RETICLE PROCESSING SYSTEM
    5.
    发明申请

    公开(公告)号:US20210173295A1

    公开(公告)日:2021-06-10

    申请号:US17110514

    申请日:2020-12-03

    Abstract: Provided herein are apparatus, systems and methods for processing reticle blanks. A reticle processing system includes a support assembly having a plate coupled to a frame, and a carrier base assembly supported on the support assembly. The carrier base assembly comprises a wall extending from a top surface of the carrier base and defining a containment region for a reticle.

    System And Method To Control PVD Deposition Uniformity

    公开(公告)号:US20200335331A1

    公开(公告)日:2020-10-22

    申请号:US16850670

    申请日:2020-04-16

    Abstract: A physical vapor deposition chamber comprising a tilting substrate support is described. Methods of processing a substrate are also provided comprising tilting at least one of the substrate and the target to improve the uniformity of the layer on the substrate from the center of the substrate to the edge of the substrate. Process controllers are also described which comprise one or more process configurations causing the physical deposition chamber to perform the operations of rotating a substrate support within the physical deposition chamber and tilting the substrate support at a plurality of angles with respect to a horizontal axis.

    Deposition system with shield mount

    公开(公告)号:US11236415B2

    公开(公告)日:2022-02-01

    申请号:US16444570

    申请日:2019-06-18

    Abstract: A deposition system and a method of operation thereof are disclosed. A PVD chamber is disclosed comprising a plurality of cathode assemblies, a rotating shield below the plurality of cathode assemblies to expose one of the plurality cathode assemblies through the shroud and through a shield hole of the shield, the shield comprising a top surface including a raised peripheral frame. A shield mount sized and shaped to engage with the raised peripheral frame to secure the shield mount to the shield.

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