-
公开(公告)号：US08619474B2
公开(公告)日：2013-12-31
申请号：US12556941
申请日：2009-09-10
IPC分类号： G11C7/02
CPC分类号： G11C16/3427 , G11C11/5628 , G11C16/0483 , G11C16/10 , G11C16/12 , G11C16/3418 , G11C2211/5621
摘要： Memory devices and methods are disclosed, such as devices configured to apply a first program inhibit bias to data lines during a first portion of a program operation and to apply a second program inhibit bias to data lines during a second portion of the program operation. The second program inhibit bias is greater than the first program inhibit bias.
摘要翻译： 公开了存储器件和方法，例如被配置为在程序操作的第一部分期间向数据线施加第一程序禁止偏置的器件，并且在程序操作的第二部分期间对数据线施加第二程序禁止偏置。 第二个程序禁止偏置大于第一个程序抑制偏置。
-
公开(公告)号：US08514624B2
公开(公告)日：2013-08-20
申请号：US13165416
申请日：2011-06-21
申请人： Krishna K. Parat , Akira Goda , Koichi Kawai , Brian J. Soderling , Jeremy Binfet , Arnaud A. Furnemont , Tejas Krishnamohan , Tyson M. Stichka , Giuseppina Puzzilli
发明人： Krishna K. Parat , Akira Goda , Koichi Kawai , Brian J. Soderling , Jeremy Binfet , Arnaud A. Furnemont , Tejas Krishnamohan , Tyson M. Stichka , Giuseppina Puzzilli
IPC分类号： G11C16/04
CPC分类号： G11C29/765 , G11C11/5628 , G11C16/0483 , G11C16/16 , G11C16/349 , G11C29/789
摘要： Memory devices and methods are disclosed, including a method involving erasing a block of memory cells. After erasing the block, and before subsequent programming of the block, a number of bad strings in the block are determined based on charge accumulation on select gate transistors. The block is retired from use if the number of bad strings exceeds a threshold. Additional embodiments are disclosed.
摘要翻译： 公开了存储器件和方法，包括涉及擦除存储器单元块的方法。 在擦除块之后，并且在块的后续编程之前，基于选择栅晶体管上的电荷积累来确定块中的多个不良串。 如果坏字符串的数量超过阈值，则该块将从使用中退出。 公开了另外的实施例。
-
3.发明授权Memory array having memory cells coupled between a programmable drain select gate and a non-programmable source select gate 有权具有耦合在可编程漏极选择栅极和非可编程源选择栅极之间的存储器单元的存储器阵列公开(公告)号：US08228735B2
公开(公告)日：2012-07-24
申请号：US12707162
申请日：2010-02-17
申请人： Giuseppina Puzzilli , Andrew Bicksler , Akira Goda
发明人： Giuseppina Puzzilli , Andrew Bicksler , Akira Goda
IPC分类号： G11C16/04
CPC分类号： G11C11/5628 , G11C16/0483
摘要： Memories and their memory arrays are disclosed. One such memory array has a string of series-coupled memory cells, a non-programmable select gate coupled in series to a first end of the string of series-coupled memory cells, and a programmable select gate coupled in series to a second end of the string of series-coupled memory cells.
摘要翻译： 记忆及其记忆阵列被公开。 一个这样的存储器阵列具有一串串联耦合的存储器单元，串联耦合到串联耦合存储器单元串的第一端的非可编程选择栅极，以及串联耦合到第二端的可编程选择栅极 串联的存储单元串。
-
公开(公告)号：US20110149659A1
公开(公告)日：2011-06-23
申请号：US12646136
申请日：2009-12-23
申请人： Akira Goda , Giuseppina Puzzilli
发明人： Akira Goda , Giuseppina Puzzilli
CPC分类号： G11C16/16
摘要： Erase operations and apparatus configured to perform the erase operations are suitable for non-volatile memory devices having memory cells arranged in strings. One such method includes biasing select gate control lines of a string of memory cells to a first bias potential, biasing access lines of a pair of the memory cells to a second bias potential and biasing access lines of one or more remaining memory cells to a third potential. A ramping bias potential is applied to channel regions of the string of memory cells substantially concurrently with or subsequent to biasing the select gate control lines and the access lines, and floating the select gate control lines in response to the ramping bias potential reaching a release bias potential between an initial bias potential of the ramping bias potential and a target bias potential of the ramping bias potential.
摘要翻译： 配置为执行擦除操作的擦除操作和装置适用于具有排列成串的存储单元的非易失性存储器件。 一种这样的方法包括将一串存储器单元的选择栅极控制线偏置到第一偏置电位，将一对存储器单元的访问线偏置到第二偏置电位，并将一个或多个剩余存储器单元的访问线偏置到第三偏置电位 潜在。 斜坡偏置电位基本上与偏置选择栅极控制线和接入线的同时或之后施加到存储器单元串的沟道区，并且响应于斜坡偏置电位达到释放偏压而浮动选择栅极控制线 斜坡偏置电位的初始偏置电位与斜坡偏置电位的目标偏置电位之间的电位。
-
公开(公告)号：US20110058424A1
公开(公告)日：2011-03-10
申请号：US12556941
申请日：2009-09-10
CPC分类号： G11C16/3427 , G11C11/5628 , G11C16/0483 , G11C16/10 , G11C16/12 , G11C16/3418 , G11C2211/5621
摘要： Memory devices and methods are disclosed, such as devices configured to apply a first program inhibit bias to data lines during a first portion of a program operation and to apply a second program inhibit bias to data lines during a second portion of the program operation. The second program inhibit bias is greater than the first program inhibit bias.
摘要翻译： 公开了存储器件和方法，例如被配置为在程序操作的第一部分期间向数据线施加第一程序禁止偏置的器件，并且在程序操作的第二部分期间对数据线施加第二程序禁止偏置。 第二个程序禁止偏置大于第一个程序抑制偏置。
-
公开(公告)号：US08369158B2
公开(公告)日：2013-02-05
申请号：US12646136
申请日：2009-12-23
申请人： Akira Goda , Giuseppina Puzzilli
发明人： Akira Goda , Giuseppina Puzzilli
IPC分类号： G11C11/34
CPC分类号： G11C16/16
摘要： Erase operations and apparatus configured to perform the erase operations are suitable for non-volatile memory devices having memory cells arranged in strings. One such method includes biasing select gate control lines of a string of memory cells to a first bias potential, biasing access lines of a pair of the memory cells to a second bias potential and biasing access lines of one or more remaining memory cells to a third potential. A ramping bias potential is applied to channel regions of the string of memory cells substantially concurrently with or subsequent to biasing the select gate control lines and the access lines, and floating the select gate control lines in response to the ramping bias potential reaching a release bias potential between an initial bias potential of the ramping bias potential and a target bias potential of the ramping bias potential.
摘要翻译： 配置为执行擦除操作的擦除操作和装置适用于具有排列成串的存储单元的非易失性存储器件。 一种这样的方法包括将一串存储器单元的选择栅极控制线偏置到第一偏置电位，将一对存储器单元的访问线偏置到第二偏置电位，并将一个或多个剩余存储器单元的访问线偏置到第三偏置电位 潜在。 斜坡偏置电位基本上与偏置选择栅极控制线和接入线的同时或之后施加到存储器单元串的沟道区，并且响应于斜坡偏置电位达到释放偏压而浮动选择栅极控制线 斜坡偏置电位的初始偏置电位与斜坡偏置电位的目标偏置电位之间的电位。
-
公开(公告)号：US20120327713A1
公开(公告)日：2012-12-27
申请号：US13165416
申请日：2011-06-21
申请人： Krishna K. Parat , Akira Goda , Koichi Kawai , Brian J. Soderling , Jeremy Binfet , Arnaud A. Furnemont , Tejas Krishnamohan , Tyson M. Stichka , Giuseppina Puzzilli
发明人： Krishna K. Parat , Akira Goda , Koichi Kawai , Brian J. Soderling , Jeremy Binfet , Arnaud A. Furnemont , Tejas Krishnamohan , Tyson M. Stichka , Giuseppina Puzzilli
CPC分类号： G11C29/765 , G11C11/5628 , G11C16/0483 , G11C16/16 , G11C16/349 , G11C29/789
摘要： Memory devices and methods are disclosed, including a method involving erasing a block of memory cells. After erasing the block, and before subsequent programming of the block, a number of bad strings in the block are determined based on charge accumulation on select gate transistors. The block is retired from use if the number of bad strings exceeds a threshold. Additional embodiments are disclosed.
摘要翻译： 公开了存储器件和方法，包括涉及擦除存储器单元块的方法。 在擦除块之后，并且在块的后续编程之前，基于选择栅晶体管上的电荷积累来确定块中的多个不良串。 如果坏字符串的数量超过阈值，则该块将从使用中退出。 公开了另外的实施例。
-
8.发明申请MEMORY ARRAY HAVING MEMORY CELLS COUPLED BETWEEN A PROGRAMMABLE DRAIN SELECT GATE AND A NON-PROGRAMMABLE SOURCE SELECT GATE 有权具有可编程排水选择门和不可编程源选择门之间的记忆细胞的记忆阵列公开(公告)号：US20110199827A1
公开(公告)日：2011-08-18
申请号：US12707162
申请日：2010-02-17
申请人： Giuseppina Puzzilli , Andrew Bicksler , Akira Goda
发明人： Giuseppina Puzzilli , Andrew Bicksler , Akira Goda
CPC分类号： G11C11/5628 , G11C16/0483
摘要： Memories and their memory arrays are disclosed. One such memory array has a string of series-coupled memory cells, a non-programmable select gate coupled in series to a first end of the string of series-coupled memory cells, and a programmable select gate coupled in series to a second end of the string of series-coupled memory cells.
摘要翻译： 记忆及其记忆阵列被公开。 一个这样的存储器阵列具有一串串联耦合的存储器单元，串联耦合到串联耦合存储器单元串的第一端的非可编程选择栅极，以及串联耦合到第二端的可编程选择栅极 串联的存储单元串。
-
-
-
-
-
-
-
搜索结果
8 条记录 (耗时 0.023 秒)