more locations of the test head or the probe card.
摘要:
Provided herein is an AV processing apparatus applied with an effect apparatus of the invention stores a plurality of video control programs for implementing a plurality types of video effects corresponding to a plurality types of audio effects to provide the same impression as each audio effect can give. The AV processing apparatus implements a video control program corresponding to a selected audio effect from the plurality types of video effects, thereby a video effect which can provide the same impression as the audio effect can give is achieved.
摘要:
A probe apparatus includes a movable mounting table for supporting an object to be tested; a probe card disposed above the mounting table and having a plurality of probes to come into contact with electrodes of the object; a support body for supporting the probe card; and a control unit for controlling the mounting table. Electrical characteristics of the object are tested based on a signal from a tester by bringing the object and the probes into electrical contact with each other by overdriving the mounting table in a state where a test head is electrically connected with the probe card by a predetermined load. Further, one or more distance measuring devices for measuring a current overdriving amount of the mounting table are provided at one or more locations of the test head or the probe card.
摘要:
A cross fader unit, a mixer and a program which can achieve various music expressions with a simple manipulation are provided. A cross fader unit CF has an adjustment device by band 50 that adjusts a mixing rate of the audio signal in each frequency band by moving a plurality of the manipulation members each of which is a manipulation member by frequency band divided into a plurality of bands of the audio signal on a corresponding line 52.
摘要:
An interrupt power supply control unit 5 monitors interrupts 11, 21, 31 issued from function blocks 1, 2, 3, and also, a power supply control instruction 41 issued from a CPU 4. When either an interrupt or an instruction is issued, the interrupt power supply control unit 5 performs a power supply control operation in accordance with a content of an interrupt power supply control table 50. In the power supply control operation, ON/OFF-control operations of power supply switches 12, 22, 32, 42 are carried out, and also, control signals 581 and 582 are outputted to power supply cutoff solving elements 81 and 82. When electric power of the power supply is supplied to a necessary function block in accordance with the power supply control operation, the interrupt power supply control unit 5 initiates the relevant function block in accordance with the content of the interrupt power supply control table 50.
摘要:
In a method for thermal stabilization of a probe card, a probe card is adjusted to a prescribed temperature in a short time by making a heat source directly contact the probe card and is accurately determined whether the probe card is thermally stable. A heat transfer substrate is mounted on a mounting table. The temperature of the heat transfer substrate is adjusted through the mounting table. The mounting table is raised, and a plurality of probes is brought into contact with the heat transfer substrate at a prescribed target load. The contact load between the heat transfer substrate and the probes, which changes according to the thermal changes in the probe card, is detected. The mounting table is controlled vertically through a vertical drive mechanism such that the contact load becomes the target load until the probe card is thermally stable.
摘要:
Provided herein is an AV processing apparatus which displays through a GUI a fader F capable of adjusting an output level by moving an operation element along a predetermined track on a touch panel TP. When an arbitrary position on the track is designated as a point by an operation of a user, the operation element is moved at a constant speed over a predetermined required moving time from a moving start position which is a position of the operation element before the designation to the designated arbitrary position.