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公开(公告)号：US11360033B2
公开(公告)日：2022-06-14
申请号：US17182642
申请日：2021-02-23
Applicant: CKD CORPORATION
Inventor： Yukihiro Taguchi
Abstract: An inspection device includes: an illumination device that irradiates an object with near infrared light; a spectroscope that disperses reflected light from the object irradiated with the near infrared light; an imaging device that takes a spectroscopic image of the reflected light dispersed by the spectroscope; and a processor. The processor: obtains spectral data at a plurality of points on the object based on the spectroscopic image obtained by the imaging device; selects, as typical spectral data representing the object from among the spectral data at the plurality of points, one of: spectral data in which a luminance value in a predetermined wavelength is a median value; and spectral data in which a summation of luminance values in a predetermined wavelength range is a median value; and performs a predetermined analysis for the object based on the typical spectral data and detects a different type of object.
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公开(公告)号：US20200172279A1
公开(公告)日：2020-06-04
申请号：US16784817
申请日：2020-02-07
Applicant: CKD CORPORATION
Inventor： Yukihiro Taguchi , Hisanao Wate , Shozo Oda , Eiji Ota
Abstract: A blister packaging machine includes: a pocket portion forming unit that forms a pocket portion having a bottom portion and a side portion, in a belt-like container film, and adjusts balance between a thickness of the bottom portion and a thickness of the side portion; an illumination device that is disposed on a downstream side of the pocket portion forming unit, and irradiates the pocket portion with an electromagnetic radiation; an imaging device that is disposed on a side opposite to the illumination device across the container film, and obtains transmitted image data based on the electromagnetic radiation transmitted through the pocket portion; a side portion state detector that detects a state of the thickness of the side portion based on the transmitted image data; and a controller that controls an operation of the pocket portion forming unit.
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公开(公告)号：US20200047934A1
公开(公告)日：2020-02-13
申请号：US16655348
申请日：2019-10-17
Applicant: CKD CORPORATION
Inventor： Yukihiro Taguchi , Tsuyoshi Ohyama , Norihiko Sakaida
IPC: B65B57/10 , B65B47/04 , B65B9/04 , G01N21/27 , G01N21/359
Abstract: An inspection device includes: an irradiator that irradiates an object with near-infrared light; a spectroscope that disperses reflected light from the irradiated object; an imaging device that takes a spectroscopic image of the reflected light; a processor that: obtains spectral data of a plurality of points on the object, based on the spectroscopic image; defines a group of similar spectral data from among the spectral data of the plurality of points; extracts a group having a largest number of spectral data from the defined group; calculates an average of the spectral data of the extracted group; and detects a type of the object using a predetermined analysis of the object, based on the average.
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公开(公告)号：US20250100735A1
公开(公告)日：2025-03-27
申请号：US18976594
申请日：2024-12-11
Applicant: CKD CORPORATION
Inventor： Yukihiro Taguchi , Shiori Imaizumi , Shozo Oda
Abstract: A packaged item inspection device includes: an illumination device that irradiates the packaged item with ultraviolet light; an imaging device that images the ultraviolet light reflected from the packaged item and obtains regular reflection light image data of the packaged item; and a hardware processor that determines whether the packaging material in the packaged item is defective or non-defective, based on the regular reflection light image data, depending on presence or absence of any tear or break in the packaging material. The hardware processor further processes the regular reflection light image data by a binarization process and thereby obtains binarized image data, and upon determining that an area of a connected region of a dark portion in the binarized image data is greater than a preset reference value, outputs a result of determination indicating that the packaging material is defective due to the presence of the tear or break.
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公开(公告)号：US20240337609A1
公开(公告)日：2024-10-10
申请号：US18748379
申请日：2024-06-20
Applicant: CKD CORPORATION
Inventor： Yukihiro Taguchi , Shozo Oda , Shiori Imaizumi
IPC: G01N21/958 , G01N21/952 , G06T7/00
CPC classification number: G01N21/958 , G01N21/952 , G06T7/0002 , G01N2201/02 , G01N2201/08
Abstract: An inspection device includes: an illumination device that irradiates the inspection object with light; a rotation unit that rotates the inspection object; a fiber optical plate that holds optical fibers in parallel and has a light incident surface and a light emission surface at which outlets of the optical fibers are disposed; an imaging unit that includes sensor elements arranged in a row and respectively corresponding to the outlets, and takes an image of the inspection object; a control device that determines whether a quality of the inspection object is good or poor based on the image; and an oblique ray attenuation body that is disposed between the light emission surface and the imaging unit, and includes attenuation function elements arrayed in parallel and each having a straight cylindrical shape that surrounds an optical path between each of the outlets and each of the sensor elements.
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Patent Agency Ranking
公开(公告)号：US11338950B2
公开(公告)日：2022-05-24
申请号：US16592902
申请日：2019-10-04
Applicant: CKD CORPORATION
Inventor： Yukihiro Taguchi , Tsuyoshi Ohyama , Norihiko Sakaida
IPC: G01J5/02 , B65B57/10 , B65B9/04 , B65D75/36 , G01N21/3563 , G01N21/359 , G01N21/95
Abstract: An inspection device includes: an irradiator that irradiates an object with near-infrared light; a spectroscope that has a slit where reflected light enters and that disperses the reflected light into wavelength component lights; an imaging device that comprises an imaging element that takes a spectroscopic image of the wavelength component lights; and a processor that: obtains spectral data based on the spectroscopic image; and detects a type of the object using a predetermined analysis based on the spectral data. Each of the wavelength component lights is a single wavelength light, the inspection device satisfies L≥2P, where L is a width of each of the wavelength component lights in a wavelength dispersion direction on a light receiving surface of the imaging element and P is a width of a pixel in the wavelength dispersion direction on the light receiving surface.
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公开(公告)号：US20210199594A1
公开(公告)日：2021-07-01
申请号：US17201611
申请日：2021-03-15
Applicant: CKD CORPORATION
Inventor： Yukihiro Taguchi
Abstract: An inspection device includes: an illumination device that irradiates an object with near-infrared light; a spectroscope that disperses reflected light from the object irradiated with the near-infrared light; an imaging device that takes a spectroscopic image of the reflected light dispersed by the spectroscope; and a processor. The processor obtains spectral data at a plurality of points on the object based on the spectroscopic image obtained by the imaging device, selects, from among the spectral data at the plurality of points, a group having a highest density of luminance values of a predetermined wavelength component as a dense spectral data group, and performs a predetermined analysis for the object based on the dense spectral data group and detects a different type of object.
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公开(公告)号：US20200333256A1
公开(公告)日：2020-10-22
申请号：US16919490
申请日：2020-07-02
Applicant: CKD CORPORATION
Inventor： Yukihiro Taguchi
IPC: G01N21/86 , G01N21/359 , G01N21/3563 , B65B5/02 , B65B5/10 , B65B57/00
Abstract: An inspection device includes: an illumination device that irradiates standard and inspection objects with near-infrared light; a spectroscope that disperses reflected light; an imaging device that takes images of first and second optical spectrums of the reflected light dispersed by the spectroscope to obtain standard spectroscopic image data and inspection spectroscopic image data; and a processor. The processor executes a predetermined arithmetic operation with regard to at least one of (i) each pixel row of the standard spectroscopic image data perpendicular to a wavelength dispersion direction and (ii) each pixel column of the standard spectroscopic image data parallel to the wavelength dispersion direction. The processor, based on luminance values of pixels belonging to the pixel row or column, determines a characteristic of the pixel row and grasps a wavelength sensitivity characteristic of the imaging element under the near-infrared light emitted from the illumination device.
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公开(公告)号：US12152996B2
公开(公告)日：2024-11-26
申请号：US18164221
申请日：2023-02-03
Applicant: CKD CORPORATION
Inventor： Shozo Oda , Yukihiro Taguchi , Eiji Ohta
Abstract: An inspection device inspects a formation state of a pocket portion formed in a container film of a blister pack and includes: an illumination device that irradiates a container film including the pocket portion with a predetermined electromagnetic wave; an imaging device that takes an image of at least the electromagnetic wave transmitted through a bottom portion of the pocket portion and obtains image data; a control device that extracts, based on the image data, shading pattern data corresponding to a shading pattern occurring in the bottom portion of the pocket portion by irradiation with the electromagnetic wave; a storage that stores a neural network and a model, the model being generated by learning of the neural network using, as learning data, only shading pattern data of a pocket portion without any formation defect among the extracted shading pattern data.
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公开(公告)号：US12007331B2
公开(公告)日：2024-06-11
申请号：US16919490
申请日：2020-07-02
Applicant: CKD CORPORATION
Inventor： Yukihiro Taguchi
IPC: B65B5/02 , B65B5/10 , B65B57/00 , G01N21/3563 , G01N21/359 , G01N21/86 , B29C51/18 , B29C51/46 , B29L31/00
CPC classification number: G01N21/86 , B65B5/02 , B65B5/103 , B65B57/00 , G01N21/3563 , G01N21/359 , B29C51/18 , B29C51/46 , B29L2031/712 , G01N2021/869 , G01N2201/127
Abstract: An inspection device includes: an illumination device that irradiates standard and inspection objects with near-infrared light; a spectroscope that disperses reflected light; an imaging device that takes images of first and second optical spectrums of the reflected light dispersed by the spectroscope to obtain standard spectroscopic image data and inspection spectroscopic image data; and a processor. The processor executes a predetermined arithmetic operation with regard to at least one of (i) each pixel row of the standard spectroscopic image data perpendicular to a wavelength dispersion direction and (ii) each pixel column of the standard spectroscopic image data parallel to the wavelength dispersion direction. The processor, based on luminance values of pixels belonging to the pixel row or column, determines a characteristic of the pixel row and grasps a wavelength sensitivity characteristic of the imaging element under the near-infrared light emitted from the illumination device.
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