DEBUG ARCHITECTURE
    2.
    发明申请
    DEBUG ARCHITECTURE 有权
    调试架构

    公开(公告)号:US20140013421A1

    公开(公告)日:2014-01-09

    申请号:US13938098

    申请日:2013-07-09

    IPC分类号: G06F21/44

    摘要: Roughly described, a method of restricting access of a debug controller to debug architecture on an integrated circuit chip, the debug architecture comprising an access controller, a plurality of peripheral circuits, and a shared hub, the shared hub being accessible by the access controller and the plurality of peripheral circuits, the method comprising: at the access controller, authenticating the debug controller; at the access controller, following authentication, assigning to the debug controller a set of access rights, the set of access rights granting the debug controller partial access to the debug architecture; and after assigning the set of access rights, allowing the debug controller access to the debug architecture as allowed by the set of access rights.

    摘要翻译: 大致描述了一种限制调试控制器访问集成电路芯片上的架构的方法,所述调试架构包括访问控制器,多个外围电路和共享集线器,共享集线器可由访问控制器访问,以及 所述多个外围电路,所述方法包括:在所述访问控制器处,认证所述调试控制器; 在访问控制器处,在认证之后向调试控制器分配一组访问权限,授予调试控制器部分访问调试体系结构的一组访问权限; 并且在分配了一组访问权限之后,允许调试控制器访问该组访问权限所允许的调试架构。

    DEBUG ARCHITECTURE
    3.
    发明申请
    DEBUG ARCHITECTURE 有权
    调试架构

    公开(公告)号:US20140013157A1

    公开(公告)日:2014-01-09

    申请号:US13938053

    申请日:2013-07-09

    IPC分类号: G06F11/27

    摘要: Roughly described, an integrated circuit chip comprises a plurality of peripheral circuits, each peripheral circuit connected to a respective debug unit, the respective debug unit configured to generate debug information of that peripheral circuit; and a plurality of separate stores for receiving debug information, storing debug information, and outputting debug information; wherein in response to a single trigger signal, the debug units are configured to stream their generated debug information to the plurality of separate stores; and wherein each of the plurality of separate stores is configured to receive debug information at a higher stream rate than it outputs debug information.

    摘要翻译: 粗略地描述,集成电路芯片包括多个外围电路,每个外围电路连接到相应的调试单元,相应的调试单元被配置为产生该外围电路的调试信息; 以及多个单独存储器,用于接收调试信息,存储调试信息并输出调试信息; 其中响应于单个触发信号,所述调试单元被配置为将其生成的调试信息流传送到所述多个单独的存储器; 并且其中所述多个单独存储器中的每一个被配置为以比它输出调试信息更高的流速度接收调试信息。

    DEBUG ARCHITECTURE
    4.
    发明申请
    DEBUG ARCHITECTURE 有权
    调试架构

    公开(公告)号:US20140013145A1

    公开(公告)日:2014-01-09

    申请号:US13938077

    申请日:2013-07-09

    IPC分类号: G06F1/26

    摘要: Roughly described, a method of powering down a portion of an integrated circuit chip, the portion of the integrated circuit chip comprising a plurality of peripheral circuits, each peripheral circuit being connected to a respective debug unit, the method comprising: prior to power down, extracting from each debug unit configuration information of that debug unit; storing the configuration information of the debug units in a memory on the integrated circuit chip during power down of the portion of the integrated circuit chip; and on power up, restoring the configuration information of each debug unit to that debug unit prior resuming operation of that debug unit and the peripheral circuit connected to that debug unit.

    摘要翻译: 粗略地描述了一种对集成电路芯片的一部分断电的方法,该集成电路芯片的部分包括多个外围电路,每个外围电路连接到相应的调试单元,该方法包括:在断电之前, 从所述调试单元的每个调试单元的配置信息中提取所述调试单元的配置信息; 在集成电路芯片的部分断电期间将调试单元的配置信息存储在集成电路芯片上的存储器中; 并且在上电时,在恢复该调试单元和连接到该调试单元的外围电路的操作之前将每个调试单元的配置信息恢复到该调试单元。

    Debug Architecture
    7.
    发明申请
    Debug Architecture 有权
    调试架构

    公开(公告)号:US20160356841A1

    公开(公告)日:2016-12-08

    申请号:US15241805

    申请日:2016-08-19

    IPC分类号: G01R31/28 G01R31/317

    摘要: Roughly described, a method of restricting access of a debug controller to debug architecture on an integrated circuit chip, the debug architecture comprising an access controller, a plurality of peripheral circuits, and a shared hub, the shared hub being accessible by the access controller and the plurality of peripheral circuits, the method comprising: at the access controller, authenticating the debug controller; at the access controller, following authentication, assigning to the debug controller a set of access rights, the set of access rights granting the debug controller partial access to the debug architecture; and after assigning the set of access rights, allowing the debug controller access to the debug architecture as allowed by the set of access rights.

    摘要翻译: 大致描述了一种限制调试控制器访问集成电路芯片上的架构的方法,所述调试架构包括访问控制器,多个外围电路和共享集线器,共享集线器可由访问控制器访问,以及 所述多个外围电路,所述方法包括:在所述访问控制器处,认证所述调试控制器; 在访问控制器处,在认证之后向调试控制器分配一组访问权限,授予调试控制器部分访问调试体系结构的一组访问权限; 并且在分配了一组访问权限之后,允许调试控制器访问该组访问权限所允许的调试架构。

    MESSAGE MONITORING
    8.
    发明申请

    公开(公告)号:US20210103537A1

    公开(公告)日:2021-04-08

    申请号:US17064594

    申请日:2020-10-06

    IPC分类号: G06F13/36

    摘要: A supervisory unit configured to supervise interconnect messages passing to or from an interconnect is provided. The supervisory unit is configured to, on receiving an interconnect message: store the interconnect message in a data store; compare the interconnect message to predetermined filter criteria; and select, in dependence on that comparison, one or more actions to be taken with respect to the interconnect message. The one or more actions are selected from the group including: permitting the interconnect message to pass unaltered; blocking the interconnect message from passing and permitting the interconnect message to pass in an altered state; and performing the one or more selected actions with respect to the interconnect message.

    Debug architecture
    9.
    发明授权

    公开(公告)号:US10132863B2

    公开(公告)日:2018-11-20

    申请号:US14843745

    申请日:2015-09-02

    摘要: Roughly described, a method of powering down a portion of an integrated circuit chip, the portion of the integrated circuit chip comprising a plurality of peripheral circuits, each peripheral circuit being connected to a respective debug unit, the method comprising: prior to power down, extracting from each debug unit configuration information of that debug unit; storing the configuration information of the debug units in a memory on the integrated circuit chip during power down of the portion of the integrated circuit chip; and on power up, restoring the configuration information of each debug unit to that debug unit prior resuming operation of that debug unit and the peripheral circuit connected to that debug unit.