Systematic Compliance Checking of a Process
    1.
    发明申请
    Systematic Compliance Checking of a Process 失效
    流程的系统合规检查

    公开(公告)号:US20080189094A1

    公开(公告)日:2008-08-07

    申请号:US11672050

    申请日:2007-02-07

    IPC分类号: G06F17/50

    摘要: Methods and systems are presented for generation of a test suite in order to validate compliance of a process with its process specification. The methodology involves a formal description of the process using a flowchart, refinement of the flowchart to include misinterpretations of the process specification, defining compliance coverage models over the flowchart, and automatically generating test case scenarios that cover the models. Internal and external types of misinterpretation are distinguished. A compliance test suite is automatically generated and observations made of the details of the traversal through the flow chart when the tests are executed.

    摘要翻译: 提供了用于生成测试套件的方法和系统,以验证过程符合其过程规范。 该方法涉及使用流程图的过程的正式描述,流程图的改进包括过程规范的误解,在流程图上定义合规性覆盖模型,以及自动生成涵盖模型的测试用例场景。 区别了内部和外部的误解。 自动生成合规性测试套件,并在执行测试时通过流程图遍历的详细信息。

    Automatic generation of test suite for processor architecture compliance
    2.
    发明授权
    Automatic generation of test suite for processor architecture compliance 有权
    自动生成用于处理器架构合规性的测试套件

    公开(公告)号:US08280713B2

    公开(公告)日:2012-10-02

    申请号:US11735510

    申请日:2007-04-16

    IPC分类号: G06F17/50 G06F9/455

    CPC分类号: G06F11/263 G06F8/30

    摘要: A parametrically controlled model-based test generator automatically generates architectural compliance test suites for different implementations of a processor architecture, based on a set of architectural decisions chosen among optional behaviors for each implementation. Thus, different implementations of the same architecture can be easily supported by modifying the parameter values. In addition, ongoing changes to the architecture or comprehensive updates to the test suite can be easily handled by updating the architecture model or the coverage models, forgoing the need to review the whole, potentially huge, set of tests.

    摘要翻译: 基于对每个实现的可选行为选择的一组架构决策,参数控制的基于模型的测试发生器自动生成用于处理器架构的不同实现的架构一致性测试套件。 因此,可以通过修改参数值来容易地支持相同架构的不同实现。 此外,通过更新架构模型或覆盖模型,可以轻松地处理对架构的持续更改或测试套件的全面更新,从而需要检查整个可能巨大的测试集。

    Automatic Generation of Test Suite for Processor Architecture Compliance
    3.
    发明申请
    Automatic Generation of Test Suite for Processor Architecture Compliance 有权
    自动生成用于处理器架构合规性的测试套件

    公开(公告)号:US20080255822A1

    公开(公告)日:2008-10-16

    申请号:US11735510

    申请日:2007-04-16

    IPC分类号: G06F9/44

    CPC分类号: G06F11/263 G06F8/30

    摘要: A parametrically controlled model-based test generator automatically generates architectural compliance test suites for different implementations of a processor architecture, based on a set of architectural decisions chosen among optional behaviors for each implementation. Thus, different implementations of the same architecture can be easily supported by modifying the parameter values. In addition, ongoing changes to the architecture or comprehensive updates to the test suite can be easily handled by updating the architecture model or the coverage models, forgoing the need to review the whole, potentially huge, set of tests.

    摘要翻译: 基于对每个实现的可选行为选择的一组架构决策,参数控制的基于模型的测试发生器自动生成用于处理器架构的不同实现的架构一致性测试套件。 因此,可以通过修改参数值来容易地支持相同架构的不同实现。 此外,通过更新架构模型或覆盖模型,可以轻松地处理对架构的持续更改或测试套件的全面更新,从而需要检查整个可能巨大的测试集。

    Testing the compliance of a design with the synchronization requirements of a memory model
    4.
    发明授权
    Testing the compliance of a design with the synchronization requirements of a memory model 失效
    测试设计符合内存模型的同步要求

    公开(公告)号:US08412507B2

    公开(公告)日:2013-04-02

    申请号:US11947100

    申请日:2007-11-29

    申请人: Allon Adir Sigal Asaf

    发明人: Allon Adir Sigal Asaf

    IPC分类号: G06F17/50

    CPC分类号: G06F17/5022

    摘要: A method for compliance testing of a circuit design that includes at least one processor and a memory includes defining a memory model. The memory model includes synchronization mechanisms for synchronizing access to the memory by software instructions in different program threads running on the at least one processor. Synchronization-related parameters, which are applicable to at least one sequence of the software instructions in the different program threads, are specified. A coverage model is defined as a multi-dimensional cross-product of values of the synchronization-related parameters. At least one test program is generated using the coverage model, and a compliance of the design with the memory model is tested by subjecting the design to the at least one test program.

    摘要翻译: 包括至少一个处理器和存储器的电路设计的符合性测试的方法包括定义存储器模型。 存储器模型包括用于通过在至少一个处理器上运行的不同程序线程中的软件指令来同步对存储器的访问的同步机制。 指定适用于不同程序线程中的软件指令的至少一个序列的同步相关参数。 覆盖模型被定义为同步相关参数值的多维交叉积。 使用覆盖模型生成至少一个测试程序,并且通过对设计进行至少一个测试程序来测试设计与存储器模型的一致性。

    TESTING THE COMPLIANCE OF A DESIGN WITH THE SYNCHRONIZATION REQUIREMENTS OF A MEMORY MODEL
    5.
    发明申请
    TESTING THE COMPLIANCE OF A DESIGN WITH THE SYNCHRONIZATION REQUIREMENTS OF A MEMORY MODEL 失效
    测试设计符合存储器模型的同步要求

    公开(公告)号:US20080133205A1

    公开(公告)日:2008-06-05

    申请号:US11947100

    申请日:2007-11-29

    申请人: Allon Adir Sigal Asaf

    发明人: Allon Adir Sigal Asaf

    IPC分类号: G06F17/50

    CPC分类号: G06F17/5022

    摘要: A method for compliance testing of a circuit design that includes at least one processor and a memory includes defining a memory model. The memory model includes synchronization mechanisms for synchronizing access to the memory by software instructions in different program threads running on the at least one processor. Synchronization-related parameters, which are applicable to at least one sequence of the software instructions in the different program threads, are specified. A coverage model is defined as a multi-dimensional cross-product of values of the synchronization-related parameters. At least one test program is generated using the coverage model, and a compliance of the design with the memory model is tested by subjecting the design to the at least one test program.

    摘要翻译: 包括至少一个处理器和存储器的电路设计的符合性测试的方法包括定义存储器模型。 存储器模型包括用于通过在至少一个处理器上运行的不同程序线程中的软件指令来同步对存储器的访问的同步机制。 指定适用于不同程序线程中的软件指令的至少一个序列的同步相关参数。 覆盖模型被定义为同步相关参数值的多维交叉积。 使用覆盖模型生成至少一个测试程序,并且通过对设计进行至少一个测试程序来测试设计与存储器模型的一致性。

    Highly specialized scenarios in random test generation
    6.
    发明授权
    Highly specialized scenarios in random test generation 有权
    随机测试生成中的高度专业化场景

    公开(公告)号:US07434101B2

    公开(公告)日:2008-10-07

    申请号:US11085791

    申请日:2005-03-21

    IPC分类号: G06F11/00

    CPC分类号: G01R31/318385 G06F17/5022

    摘要: Improvements in functional verification of a design are achieved by providing a test template that specifies test parameters directed to a function of the design. An exemption mode of operation is associated with a portion of the template, in which constraints and variables associated with the template are revised. The template is an input to a CSP engine, which, in cooperation with a test generator engine, produces test scenarios that lie in an expanded region of the generator's usual operational space. Provision is made for independently enabling and disabling a plurality of exemption modes of operation that are associated with the same or different areas of the template.

    摘要翻译: 通过提供一个指定针对设计功能的测试参数的测试模板来实现对设计的功能验证的改进。 豁免模式与模板的一部分相关联,其中与模板相关联的约束和变量被修改。 该模板是CSP引擎的输入,CSP引擎与测试发生器引擎协同生成位于发电机通常运行空间扩展区域内的测试场景。 规定用于独立地启用和禁用与模板的相同或不同区域相关联的多个豁免操作模式。

    METHOD AND APPARATUS FOR GENERATING QUESTIONS
    7.
    发明申请
    METHOD AND APPARATUS FOR GENERATING QUESTIONS 审中-公开
    用于产生问题的方法和装置

    公开(公告)号:US20130196305A1

    公开(公告)日:2013-08-01

    申请号:US13360808

    申请日:2012-01-30

    IPC分类号: G09B3/00

    摘要: A computer-implemented method and apparatus for generating questions. The method comprises receiving a rule; dynamically generating a graph representing a question, the graph comprising one or more nodes, each node associated with a rule having one or more variables; sampling a value from the value domain for the variable; and synthesizing a textual representation of the graph.

    摘要翻译: 用于产生问题的计算机实现的方法和装置。 该方法包括接收规则; 动态生成表示问题的图形,所述图形包括一个或多个节点,每个节点与具有一个或多个变量的规则相关联; 从变量的值域中抽取一个值; 并合成图形的文本表示。

    GENERATING RANDOM ADDRESSES FOR VERIFICATION OF DISTRIBUTED COMPUTERIZED DEVICES
    8.
    发明申请
    GENERATING RANDOM ADDRESSES FOR VERIFICATION OF DISTRIBUTED COMPUTERIZED DEVICES 失效
    生成用于验证分布式计算机设备的随机地址

    公开(公告)号:US20110208945A1

    公开(公告)日:2011-08-25

    申请号:US12709533

    申请日:2010-02-22

    申请人: Allon Adir Gil Shurek

    发明人: Allon Adir Gil Shurek

    IPC分类号: G06F12/00

    CPC分类号: G06F12/1425

    摘要: Testing a circuit in a post-silicon stage is performed by enabling the different processing entities of the circuit to determine a consistent access permissions schema in a random manner. Based upon the consistent access permissions schema, addresses to be accessed during the testing of the circuit may be determined. The addresses may be determined in a random manner. The consistent permissions schema may be determined based on a template representative of repetitive portions of access permissions schema. The disclosed subject matter may utilize biasing modules to bias the test generation to provide a test having a predetermined characteristic. The disclosed subject matter may utilize a joint random seed or other techniques to provide for consistent random decisions by the different processing entities.

    摘要翻译: 通过使电路的不同处理实体以随机方式确定一致的访问许可模式来执行后硅阶段中的电路测试。 基于一致的访问许可模式,可以确定在电路测试期间要访问的地址。 地址可以以随机方式确定。 可以基于表示访问许可模式的重复部分的模板来确定一致的权限模式。 所公开的主题可以利用偏置模块来偏置测试生成以提供具有预定特性的测试。 所公开的主题可以利用联合随机种子或其他技术来提供不同处理实体的一致随机决定。

    TWO PASS TEST CASE GENERATION USING SELF-MODIFYING INSTRUCTION REPLACEMENT
    9.
    发明申请
    TWO PASS TEST CASE GENERATION USING SELF-MODIFYING INSTRUCTION REPLACEMENT 失效
    使用自我修改指示替换的两次测试案例生成

    公开(公告)号:US20110197049A1

    公开(公告)日:2011-08-11

    申请号:US12700970

    申请日:2010-02-05

    IPC分类号: G06F9/38

    CPC分类号: G06F9/3816 G06F9/3005

    摘要: A test code generation technique that replaces instructions having a machine state dependent result with special redirection instructions provides generation of test code in which state dependent execution choices are made without a state model. Redirection instructions cause execution of a handler than examines the machine state and replaces the redirection instruction with a replacement instruction having a desired result resolved in accordance with the current machine state. The instructions that are replaced may be conditional branch instructions and the result a desired execution path. The examination of the machine state permits determination of a branch condition for the replacement instruction so that the next pass of the test code executes along the desired path. Alternatively, the handler can execute a jump to the branch instruction, causing immediate execution of the desired branch path. The re-direction instructions may be illegal instructions, which cause execution of an interrupt handler that performs the replacement.

    摘要翻译: 使用特殊重定向指令替代具有机器状态相关结果的指令的测试代码生成技术提供测试代码的生成,其中在不使用状态模型的情况下进行状态相关的执行选择。 重定向指令导致处理程序的执行,而不是检查机器状态,并根据当前机器状态用具有期望结果的替换指令替换重定向指令。 被替换的指令可以是条件分支指令,并且结果是可能的执行路径。 对机器状态的检查允许确定替换指令的分支条件,使得测试代码的下一遍沿着期望的路径执行。 或者,处理程序可以执行跳转到分支指令,导致立即执行所需的分支路径。 重定向指令可能是非法指令,这些指令导致执行替换的中断处理程序的执行。

    Adaptive test program generation
    10.
    发明授权
    Adaptive test program generation 失效
    自适应测试程序生成

    公开(公告)号:US06925405B2

    公开(公告)日:2005-08-02

    申请号:US10040940

    申请日:2002-01-09

    CPC分类号: G06F11/263

    摘要: A test program generator that produces test instructions according to a specification of a system being verified. The instructions are typically generated randomly, at least in part, and are then. The system is capable of interpreting events, detecting an impending occurrence of an event, and responding to the event by switching to an alternate input stream.

    摘要翻译: 一种测试程序生成器,其根据被验证的系统的规范产生测试指令。 指令通常随机生成,至少部分地,然后是。 该系统能够解释事件,检测即将发生的事件,以及通过切换到替代输入流来响应事件。