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公开(公告)号:US20240017376A1
公开(公告)日:2024-01-18
申请号:US18352446
申请日:2023-07-14
Applicant: Applied Materials, Inc.
Inventor: Brian J. Brown , Chirantha Rodrigo , Ekaterina A. Mikhaylichenko , Boguslaw A. Swedek , Thomas H. Osterheld , Dominic J. Benvegnu , Lakshmanan Karuppiah
IPC: B24B49/04 , B24B57/02 , B24B37/013 , B24B37/26
CPC classification number: B24B49/045 , B24B57/02 , B24B37/013 , B24B37/26
Abstract: A chemical mechanical polishing system includes a support configured to hold a substrate face-up, a polishing article having a polishing surface smaller than an exposed surface of the substrate, a port for dispensing a polishing liquid, one or more actuators to bring the polishing surface into contact with a first portion of the exposed surface of the substrate and to generate relative motion between the substrate and the polishing pad and optically transmissive polymer window, an in-situ optical monitoring system, and a controller configured to receive a signal from the optical in-situ monitoring system and to modifying a polishing parameter based on the signal. The optical monitoring system includes a light source and a detector, the in-situ optical monitoring system configured to direct a light beam from above the support to impinge a non-overlapping second portion of the exposed surface of the substrate.
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公开(公告)号:US12194591B2
公开(公告)日:2025-01-14
申请号:US17684285
申请日:2022-03-01
Applicant: Applied Materials, Inc.
Inventor: Ekaterina A. Mikhaylichenko , Fred C. Redeker , Brian J. Brown , Chirantha Rodrigo , Steven M. Zuniga , Jay Gurusamy
Abstract: A polishing apparatus includes a support configured to receive and hold a substrate in a plane, a polishing pad affixed to a cylindrical surface of a rotary drum, a first actuator to rotate the drum about a first axis parallel to the plane, a second actuator to bring the polishing pad on the rotary drum into contact with the substrate, and a port for dispensing a polishing liquid to an interface between the polishing pad and the substrate.
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公开(公告)号:US20240017371A1
公开(公告)日:2024-01-18
申请号:US18352432
申请日:2023-07-14
Applicant: Applied Materials, Inc.
Inventor: Brian J. Brown , Chirantha Rodrigo , Ekaterina A. Mikhaylichenko , Boguslaw A. Swedek , Thomas H. Osterheld , Dominic J. Benvegnu , Lakshmanan Karuppiah
IPC: B24B37/013
CPC classification number: B24B37/013
Abstract: A chemical mechanical polishing system includes a support configured to hold a substrate face-up, a polishing article having a polishing surface smaller than an exposed surface of the substrate, a port for dispensing a polishing liquid, one or more actuators to bring the polishing surface into contact with a first portion of the exposed surface of the substrate and to generate relative motion between the substrate and the polishing pad and optically transmissive polymer window, an in-situ optical monitoring system, and a controller configured to receive a signal from the optical in-situ monitoring system and to modifying a polishing parameter based on the signal. The optical monitoring system includes a light source and a detector, the in-situ optical monitoring system configured to direct a light beam from above the support to impinge a non-overlapping second portion of the exposed surface of the substrate.
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公开(公告)号:US12138733B2
公开(公告)日:2024-11-12
申请号:US17684285
申请日:2022-03-01
Applicant: Applied Materials, Inc.
Inventor: Ekaterina A. Mikhaylichenko , Fred C. Redeker , Brian J. Brown , Chirantha Rodrigo , Steven M. Zuniga , Jay Gurusamy
Abstract: A polishing apparatus includes a support configured to receive and hold a substrate in a plane, a polishing pad affixed to a cylindrical surface of a rotary drum, a first actuator to rotate the drum about a first axis parallel to the plane, a second actuator to bring the polishing pad on the rotary drum into contact with the substrate, and a port for dispensing a polishing liquid to an interface between the polishing pad and the substrate.
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公开(公告)号:US20220281062A1
公开(公告)日:2022-09-08
申请号:US17684285
申请日:2022-03-01
Applicant: Applied Materials, Inc.
Inventor: Ekaterina A. Mikhaylichenko , Fred C. Redeker , Brian J. Brown , Chirantha Rodrigo , Steven M. Zuniga , Jay Gurusamy
Abstract: A polishing apparatus includes a support configured to receive and hold a substrate in a plane, a polishing pad affixed to a cylindrical surface of a rotary drum, a first actuator to rotate the drum about a first axis parallel to the plane, a second actuator to bring the polishing pad on the rotary drum into contact with the substrate, and a port for dispensing a polishing liquid to an interface between the polishing pad and the substrate.
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公开(公告)号:US10026597B2
公开(公告)日:2018-07-17
申请号:US15397429
申请日:2017-01-03
Applicant: Applied Materials, Inc.
Inventor: Chirantha Rodrigo , Jingchun Zhang , Lili Ji , Anchuan Wang , Nitin K. Ingle
IPC: H01J37/32 , H01L21/311 , C23C16/44 , H01L21/67
Abstract: The present disclosure provides methods for cleaning chamber components post substrate etching. In one example, a method for cleaning includes activating an etching gas mixture using a plasma to create an activated etching gas mixture, the etching gas mixture comprising hydrogen-containing precursor and a fluorine-containing precursor and delivering the activated etching gas mixture to a processing region of a process chamber, the process chamber having an edge ring positioned therein, the edge ring comprising a catalyst and anticatalytic material, wherein the activated gas removes the anticatalytic material from the edge ring.
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