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8 条记录 (耗时 0.037 秒)

    Probe assembly for measuring conductivity of plated through holes
    3.
    发明授权
    Probe assembly for measuring conductivity of plated through holes 失效
    用于测量电镀通孔的电导率的探针组件

    公开(公告)号：US4245189A

    公开(公告)日：1981-01-13

    申请号：US48547

    申请日：1979-06-14

    申请人： Robert O. Wahl ,  Derek Lieber ,  Jay M. Lesser

    发明人： Robert O. Wahl ,  Derek Lieber ,  Jay M. Lesser

    IPC分类号： H05K3/00 ,  G01R1/067 ,  G01R1/073 ,  G01R1/06 ,  G01R27/14

    CPC分类号： G01R1/06788

    摘要： An improved probe assembly for measuring the conductivity of a plated through hole in a circuit board. The probe assembly having a longitudinal housing and including at the forward end thereof a segmented current injection electrode, each segment being spring biased forwardly and capable of independent movement longitudinally with respect to the housing between a forward position and rearward position. The segmented current injection electrode injecting current into the through hole substantially 360.degree. of the circular edge formed by the intersection of the walls defining the through hole and the surface of the circuit board. A voltage measurement electrode being a knife-blade electrode is positioned in the interstices between the segments of the current injection electrode. The voltage measurement electrode also being spring biased in a forward direction and capable of longitudinal movement between a forward position and a rearward position. The voltage measurement electrode contacting the circular edge of the through hole at multiple points to insure a good electrical contact for voltage measurement.

    摘要翻译： 用于测量电路板中电镀通孔的电导率的改进的探针组件。 探针组件具有纵向壳体并且在其前端包括分段电流注入电极，每个段向前弹簧偏置并且能够在前进位置和后部位置之间相对于壳体纵向独立地移动。 分段电流注入电极通过形成通孔的壁与电路板表面形成的圆形边缘大致360°的通孔注入电流。 作为刀片电极的电压测量电极位于电流注入电极的段之间的间隙中。 电压测量电极也被向前的方向弹簧偏压并且能够在前进位置和后部位置之间纵向移动。 电压测量电极在多个点处接触通孔的圆形边缘，以确保良好的电接触以进行电压测量。

    Backscatter apparatus and method for measuring thickness of a continuously moving coated strip of substrate material
    4.
    发明授权
    Backscatter apparatus and method for measuring thickness of a continuously moving coated strip of substrate material 失效
    用于测量基底材料的连续移动的涂覆条带的厚度的后向散射装置和方法

    公开(公告)号：US4229652A

    公开(公告)日：1980-10-21

    申请号：US911974

    申请日：1978-06-02

    申请人： Jacques Weinstock ,  Derek Lieber ,  William D. Hay

    发明人： Jacques Weinstock ,  Derek Lieber ,  William D. Hay

    IPC分类号： G01B15/02 ,  G01N23/203 ,  G01Q10/00 ,  G01Q60/16 ,  G01N23/00

    CPC分类号： G01B15/02 ,  G01N23/203

    摘要： A backscatter measurement device for measuring the thickness of a coating on a strip of substrate material moving from a feed supply to a take up location at a predetermined speed. A measurement wheel is provided on the rim of which are mouted backscatter probes for irradiating and detecting the backscattered radiation from the coated substrate. The coated strip of substrate material is threaded around the outer surface of the rim. The measurement wheel is rotated at a speed such that the tangential speed of a point on the rim equals the speed of the moving strip whereby the probe and an adjacent point on the strip are stationary relative to one another while the point on the strip is adjacent the rim. Thus thickness measurements may be taken without stopping the movement of the coated strip.

    摘要翻译： 一种后向散射测量装置，用于测量基板材料条上的涂层的厚度，其以预定速度从进给供给位置移动到卷取位置。 测量轮设置在其边缘上，是用于照射和检测来自涂覆的基底的反向散射辐射的向后散射探测器。 涂覆的基材材料带围绕边缘的外表面旋拧。 测量轮以一定速度旋转，使得边缘上的点的切线速度等于移动条的速度，由此探针和条带上的相邻点相对于彼此是固定的，而带上的点相邻 边缘 因此，可以在不停止涂覆的条的移动的情况下进行厚度测量。

    Backscatter instrument for measuring thickness of a continuously moving coated strip of substrate material
    5.
    发明授权
    Backscatter instrument for measuring thickness of a continuously moving coated strip of substrate material 失效
    背面散射仪器，用于测量连续移动的基底材料涂层条带的厚度

    公开(公告)号：US4115690A

    公开(公告)日：1978-09-19

    申请号：US803250

    申请日：1977-06-03

    申请人： Jacques Weinstock ,  Derek Lieber ,  William Dunning Hay

    发明人： Jacques Weinstock ,  Derek Lieber ,  William Dunning Hay

    IPC分类号： G01Q60/22 ,  G01B15/02 ,  G01N23/203 ,  G01N23/00

    CPC分类号： G01B15/02

    摘要： A backscatter measurement device for measuring the thickness of a coating on a strip of substrate material moving from a feed supply to a take up location at a predetermined speed. A measurement wheel is provided on the rim of which are mounted backscatter probes for irradiating and detecting the backscattered radiation from the coated substrate. The coated strip of substrate material is threaded around the outer surface of the rim. The measurement wheel is rotated at a speed such that the tangential speed of a point on the rim equals the speed of the moving strip whereby the probe and an adjacent point on the strip are stationary relative to one another while the point on the strip is adjacent the rim. Thus thickness measurements may be taken without stopping the movement of the coated strip.

    摘要翻译： 一种后向散射测量装置，用于测量基板材料条上的涂层的厚度，其以预定速度从进给供给位置移动到卷取位置。 测量轮设置在其边缘上，其安装有后向散射探针，用于照射和检测来自涂覆的基底的背向散射的辐射。 涂覆的基材材料带围绕边缘的外表面旋拧。 测量轮以一定速度旋转，使得边缘上的点的切线速度等于移动条的速度，由此探针和条带上的相邻点相对于彼此是固定的，而条带上的点相邻 边缘 因此，可以在不停止涂覆的条的移动的情况下进行厚度测量。

    Backscatter instrument having indexing feature for measuring coating thickness of elements on a continuously moving web of substrate material
    6.
    发明授权
    Backscatter instrument having indexing feature for measuring coating thickness of elements on a continuously moving web of substrate material 失效
    背散射仪器具有用于测量基底材料的连续移动的网状物上的元件的涂层厚度的分度特征

    公开(公告)号：US4190770A

    公开(公告)日：1980-02-26

    申请号：US851735

    申请日：1977-11-15

    申请人： James Saunders ,  William D. Hay ,  Jacques Weinstock ,  Derek Lieber

    发明人： James Saunders ,  William D. Hay ,  Jacques Weinstock ,  Derek Lieber

    IPC分类号： G01Q60/22 ,  G01B15/02 ,  G01N23/00

    CPC分类号： G01B15/02

    摘要： A backscatter measurement device for measuring the thickness of a coating on elements forming a web of substrate material moving from a feed supply to a take-up location at a predetermined speed. A measurement wheel is provided, adjacent to the rim of which is mounted a backscatter probe for irradiating and detecting the backscattered radiation from a coated substrate. The web of substrate material is threaded around the outer surface of the rim. The measurement wheel is rotated at a speed such that the tangential speed of a point on the rim equals the speed of the moving web whereby the probe and an adjacent point on the web are stationary relative to one another while the point on the web is adjacent the rim. Thus thickness measurements may be taken without stopping the movement of the coated web. This backscatter measurement device is further provided with indexing apparatus to position automatically the probe directly adjacent an element to be measured on the web.

    摘要翻译： 一种反向散射测量装置，用于测量以预定速度从形成从供料供给到卷取位置的衬底材料幅材的元件上的涂层的厚度。 提供了测量轮，邻近其边缘安装有用于照射和检测来自涂覆基底的反向散射辐射的后向散射探针。 衬底材料的网围绕轮缘的外表面旋拧。 测量轮以一定速度旋转，使得边缘上的点的切线速度等于移动幅材的速度，由此探针和幅材上的相邻点相对于彼此是固定的，而幅材上的点相邻 边缘 因此，可以在不停止涂布的网的移动的情况下进行厚度测量。 该反向散射测量装置还设置有分度装置，用于将探针自动定位在幅材上待测量的元件上。

    Incremental compilation of C++ programs
    7.
    发明授权
    Incremental compilation of C++ programs 失效
    增量编译C ++程序

    公开(公告)号：US06182281B2

    公开(公告)日：2001-01-30

    申请号：US08838205

    申请日：1997-04-16

    申请人： Lee Richard Nackman ,  Michael Karasick ,  John Joseph Barton ,  Derek Lieber ,  David Joseph Streeter

    发明人： Lee Richard Nackman ,  Michael Karasick ,  John Joseph Barton ,  Derek Lieber ,  David Joseph Streeter

    IPC分类号： G06F9445

    CPC分类号： G06F8/48

    摘要： An enhanced compiler for compiling C++ programs without the use of forward declarations normally included in program header files. Through multiple parsing passes, the compiler extracts definitions for the declarations directly from the bodies of the C++ files. By saving the definitions to a persistent program representation, for example a program database, on subsequent sweeps, only definitions for new or changed declarations need be updated. In this way, C++ programs can be incrementally compiled on a declaration by declaration basis.

    摘要翻译： 用于编译C ++程序而不使用通常包含在程序头文件中的前向声明的增强型编译器。 通过多次解析传递，编译器直接从C ++文件的主体中提取声明的定义。 通过将定义保存为持久程序表示，例如程序数据库，在随后的扫描中，只需更新新的或更改的声明的定义。 以这种方式，C ++程序可以通过声明的方式递增编译。

    Thickness measurement instrument with memory storage of multiple calibrations
    8.
    发明授权
    Thickness measurement instrument with memory storage of multiple calibrations 失效
    厚度测量仪器，具有多次校准的存储器存储

    公开(公告)号：US4155009A

    公开(公告)日：1979-05-15

    申请号：US785530

    申请日：1977-04-07

    申请人： Sidney Lieber ,  Julius Schlesinger ,  Derek Lieber ,  Alfred Baker

    发明人： Sidney Lieber ,  Julius Schlesinger ,  Derek Lieber ,  Alfred Baker

    IPC分类号： G01B15/02 ,  G01N23/203 ,  G01N23/00 ,  G01D18/00

    CPC分类号： G01B15/02 ,  G01N23/203

    摘要： An improved backscatter instrument for the nondestructive measurement of coatings on a substrate. A memory having selectable memory areas, each area having stored intelligence available which is determinative of the shape of a functional plot of coating thickness versus backscatter counts per minute unique for each particular combination of emitting isotope, substrate material, coating material and physical characteristics of the measuring instrument. A memory selector switch connects a selected area of memory to a microprocessor operating under program control whereby the microprocessor reads the intelligence stored at the selected area and converts the backscattered count of the coating being measured into indicia of coating thickness.

    摘要翻译： 一种改进的反向散射仪器，用于对基底上的涂层进行非破坏性测量。 具有可选择存储区域的存储器，每个区域具有可用的存储的智能，其确定涂层厚度与每分钟的每个特定组合的特定组合的涂层厚度与每分钟后向散射计数的功能图的形状的形状，所述特定组合对于发射同位素，衬底材料，涂层材料和物理特性 测量仪器。 存储器选择器开关将存储器的选定区域连接到在程序控制下操作的微处理器，由此微处理器读取存储在所选区域的智能，并将被测量的涂层的背散射计数转换为涂层厚度的标记。