利索-全球专利检索

  1. 登录
  2. 注册

搜索结果

5 条记录 (耗时 0.023 秒)

    DEVICES AND METHODS FOR PERFORMING ARRAY BASED ASSAYS
    1.
    发明申请
    DEVICES AND METHODS FOR PERFORMING ARRAY BASED ASSAYS 审中-公开
    用于执行基于阵列的测试的设备和方法

    公开(公告)号：US20080200341A1

    公开(公告)日：2008-08-21

    申请号：US12113388

    申请日：2008-05-01

    申请人： Allen C. Thompson ,  George P. Tsai ,  Russell A. Parker

    发明人： Allen C. Thompson ,  George P. Tsai ,  Russell A. Parker

    IPC分类号： C40B30/00

    CPC分类号： C12Q1/6837 ,  B01J2219/00333 ,  B01J2219/00527 ,  B01J2219/00585 ,  B01J2219/00596 ,  B01J2219/00605 ,  B01J2219/00659 ,  B01J2219/00675 ,  B01J2219/00677 ,  B01J2219/00711 ,  B01J2219/00722 ,  B01J2219/00725 ,  B01L3/508 ,  B01L2200/0689 ,  B01L2300/0636 ,  B01L2300/0822 ,  B82Y30/00

    摘要： Devices and methods for performing an array assay are provided. Embodiments of the subject array assay devices include (1) a base, (2) a cover, and (3) a clamping member for holding the cover to the base, wherein when the cover is operatively held to the base about a structure that includes an array assembly spaced-apart from a backing element, the array assembly and the backing element are deflected to substantially the same curvature. Embodiments of the subject methods include contacting a sample with a backing element and placing the backing element supported sample in contact with an array assembly to form a structure that includes the backing element and array assembly. The structure is then held together using a subject array assay device and the array substrate and the backing element are deflected to substantially the same curvature.

    摘要翻译： 提供了用于进行阵列测定的装置和方法。 本发明的阵列测定装置的实施例包括（1）底座，（2）盖子和（3）用于将盖子保持在基座上的夹紧构件，其中当盖子围绕包括 与背衬元件间隔开的阵列组件，阵列组件和背衬元件被偏转到基本上相同的曲率。 本发明方法的实施方案包括将样品与背衬元件接触并将支撑元件支撑的样品与阵列组件接触以形成包括背衬元件和阵列组件的结构。 然后使用主题阵列测定装置将结构保持在一起，并且阵列基板和背衬元件被偏转到基本上相同的曲率。

    Apparatus and method for autofocus
    4.
    发明授权
    Apparatus and method for autofocus 有权
    自动对焦的装置和方法

    公开(公告)号：US06486457B1

    公开(公告)日：2002-11-26

    申请号：US09415184

    申请日：1999-10-07

    申请人： Andreas N. Dorsel ,  Kenneth L. Staton ,  Cassandra Dey ,  George P. Tsai

    发明人： Andreas N. Dorsel ,  Kenneth L. Staton ,  Cassandra Dey ,  George P. Tsai

    IPC分类号： G02B2764

    CPC分类号： G02B26/128 ,  G02B7/28 ,  G02B7/32

    摘要： A laser generates a collimated laser beam which passes through a lens off-axis. The beam is focused at a focal plane on a substrate surface. A first position sensitive detector receives the laser beam reflected from the substrate surface through the lens to generate a first signal proportional to lateral beam offset. A beam splitter may be provided to direct a portion of the laser beam before passing through the lens toward a second position sensitive detector to generate a second signal proportional to laser beam pointing instability. Apparatus computes the difference between the first and second signals, the difference being a defocused error signal. It is preferred that the first position sensitive detector be located at a distance from the lens that is at least twice the lens focal length.

    摘要翻译： 激光器产生通过透镜离轴的准直激光束。 光束聚焦在基板表面上的焦平面上。 第一位置敏感检测器接收通过透镜从衬底表面反射的激光束，以产生与横向光束偏移成比例的第一信号。 可以设置分束器以在通过透镜之前将激光束的一部分引向第二位置敏感检测器以产生与激光束指向不稳定性成比例的第二信号。 设备计算第一和第二信号之间的差异，差值是散焦误差信号。 优选的是，第一位置敏感检测器位于离透镜一定距离处，该距离至少是透镜焦距的两倍。