System and method for localizing and passivating defects in a photovoltaic element
    9.
    发明申请
    System and method for localizing and passivating defects in a photovoltaic element 审中-公开
    用于定位和钝化光伏元件中的缺陷的系统和方法

    公开(公告)号:US20110156716A1

    公开(公告)日:2011-06-30

    申请号:US13060412

    申请日:2009-08-28

    IPC分类号: G01R31/26

    CPC分类号: H02S50/10 G01R31/025

    摘要: The present invention relates to a system and method for localizing defects causing leakage currents in a photovoltaic element (100), a system and method for passivating defects causing leakage currents in a photovoltaic element and a system and method for passivating a shunt in a roll-to-roll photovoltaic element comprising the steps of illuminating an area (130), having at least a minimum size, of the photovoltaic element; measuring at least one electrical value of an electrical potential between electrodes of the photovoltaic element at least one specific measurement position within the illuminated area on one of the electrodes of the photovoltaic element; and determining a position of a defect based on the measured at least one photomduced electrical value and the at least one specific measurement position.

    摘要翻译: 本发明涉及用于定位导致光电元件(100)中的漏电流的缺陷的系统和方法,用于钝化导致光伏元件中的漏电流的缺陷的系统和方法以及用于钝化光伏元件中的分流的方法, 所述光伏元件包括以下步骤:照射具有至少最小尺寸的光伏元件的区域(130); 测量所述光伏元件的电极之间的电位的至少一个电值,所述光电元件的所述电极中的一个电极中的所述照明区域内的至少一个特定测量位置; 以及基于所测量的至少一个光致电值和所述至少一个特定测量位置来确定缺陷的位置。