-
公开(公告)号:US20160348243A1
公开(公告)日:2016-12-01
申请号:US15114666
申请日:2015-01-22
Applicant: BASF SE
Inventor: Ke XU , Christian SCHILDKNECHT , Jan SPIELMANN , Juergen FRANK , Florian BLASBERG , Daniel LOEFFLER , Martin GAERTNER , Sabine WEIGUNY , Kerstin SCHIERLE-ARNDT , Katharina FEDERSEL , Falko ABELS
IPC: C23C16/455 , C07F15/06 , C07F15/04 , B01J13/00 , C07F3/00
CPC classification number: C23C16/45553 , C07F3/00 , C07F3/003 , C07F15/045 , C07F15/065
Abstract: The present invention relates to a process for the generation of thin inorganic films on substrates, in particular an atomic layer deposition process. This process comprises bringing a compound of general formula (I) into the gaseous or aerosol state and depositing the compound of general formula (I) from the gaseous or aerosol state onto a solid substrate, wherein R1, R2, R3, R4, R5, and R6 are independent of each other hydrogen, an alkyl group, or a trialkylsilyl group, n is an integer from 1 to 3, M is a metal or semimetal, 1 X is a ligand which coordinates M, and m is an integer from 0 to 4.
-
公开(公告)号:US20180044357A1
公开(公告)日:2018-02-15
申请号:US15557178
申请日:2016-03-02
Applicant: BASF SE
Inventor: Jan SPIELMANN , Falko ABELS , Florian BLASBERG , Katharina FEDERSEL , Christian SCHILDKNECHT , Daniel LOEFFLER , Torben ADERMANN , Juergen FRANK , Kerstin SCHIERLE-ARNDT , Sabine WEIGUNY
IPC: C07F7/08 , C23C16/455 , C23C16/18 , C09D1/00
CPC classification number: C07F7/0814 , C07D207/08 , C09D1/00 , C23C16/18 , C23C16/409 , C23C16/45553
Abstract: The present invention is in the field of processes for the generation of thin inorganic films on substrates. In particular the present invention relates to a process comprising bringing a com-pound of general formula (I) into the gaseous or aerosol state Ln-M-XmL=formula and depositing the compound of general formula (I) from the gaseous or aerosol state onto a solid substrate, wherein R1, R2, R3, R4, are independent of each other hydrogen, an alkyl group, an aryl group, or a SiA3 group with A being an alkyl or aryl group, and at least two of R1, R2, R3, R4 are a SiA3 group, n is an integer from 1 to 4, M is a metal or semimetal, X is a ligand which coordinates M, and m is an integer from 0 to 4.
-