LASER-RELEASABLE BONDING MATERIALS FOR 3-D IC APPLICATIONS

    公开(公告)号:US20200234993A1

    公开(公告)日:2020-07-23

    申请号:US16747271

    申请日:2020-01-20

    Abstract: Novel polyketanil-based compositions for use as a laser-releasable composition for temporary bonding and laser debonding processes are provided. The inventive compositions can be debonded using various UV lasers, at wavelengths from about 300 nm to about 360 nm, leaving behind little to no debris. The layers formed from these compositions possess good thermal stabilities and are resistant to common solvents used in semiconductor processing. The compositions can also be used as build-up layers for redistribution layer formation.

    Laser-releasable bonding materials for 3-D IC applications

    公开(公告)号:US11610801B2

    公开(公告)日:2023-03-21

    申请号:US16747271

    申请日:2020-01-20

    Abstract: Novel polyketanil-based compositions for use as a laser-releasable composition for temporary bonding and laser debonding processes are provided. The inventive compositions can be debonded using various UV lasers, at wavelengths from about 300 nm to about 360 nm, leaving behind little to no debris. The layers formed from these compositions possess good thermal stabilities and are resistant to common solvents used in semiconductor processing. The compositions can also be used as build-up layers for redistribution layer formation.

    TEMPORARY BONDING AND DEBONDING PROCESS TO PREVENT DEFORMATION OF METAL CONNECTION IN THERMOCOMPRESSION BONDING

    公开(公告)号:US20220262755A1

    公开(公告)日:2022-08-18

    申请号:US17672020

    申请日:2022-02-15

    Abstract: Achieving homogeneous and heterogeneous integration for 2.5D and 3D integrated circuit, chip-to-wafer, chip-to-substrate, or wafer-to-wafer bonding is an essential technology. The landing wafer or substrate is bonded with a carrier by using a temporary bonding material before thinning the landing wafer to the desired thickness. Upon completion of redistribution layer formation, Cu pad formation, or other backside processing, dies or wafers with through-silicon vias are stacked onto the landing substrate before molding and singulation. As the landing wafer usually has interconnection metals in the bond line, and those interconnection metals are typically made from lead-free solder alloys, deformation of those solder alloys during thermocompression bonding becomes an issue for manufacturers. To address this issue, a polymeric material with desired strengths is coated on the device wafer to form a conformal protective layer on top of solder alloys, thus enabling temporary bonding and debonding processes.

Patent Agency Ranking