Particle processing apparatus and methods
    1.
    发明申请
    Particle processing apparatus and methods 失效
    粒子处理装置及方法

    公开(公告)号:US20040238753A1

    公开(公告)日:2004-12-02

    申请号:US10829841

    申请日:2004-04-22

    Inventor: David G. Mikolas

    CPC classification number: H01J37/317 H01J37/08 H01J37/3007

    Abstract: This invention relates to an apparatus for processing particles. The apparatus comprises a particle source having an exist aperture; an extraction electrode located at the exist aperture; an acceleration electrode adjacent to the extraction electrode; a processing compartment adjacent to the acceleration electrode; and a deceleration electrode located adjacent to the processing compartment. The invention also relates to methods of processing particles and to particles processed by the apparatus and methods of the invention.

    Abstract translation: 本发明涉及一种处理颗粒的装置。 该装置包括具有存在孔径的颗粒源; 位于存在的孔的引出电极; 与提取电极相邻的加速电极; 与加速电极相邻的加工室; 以及位于处理室附近的减速电极。 本发明还涉及处理颗粒和通过本发明的装置和方法处理的颗粒的方法。

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