Abstract:
A structure of a flexible element has a force-receiving portion and a fixing portion, wherein the force-receiving portion is extended to have two arms for connecting with the fixing portion, so as to form two bending portions therebetween, characterized in that an inner end point is defined inside the fixing portion and the inner edges of the fixing portion are extended from the inner edges of the bending portion and intersected at the inner end point, so that a force-distributing section is defined between the bending portion and the inner end point, for distributing the torque applied on the bending portion, so as to eliminate the problem of too much concentrated stress.
Abstract:
A method for monitoring paging messages in a mobile station with a subscriber identity card camping on a cell is provided. A paging channel is monitored at every end of predetermined time interval subsequent to the last monitored time. It is detected whether the same identity information is repeatedly broadcasted in the paging channel at different ends of predetermined time interval. A new time interval is determined when detecting that the same identity information is repeatedly broadcasted. The paging channel is monitored at every end of new time interval subsequent to the last monitored time so as to receive subsequent paging messages from the cell, wherein the new time interval is longer than the predetermined time interval.
Abstract:
An embedded memory device solves the problem of the low reliability of the circuit due to the unstable power source. The embedded memory includes a metal-oxide semiconductor (MOS) capacitor and a metal-insulator-metal (MIM) capacitor to increase the stability of the power source ring to stabilize the voltage of the embedded memory and stabilize the voltage for the peripheral circuit of the embedded memory.
Abstract:
A universal system for testing different semiconductor devices provides a probe head with a probe pattern that may be used to test different test patterns formed on different semiconductor devices. Each of a plurality of bumps or pads of the test pattern contacts a corresponding probe of the probe head to enable the semiconductor device to be tested. The universal probe head may additionally or alternatively include a substrate design on the probe head that provides a pattern on the substrate of the probe head that may be used in conjunction with different patterns formed on a plurality of different printed circuit boards for testing different semiconductor devices.
Abstract:
A specific code indicative of a specific request is used to provide a communication device with an ability to send specific calls, such as emergency calls and silent calls, and the ability to distinguish the specific calls from the received calls. A method of sending a call includes generating a specific code indicative of a specific request, adding the specific code to a call, and then sending the call to a receiver for notifying the receiver of the specific request. A method of receiving a call includes determining whether a received call comprises a specific code indicative of a specific request, and generating an indication in response to the specific request when the received call is determined to comprise the specific code.
Abstract:
A specific code indicative of a specific request is used to provide a communication device with an ability to send specific calls, such as emergency calls and silent calls, and the ability to distinguish the specific calls from the received calls. A method of sending a call includes generating a specific code indicative of a specific request, adding the specific code to a call, and then sending the call to a receiver for notifying the receiver of the specific request. A method of receiving a call includes determining whether a received call comprises a specific code indicative of a specific request, and generating an indication in response to the specific request when the received call is determined to comprise the specific code.
Abstract:
A method for determining an overlay registration correction for a new product lot of a microelectronic product type with respect to a specific alignment tool within a foundry facility first provides for determining: (1) a first average historic overlay registration correction for historic product lots of the new product lot type with respect to the specific alignment tool; and (2) a second average historic overlay registration correction with respect to product lots of any product type with respect to the specific alignment tool. The overlay registration correction is determined as the sum of: (1) an overlay registration correction for an immediately preceding layer within the new product lot, if present; (2) a factor derived from the first average historic overlay registration correction; and (3) a factor derived from the second average historic overlay registration correction.
Abstract:
A universal system for testing different semiconductor devices provides a probe head with a probe pattern that may be used to test different test patterns formed on different semiconductor devices. Each of a plurality of bumps or pads of the test pattern contacts a corresponding probe of the probe head to enable the semiconductor device to be tested. The universal probe head may additionally or alternatively include a substrate design on the probe head that provides a pattern on the substrate of the probe head that may be used in conjunction with different patterns formed on a plurality of different printed circuit boards for testing different semiconductor devices.
Abstract:
A method for monitoring paging messages in a mobile station with a subscriber identity card camping on a cell is provided. A paging channel is monitored at every end of predetermined time interval subsequent to the last monitored time. It is detected whether the same identity information is repeatedly broadcasted in the paging channel at different ends of predetermined time interval. A new time interval is determined when detecting that the same identity information is repeatedly broadcasted. The paging channel is monitored at every end of new time interval subsequent to the last monitored time so as to receive subsequent paging messages from the cell, wherein the new time interval is longer than the predetermined time interval.
Abstract:
An embedded memory device solves the problem of the low reliability of the circuit due to the unstable power source. The embedded memory includes a metal-oxide semiconductor (MOS) capacitor and a metal-insulator-metal (MIM) capacitor to increase the stability of the power source ring to stabilize the voltage of the embedded memory and stabilize the voltage for the peripheral circuit of the embedded memory.