TEST CIRCUIT AND TEST METHOD
    1.
    发明申请
    TEST CIRCUIT AND TEST METHOD 失效
    测试电路和测试方法

    公开(公告)号:US20070252602A1

    公开(公告)日:2007-11-01

    申请号:US11677077

    申请日:2007-02-21

    IPC分类号: G01R23/02

    摘要: The test circuit according to the present invention includes: a plurality of light-receiving elements; a plurality of amplifiers, each of which converts, into a voltage, a photoelectric current supplied from one of the light-receiving elements; and an electric current supplying unit which supplies an electric current to each of the light-receiving elements and each of the amplifiers. In this test circuit, the electric current supplying unit selectively supplies an electric current to a first group of light-receiving elements and to a second group of light-receiving elements, the first group of light-receiving elements including light-receiving elements, out of the plurality of light-receiving elements, which are neither vertically nor horizontally adjacent to each other, and the second group of light-receiving elements including light-receiving elements, out of is the plurality of light-receiving elements, which are vertically or horizontally adjacent to the light-receiving elements of the first group of light-receiving elements.

    摘要翻译: 根据本发明的测试电路包括:多个光接收元件; 多个放大器,每个放大器将从一个光接收元件提供的光电流转换成电压; 以及电流供应单元,其向每个光接收元件和每个放大器提供电流。 在该测试电路中,电流供给单元选择性地将电流提供给第一组光接收元件和第二组光接收元件,第一组光接收元件包括光接收元件 多个光接收元件彼此不垂直或水平相邻,并且包括光接收元件的第二组光接收元件是多个光接收元件,多个光接收元件是垂直或 水平地邻近第一组光接收元件的光接收元件。

    Semiconductor device and method for manufacturing the same
    3.
    发明授权
    Semiconductor device and method for manufacturing the same 失效
    半导体装置及其制造方法

    公开(公告)号:US06700144B2

    公开(公告)日:2004-03-02

    申请号:US10155470

    申请日:2002-05-24

    IPC分类号: H01L31062

    CPC分类号: H01L21/8249 H01L27/0623

    摘要: A semiconductor device includes the following: a semiconductor substrate of a first conduction type; an intrinsic semiconductor layer of the first conduction type formed on the semiconductor substrate; a first semiconductor layer of a second conduction type formed on the intrinsic semiconductor layer; a first impurity layer of the first conduction type formed in the first semiconductor layer of the second conduction type; and a bipolar transistor and a MIS transistor formed in the first semiconductor layer of the second conduction type. The laminated structure of the semiconductor substrate, the intrinsic semiconductor layer, and the first semiconductor layer provides a diode for photoelectric conversion. A first insulator layer and a second insulator layer are formed respectively in at least a portion below the bipolar transistor and the MIS transistor. The transistors are isolated from the semiconductor substrate by the insulator layers, so that the characteristics of the transistors can be adjusted independently of the diode.

    摘要翻译: 半导体器件包括:第一导电类型的半导体衬底; 形成在半导体衬底上的第一导电类型的本征半导体层; 形成在本征半导体层上的第二导电类型的第一半导体层; 形成在第二导电类型的第一半导体层中的第一导电类型的第一杂质层; 以及形成在第二导电类型的第一半导体层中的双极晶体管和MIS晶体管。 半导体衬底,本征半导体层和第一半导体层的层叠结构提供用于光电转换的二极管。 分别在双极晶体管和MIS晶体管的至少一部分内形成第一绝缘体层和第二绝缘体层。 晶体管通过绝缘体层与半导体衬底隔离,从而可以独立于二极管来调整晶体管的特性。

    Test circuit and test method that includes supplying a current to a plurality of light-receiving elements
    4.
    发明授权
    Test circuit and test method that includes supplying a current to a plurality of light-receiving elements 失效
    包括向多个光接收元件提供电流的测试电路和测试方法

    公开(公告)号:US07545156B2

    公开(公告)日:2009-06-09

    申请号:US11677077

    申请日:2007-02-21

    摘要: The test circuit according to the present invention includes: a plurality of light-receiving elements; a plurality of amplifiers, each of which converts, into a voltage, a photoelectric current supplied from one of the light-receiving elements; and an electric current supplying unit which supplies an electric current to each of the light-receiving elements and each of the amplifiers. In this test circuit, the electric current supplying unit selectively supplies an electric current to a first group of light-receiving elements and to a second group of light-receiving elements, the first group of light-receiving elements including light-receiving elements, out of the plurality of light-receiving elements, which are neither vertically nor horizontally adjacent to each other, and the second group of light-receiving elements including light-receiving elements, out of the plurality of light-receiving elements, which are vertically or horizontally adjacent to the light-receiving elements of the first group of light-receiving elements.

    摘要翻译: 根据本发明的测试电路包括:多个光接收元件; 多个放大器,每个放大器将从一个光接收元件提供的光电流转换成电压; 以及电流供应单元,其向每个光接收元件和每个放大器提供电流。 在该测试电路中,电流供给单元选择性地将电流提供给第一组光接收元件和第二组光接收元件,第一组光接收元件包括光接收元件 多个光接收元件彼此不垂直或水平相邻,并且包括在垂直或水平方向上的多个光接收元件中的包含光接收元件的第二组光接收元件 邻近第一组光接收元件的光接收元件。

    Light-receiving amplifier circuit and optical pick-up device using the same
    5.
    发明授权
    Light-receiving amplifier circuit and optical pick-up device using the same 失效
    光接收放大器电路和使用其的光学拾取装置

    公开(公告)号:US07408141B2

    公开(公告)日:2008-08-05

    申请号:US11428422

    申请日:2006-07-03

    IPC分类号: H01J40/14

    摘要: The present invention provides a light-receiving amplifier circuit which includes a clipping circuit, can prevent an oscillation at the time of clipping operation, and can freely set clipping voltage. The light-receiving circuit of the present invention includes a photodiode, an operation amplifier, a conversion resistance connected between an output terminal and an inverting input terminal of the operation amplifier, and a clipping circuit which clips output voltage of the operation amplifier to a predetermined value. The clipping circuit includes a PNP transistor which detects a change in the output voltage of the operation amplifier and a voltage source connected to a base of the PNP transistor. Here, when the PNP transistor is turned ON along with an increase of an emitter potential of the NPN transistor which constitutes an output amplifier stage of the operation amplifier, voltage from the voltage source is applied to the base of the NPN transistor via the PNP transistor.

    摘要翻译: 本发明提供了一种包含限幅电路的光接收放大器电路,可以防止在削波操作时的振荡,并且可以自由地设定限幅电压。 本发明的光接收电路包括:光电二极管,运算放大器,连接在运算放大器的输出端和反相输入端之间的转换电阻;以及削波电路,其将运算放大器的输出电压除以预定的 值。 限幅电路包括PNP晶体管,其检测运算放大器的输出电压的变化和连接到PNP晶体管的基极的电压源。 这里,当构成运算放大器的输出放大器级的NPN晶体管的发射极电位的增加,当PNP晶体管导通时,来自电压源的电压经由PNP晶体管施加到NPN晶体管的基极 。

    Optical transmitter
    6.
    发明申请
    Optical transmitter 有权
    光发射机

    公开(公告)号:US20050063710A1

    公开(公告)日:2005-03-24

    申请号:US10496687

    申请日:2002-11-28

    CPC分类号: H04B10/504

    摘要: The present invention is intended to prevent a light-emitting diode from emitting light continuously in the case when the level at an input terminal is fixed high because of software or the like and to avoid various problems, such as battery exhaustion and breakdown of the light-emitting diode, in PDAs, cellular phones, etc. For these purposes, a high-pass filter 21 for passing the high-frequency components of an optical transmission input signal having a pulse waveform and a binary circuit 22 for binarizing the output signal of the high-pass filter 21 so as to be returned to a pulse waveform are provided in the preceding stage of a light-emitting device driving circuit 23 for driving a light-emitting diode 8 for optical transmission.

    摘要翻译: 本发明是为了防止发光二极管由于软件等而在输入端子的电平固定为高的情况下连续地发光,并且避免诸如电池耗尽和光的破坏等各种问题 用于PDA,蜂窝电话等。为了这些目的,高通滤波器21用于使具有脉冲波形的光传输输入信号的高频分量和二进制电路22二值化,以将 在用于驱动用于光传输的发光二极管8的发光装置驱动电路23的前级中设置高通滤波器21以返回到脉冲波形。

    Optical transmitter
    8.
    发明授权
    Optical transmitter 有权
    光发射机

    公开(公告)号:US07298977B2

    公开(公告)日:2007-11-20

    申请号:US10496687

    申请日:2002-11-28

    CPC分类号: H04B10/504

    摘要: The present invention is intended to prevent a light-emitting diode from emitting light continuously in the case when the level at an input terminal is fixed high because of software or the like and to avoid various problems, such as battery exhaustion and breakdown of the light-emitting diode, in PDAs, cellular phones, etc. For these purposes, a high-pass filter 21 for passing the high-frequency components of an optical transmission input signal having a pulse waveform and a binary circuit 22 for binarizing the output signal of the high-pass filter 21 so as to be returned to a pulse waveform are provided in the preceding stage of a light-emitting device driving circuit 23 for driving a light-emitting diode 8 for optical transmission.

    摘要翻译: 本发明是为了防止发光二极管由于软件等而在输入端子的电平固定为高的情况下连续地发光,并且避免诸如电池耗尽和光的破坏等各种问题 用于PDA,蜂窝电话等。为了这些目的,高通滤波器21用于使具有脉冲波形的光传输输入信号的高频分量和二进制电路22二值化,以将 在用于驱动用于光传输的发光二极管8的发光装置驱动电路23的前级中设置高通滤波器21以返回到脉冲波形。

    LIGHT-RECEIVING AMPLIFIER CIRCUIT AND OPTICAL PICK-UP DEVICE USING THE SAME
    9.
    发明申请
    LIGHT-RECEIVING AMPLIFIER CIRCUIT AND OPTICAL PICK-UP DEVICE USING THE SAME 失效
    使用光接收放大器电路和光学拾取器件

    公开(公告)号:US20070018079A1

    公开(公告)日:2007-01-25

    申请号:US11428422

    申请日:2006-07-03

    IPC分类号: H03F3/08

    摘要: The present invention provides a light-receiving amplifier circuit which includes a clipping circuit, can prevent an oscillation at the time of clipping operation, and can freely set clipping voltage. The light-receiving circuit of the present invention includes a photodiode, an operation amplifier, a conversion resistance connected between an output terminal and an inverting input terminal of the operation amplifier, and a clipping circuit which clips output voltage of the operation amplifier to a predetermined value. The clipping circuit includes a PNP transistor which detects a change in the output voltage of the operation amplifier and a voltage source connected to a base of the PNP transistor. Here, when the PNP transistor is turned ON along with an increase of an emitter potential of the NPN transistor which constitutes an output amplifier stage of the operation amplifier, voltage from the voltage source is applied to the base of the NPN transistor via the PNP transistor.

    摘要翻译: 本发明提供了一种包含限幅电路的光接收放大器电路,可以防止在削波操作时的振荡,并且可以自由地设定限幅电压。 本发明的光接收电路包括:光电二极管,运算放大器,连接在运算放大器的输出端和反相输入端之间的转换电阻;以及削波电路,其将运算放大器的输出电压除以预定的 值。 限幅电路包括PNP晶体管,其检测运算放大器的输出电压的变化和连接到PNP晶体管的基极的电压源。 这里,当构成运算放大器的输出放大器级的NPN晶体管的发射极电位的增加,当PNP晶体管导通时,来自电压源的电压经由PNP晶体管施加到NPN晶体管的基极 。