公开(公告)号：US07709776B2

公开(公告)日：2010-05-04

申请号：US12390195

申请日：2009-02-20

申请人： Warren M. Farnworth ,  Sidney B. Rigg ,  William Mark Hiatt ,  Alan G. Wood ,  Peter A. Benson ,  James M. Wark ,  David R. Hembree ,  Kyle K. Kirby ,  Charles M. Watkins ,  Salman Akram

发明人： Warren M. Farnworth ,  Sidney B. Rigg ,  William Mark Hiatt ,  Alan G. Wood ,  Peter A. Benson ,  James M. Wark ,  David R. Hembree ,  Kyle K. Kirby ,  Charles M. Watkins ,  Salman Akram

IPC分类号： H01L27/00 ,  H01L31/0232

CPC分类号： H01L27/00 ,  B33Y80/00 ,  H01L27/14618 ,  H01L27/14625 ,  H01L27/14683 ,  H01L27/14687 ,  H01L2224/48091 ,  H01L2224/48227 ,  H01L2924/01077 ,  H01L2924/01078 ,  H01L2924/00014

摘要： Microelectronic imager assemblies comprising a workpiece including a substrate and a plurality of imaging dies on and/or in the substrate. The substrate includes a front side and a back side, and the imaging dies comprise imaging sensors at the front side of the substrate and external contacts operatively coupled to the image sensors. The microelectronic imager assembly further comprises optics supports superimposed relative to the imaging dies. The optics supports can be directly on the substrate or on a cover over the substrate. Individual optics supports can have (a) an opening aligned with one of the image sensors, and (b) a bearing element at a reference distance from the image sensor. The microelectronic imager assembly can further include optical devices mounted or otherwise carried by the optics supports.

摘要翻译： 微电子成像器组件包括包括衬底的工件和在衬底上和/或衬底中的多个成像管芯。 基板包括前侧和后侧，并且成像管芯包括在基板的前侧的成像传感器和可操作地耦合到图像传感器的外部触点。 微电子成像器组件还包括相对于成像管芯叠加的光学支架。 光学支撑件可以直接在基板上或衬底上的盖上。 单个光学支撑件可以具有（a）与图像传感器中的一个对准的开口，以及（b）与图像传感器相距一定距离处的轴承元件。 微电子成像器组件还可以包括由光学器件支撑件安装或以其它方式承载的光学器件。

公开(公告)号：US20090155949A1

公开(公告)日：2009-06-18

申请号：US12390195

申请日：2009-02-20

申请人： Warren M. Farnworth ,  Sidney B. Rigg ,  William Mark Hiatt ,  Alan G. Wood ,  Peter A. Benson ,  James M. Wark ,  David R. Hembree ,  Kyle K. Kirby ,  Charles M. Watkins ,  Salman Akram

发明人： Warren M. Farnworth ,  Sidney B. Rigg ,  William Mark Hiatt ,  Alan G. Wood ,  Peter A. Benson ,  James M. Wark ,  David R. Hembree ,  Kyle K. Kirby ,  Charles M. Watkins ,  Salman Akram

IPC分类号： H01L31/0232

CPC分类号： H01L27/00 ,  B33Y80/00 ,  H01L27/14618 ,  H01L27/14625 ,  H01L27/14683 ,  H01L27/14687 ,  H01L2224/48091 ,  H01L2224/48227 ,  H01L2924/01077 ,  H01L2924/01078 ,  H01L2924/00014

摘要： Microelectronic imager assemblies comprising a workpiece including a substrate and a plurality of imaging dies on and/or in the substrate. The substrate includes a front side and a back side, and the imaging dies comprise imaging sensors at the front side of the substrate and external contacts operatively coupled to the image sensors. The microelectronic imager assembly further comprises optics supports superimposed relative to the imaging dies. The optics supports can be directly on the substrate or on a cover over the substrate. Individual optics supports can have (a) an opening aligned with one of the image sensors, and (b) a bearing element at a reference distance from the image sensor. The microelectronic imager assembly can further include optical devices mounted or otherwise carried by the optics supports.

摘要翻译： 微电子成像器组件包括包括衬底的工件和在衬底上和/或衬底中的多个成像管芯。 基板包括前侧和后侧，并且成像管芯包括在基板的前侧的成像传感器和可操作地耦合到图像传感器的外部触点。 微电子成像器组件还包括相对于成像管芯叠加的光学支架。 光学支撑件可以直接在基板上或衬底上的盖上。 单个光学支撑件可以具有（a）与图像传感器中的一个对准的开口，以及（b）与图像传感器相距一定距离处的轴承元件。 微电子成像器组件还可以包括由光学器件支撑件安装或以其它方式承载的光学器件。

公开(公告)号：US07488618B2

公开(公告)日：2009-02-10

申请号：US11336567

申请日：2006-01-20

申请人： Alan G. Wood ,  Warren M. Farnworth ,  Charles M. Watkins ,  Peter A. Benson

发明人： Alan G. Wood ,  Warren M. Farnworth ,  Charles M. Watkins ,  Peter A. Benson

IPC分类号： H01L21/00 ,  H01L33/00 ,  H01L29/768

CPC分类号： H01L27/14685 ,  B33Y10/00 ,  B33Y80/00 ,  H01L21/56 ,  H01L23/3128 ,  H01L27/14618 ,  H01L27/14627 ,  H01L2224/04105 ,  H01L2224/20 ,  H01L2924/01005 ,  H01L2924/01027 ,  H01L2924/01046 ,  H01L2924/12041

摘要： Microlenses for directing radiation toward a sensor of an imaging device include a plurality of mutually adhered layers of cured optically transmissive material. Systems include at least one microprocessor and a substrate including an array of microlenses formed thereon in electrical communication with the at least one microprocessor. At least one microlens in the array includes a plurality of mutually adhered layers of cured optically transmissive material.

摘要翻译： 用于将辐射引导到成像装置的传感器的微透镜包括固化的光学透射材料的多个相互附着的层。 系统包括至少一个微处理器和包括形成在其上的与该至少一个微处理器电连通的微透镜阵列的基板。 阵列中的至少一个微透镜包括固化的光学透射材料的多个相互附着的层。

公开(公告)号：US07521296B2

公开(公告)日：2009-04-21

申请号：US11336228

申请日：2006-01-20

申请人： Alan G. Wood ,  Warren M. Farnworth ,  Charles M. Watkins ,  Peter A. Benson

发明人： Alan G. Wood ,  Warren M. Farnworth ,  Charles M. Watkins ,  Peter A. Benson

IPC分类号： H01L21/50 ,  H01L23/043

CPC分类号： H01L27/14685 ,  B33Y10/00 ,  B33Y80/00 ,  H01L21/56 ,  H01L23/3128 ,  H01L27/14618 ,  H01L27/14627 ,  H01L2224/04105 ,  H01L2224/20 ,  H01L2924/01005 ,  H01L2924/01027 ,  H01L2924/01046 ,  H01L2924/12041

摘要： Microlenses for directing radiation toward a sensor of an imaging device include a plurality of mutually adhered layers of cured optically transmissive material. Systems include at least one microprocessor and a substrate including an array of microlenses formed thereon in electrical communication with the at least one microprocessor. At least one microlens in the array includes a plurality of mutually adhered layers of cured optically transmissive material.

摘要翻译： 用于将辐射引导到成像装置的传感器的微透镜包括固化的光学透射材料的多个相互附着的层。 系统包括至少一个微处理器和包括形成在其上的与该至少一个微处理器电连通的微透镜阵列的基板。 阵列中的至少一个微透镜包括固化的光学透射材料的多个相互附着的层。

公开(公告)号：US07189954B2

公开(公告)日：2007-03-13

申请号：US10894262

申请日：2004-07-19

申请人： Warren M. Farnworth ,  Sidney B. Rigg ,  William Mark Hiatt ,  Alan G. Wood ,  Peter A. Benson ,  James M. Wark ,  David R. Hembree ,  Kyle K. Kirby ,  Charles M. Watkins ,  Salman Akram

发明人： Warren M. Farnworth ,  Sidney B. Rigg ,  William Mark Hiatt ,  Alan G. Wood ,  Peter A. Benson ,  James M. Wark ,  David R. Hembree ,  Kyle K. Kirby ,  Charles M. Watkins ,  Salman Akram

IPC分类号： H01L31/0232 ,  H01L27/00

CPC分类号： H01L27/00 ,  B33Y80/00 ,  H01L27/14618 ,  H01L27/14625 ,  H01L27/14683 ,  H01L27/14687 ,  H01L2224/48091 ,  H01L2224/48227 ,  H01L2924/01077 ,  H01L2924/01078 ,  H01L2924/00014

摘要： Microelectronic imager assemblies comprising a workpiece including a substrate and a plurality of imaging dies on and/or in the substrate. The substrate includes a front side and a back side, and the imaging dies comprise imaging sensors at the front side of the substrate and external contacts operatively coupled to the image sensors. The microelectronic imager assembly further comprises optics supports superimposed relative to the imaging dies. The optics supports can be directly on the substrate or on a cover over the substrate. Individual optics supports can have (a) an opening aligned with one of the image sensors, and (b) a bearing element at a reference distance from the image sensor. The microelectronic imager assembly can further include optical devices mounted or otherwise carried by the optics supports.

公开(公告)号：US07442643B2

公开(公告)日：2008-10-28

申请号：US11336540

申请日：2006-01-20

申请人： Alan G. Wood ,  Warren M. Farnworth ,  Charles M. Watkins ,  Peter A. Benson

发明人： Alan G. Wood ,  Warren M. Farnworth ,  Charles M. Watkins ,  Peter A. Benson

IPC分类号： H01L21/44 ,  H01L23/58

CPC分类号： H01L27/14685 ,  B33Y10/00 ,  B33Y80/00 ,  H01L21/56 ,  H01L23/3128 ,  H01L27/14618 ,  H01L27/14627 ,  H01L2224/04105 ,  H01L2224/20 ,  H01L2924/01005 ,  H01L2924/01027 ,  H01L2924/01046 ,  H01L2924/12041

摘要： A conductive element is formed on a substrate by forming an organometallic layer on at least a portion of a surface of the substrate, heating a portion of the organometallic layer, and removing an unheated portion of the organometallic layer. In other methods, a flowable, uncured conductive material may be deposited on a surface of the substrate, the flowable, uncured conductive material may be selectively cured over at least a portion of the surface of the substrate, and a portion of the cured conductive material may be removed. A conductive via is formed by forming a hole at least partially through a thickness of a substrate, depositing an organometallic material within at least a portion of the hole, and selectively heating at least a portion of the organometallic material.

摘要翻译： 通过在基板表面的至少一部分上形成有机金属层，加热部分有机金属层，去除有机金属层的未加热部分，在基板上形成导电元件。 在其他方法中，可流动的未固化的导电材料可以沉积在基底的表面上，可流动的未固化的导电材料可以选择性地固化在基底表面的至少一部分上，并且一部分固化的导电材料 可能被删除。 通过至少部分地穿过衬底的厚度形成孔，在孔的至少一部分内沉积有机金属材料并选择性地加热至少一部分有机金属材料来形成导电通孔。

公开(公告)号：US07265330B2

公开(公告)日：2007-09-04

申请号：US11476015

申请日：2006-06-28

申请人： Warren M. Farnworth ,  Sidney B. Rigg ,  William Mark Hiatt ,  Alan G. Wood ,  Peter A. Benson ,  James M. Wark ,  David R. Hembree ,  Kyle K. Kirby ,  Charles M. Watkins ,  Salman Akram

发明人： Warren M. Farnworth ,  Sidney B. Rigg ,  William Mark Hiatt ,  Alan G. Wood ,  Peter A. Benson ,  James M. Wark ,  David R. Hembree ,  Kyle K. Kirby ,  Charles M. Watkins ,  Salman Akram

IPC分类号： H01L27/00 ,  H01L31/0232

CPC分类号： H01L27/00 ,  B33Y80/00 ,  H01L27/14618 ,  H01L27/14625 ,  H01L27/14683 ,  H01L27/14687 ,  H01L2224/48091 ,  H01L2224/48227 ,  H01L2924/01077 ,  H01L2924/01078 ,  H01L2924/00014

摘要： Microelectronic imager assemblies comprising a workpiece including a substrate and a plurality of imaging dies on and/or in the substrate. The substrate includes a front side and a back side, and the imaging dies comprise imaging sensors at the front side of the substrate and external contacts operatively coupled to the image sensors. The microelectronic imager assembly further comprises optics supports superimposed relative to the imaging dies. The optics supports can be directly on the substrate or on a cover over the substrate. Individual optics supports can have (a) an opening aligned with one of the image sensors, and (b) a bearing element at a reference distance from the image sensor. The microelectronic imager assembly can further include optical devices mounted or otherwise carried by the optics supports.

摘要翻译： 微电子成像器组件包括包括衬底的工件和在衬底上和/或衬底中的多个成像管芯。 基板包括前侧和后侧，并且成像管芯包括在基板的前侧的成像传感器和可操作地耦合到图像传感器的外部触点。 微电子成像器组件还包括相对于成像管芯叠加的光学支架。 光学支撑件可以直接在基板上或衬底上的盖上。 单个光学支撑件可以具有（a）与图像传感器中的一个对准的开口，以及（b）与图像传感器相距一定距离处的轴承元件。 微电子成像器组件还可以包括由光学器件支撑件安装或以其它方式承载的光学器件。

公开(公告)号：US07504615B2

公开(公告)日：2009-03-17

申请号：US11727545

申请日：2007-03-27

申请人： Warren M. Farnworth ,  Sidney B. Rigg ,  William Mark Hiatt ,  Alan G. Wood ,  Peter A. Benson ,  James M. Wark ,  David R. Hembree ,  Kyle K. Kirby ,  Charles M. Watkins ,  Salman Akram

发明人： Warren M. Farnworth ,  Sidney B. Rigg ,  William Mark Hiatt ,  Alan G. Wood ,  Peter A. Benson ,  James M. Wark ,  David R. Hembree ,  Kyle K. Kirby ,  Charles M. Watkins ,  Salman Akram

IPC分类号： H01L27/00 ,  H01L31/0232

CPC分类号： H01L27/00 ,  B33Y80/00 ,  H01L27/14618 ,  H01L27/14625 ,  H01L27/14683 ,  H01L27/14687 ,  H01L2224/48091 ,  H01L2224/48227 ,  H01L2924/01077 ,  H01L2924/01078 ,  H01L2924/00014

摘要： Microelectronic imager assemblies comprising a workpiece including a substrate and a plurality of imaging dies on and/or in the substrate. The substrate includes a front side and a back side, and the imaging dies comprise imaging sensors at the front side of the substrate and external contacts operatively coupled to the image sensors. The microelectronic imager assembly further comprises optics supports superimposed relative to the imaging dies. The optics supports can be directly on the substrate or on a cover over the substrate. Individual optics supports can have (a) an opening aligned with one of the image sensors, and (b) a bearing element at a reference distance from the image sensor. The microelectronic imager assembly can further include optical devices mounted or otherwise carried by the optics supports.

摘要翻译： 微电子成像器组件包括包括衬底的工件和在衬底上和/或衬底中的多个成像管芯。 基板包括前侧和后侧，并且成像管芯包括在基板的前侧的成像传感器和可操作地耦合到图像传感器的外部触点。 微电子成像器组件还包括相对于成像管芯叠加的光学支架。 光学支撑件可以直接在基板上或衬底上的盖上。 单个光学支撑件可以具有（a）与图像传感器中的一个对准的开口，以及（b）与图像传感器相距一定距离处的轴承元件。 微电子成像器组件还可以包括由光学器件支撑件安装或以其它方式承载的光学器件。

公开(公告)号：US07419841B2

公开(公告)日：2008-09-02

申请号：US11494453

申请日：2006-07-28

申请人： Warren M. Farnworth ,  Sidney B. Rigg ,  William M. Hiatt ,  Kyle K. Kirby ,  Peter A. Benson ,  James M. Wark ,  Alan G. Wood ,  David R. Hembree ,  Salman Akram ,  Charles M. Watkins

发明人： Warren M. Farnworth ,  Sidney B. Rigg ,  William M. Hiatt ,  Kyle K. Kirby ,  Peter A. Benson ,  James M. Wark ,  Alan G. Wood ,  David R. Hembree ,  Salman Akram ,  Charles M. Watkins

IPC分类号： H01L21/00

CPC分类号： H01L27/14618 ,  H01L23/481 ,  H01L24/48 ,  H01L31/0203 ,  H01L31/02325 ,  H01L2224/48227 ,  H01L2924/00014 ,  H01L2924/01046 ,  H01L2924/01077 ,  H01L2924/01078 ,  H01L2924/04941 ,  H01L2924/12042 ,  H01L2924/14 ,  H01L2924/15174 ,  H01L2924/00 ,  H01L2224/45099 ,  H01L2224/45015 ,  H01L2924/207

摘要： Microelectronic imagers and methods for packaging microelectronic imagers are disclosed herein. In one embodiment, a microelectronic imaging unit can include a microelectronic die, an image sensor, an integrated circuit electrically coupled to the image sensor, and a bond-pad electrically coupled to the integrated circuit. An electrically conductive through-wafer interconnect extends through the die and is in contact with the bond-pad. The interconnect can include a passage extending completely through the substrate and the bond-pad with conductive fill material at least partially disposed in the passage. An electrically conductive support member is carried by and projects from the bond-pad. A cover over the image sensor is coupled to the support member.

摘要翻译： 本文公开了微电子成像器和用于封装微电子成像器的方法。 在一个实施例中，微电子成像单元可以包括微电子管芯，图像传感器，电耦合到图像传感器的集成电路以及电耦合到集成电路的接合焊盘。 导电晶片互连延伸穿过管芯并且与焊盘接触。 互连可以包括完全延伸穿过基底的通道和具有至少部分地设置在通道中的导电填充材料的接合垫。 导电支撑构件由接合垫承载和突出。 图像传感器上的盖连接到支撑构件。

公开(公告)号：US07235431B2

公开(公告)日：2007-06-26

申请号：US10934109

申请日：2004-09-02

申请人： Alan G. Wood ,  Warren M. Farnworth ,  Charles M. Watkins ,  Peter A. Benson

发明人： Alan G. Wood ,  Warren M. Farnworth ,  Charles M. Watkins ,  Peter A. Benson

IPC分类号： H01L21/50 ,  H01L23/043

CPC分类号： H01L27/14685 ,  B33Y10/00 ,  B33Y80/00 ,  H01L21/56 ,  H01L23/3128 ,  H01L27/14618 ,  H01L27/14627 ,  H01L2224/04105 ,  H01L2224/20 ,  H01L2924/01005 ,  H01L2924/01027 ,  H01L2924/01046 ,  H01L2924/12041

摘要： A method of packaging at least a portion of a semiconductor die or dice is disclosed. Uncured material may be disposed proximate at least the periphery of at least one semiconductor die and at least partially cured substantially as a whole. Methods of forming conductive elements such as traces, vias, and bond pads are also disclosed. More specifically, forming at least one organometallic layer to a substrate surface and selectively heating at least a portion thereof is disclosed. Also, forming a layer of conductive photopolymer over at least a portion of a surface of a substrate and removing at least a portion thereof is disclosed. A microlens having a plurality of mutually adhered layers of cured, optically transmissive material, methods of forming same, and systems so equipped are disclosed.

摘要翻译： 公开了一种封装半导体管芯或裸片的至少一部分的方法。 未固化的材料可以设置在至少一个半导体管芯的至少外围附近并且基本上整体上至少部分地固化。 还公开了形成导电元件如痕迹，通路和接合焊盘的方法。 更具体地，公开了至少一个有机金属层到基底表面并选择性地加热其至少一部分。 此外，公开了在衬底的表面的至少一部分上形成导电光聚合物层并且去除其至少一部分。 公开了一种具有多个相互粘合的固化的光透射材料层的微透镜，其形成方法以及如此装备的系统。