摘要:
A built-in self-test (BIST) system and method for testing an array of embedded electronic devices, the BIST comprising: a shift register device connected to an output pin of an embedded array of electronic devices being tested and for receiving a failure indication signal at a real-time output pin of the device under test, the shift register generating a unique signature in response to receipt of the failure indication; a device for determining whether the generated unique signature is represented in a table comprising known signature values and corresponding bitmaps of prior determined array defects for that device under test; wherein the need to bitmap the array is avoided when a known failure signature is determined.
摘要:
Apparatus and methods for separating a fluid, with the apparatus including a rotatable drum having an inner drum wall and an outer drum wall disposed around the inner drum wall to define a separation passage therebetween. The apparatus also includes radial separator blades that are curved in a circumferential direction and are disposed in the separation passage of the drum, the radial separator blades extending radially at least partially between the inner drum wall and the outer drum wall. The apparatus further includes a first circumferential separator blade that is curved in a radial direction and is disposed in the separation passage of the drum, the first circumferential separator blade extending at least partially around the inner drum wall. The apparatus also includes a housing disposed around the drum and configured to receive a higher-density component of the fluid separated in the separation passage.
摘要:
A method for implementing at speed bit fail mapping of an embedded memory system having ABIST (Array Built In Self Testing), comprises using a high speed multiplied clock which is a multiple of an external clock of an external tester to sequence ABIST bit fail testing of the embedded memory system. Collect store fail data during ABIST testing of the embedded memory system. Perform a predetermined number of ABIST runs before issuing a bypass order substituting the external clock for the high speed multiplied clock. Use the external clock of the tester to read bit fail data out to the external tester.
摘要翻译:一种用于实现具有ABIST(Array Built In Self Testing阵列)的嵌入式存储器系统的速率位故障映射的方法,包括使用作为外部测试器的外部时钟的倍数的高速倍增时钟来对ABIST位故障测试进行排序 嵌入式内存系统。 在嵌入式存储系统的ABIST测试期间收集存储失败数据。 在发出旁路命令之前,执行预定数量的ABIST运行,将外部时钟替换为高速倍增时钟。 使用测试仪的外部时钟将位故障数据读出外部测试仪。