摘要:
An improved photo resist coating and developing system comprising a track unit and a scanner unit is disclosed. The track unit has a coating unit for coating photo resist on a wafer. The scanner unit includes an enhanced wafer pre-alignment module, an expose stage, and a develop module. The enhanced wafer pre-alignment module is capable of performing wafer edge exposure (WEE) which conventionally required a separate WEE module as part of the track unit. By incorporating the WEE function into the wafer pre-alignment module of the scanner unit, the WEE module of the track unit is no longer required and duplication of wafer alignment and centering performed by the WEE module is eliminated.
摘要:
A method and system for identifying a defocus wafer by mapping a topography of each wafer in a first wafer batch using a level sensor apparatus (100); calculating a focus spot deviation (402) from the data, the focus spot deviation (402) corresponding to a height by which a focus spot of a photo exposure module would be defocused by the topography; converting the focus spot deviation (402) to a corresponding wafer stage set point to which the photo exposure module is set, to focus the focus spot on each wafer in the wafer batch; and identifying a defocus wafer in the wafer batch, as a wafer having a topography that would defocus the focus spot, even when the photo exposure module is set to the wafer stage set point.
摘要:
A method and system for identifying a defocus wafer by mapping a topography of each wafer in a first wafer batch using a level sensor apparatus (100); calculating a focus spot deviation (402) from the data, the focus spot deviation (402) corresponding to a height by which a focus spot of a photo exposure module would be defocused by the topography; converting the focus spot deviation (402) to a corresponding wafer stage set point to which the photo exposure module is set, to focus the focus spot on each wafer in the wafer batch; and identifying a defocus wafer in the wafer batch, as a wafer having a topography that would defocus the focus spot, even when the photo exposure module is set to the wafer stage set point.
摘要:
A fabrication method for a liquid crystal display. A pair of substrates is provided. An alignment layer is formed on the respective substrates. An energy beam is irradiated on a predetermined area of at least one of the alignment layers. The alignment layer is rubbed to form a first pretilt-angle area in the predetermined area exposed to the energy beam, and a second pretilt-angle area not exposed to the energy beam. The pair of substrates are bonded with a preset gap therebetween, and a liquid crystal layer is inserted between the substrates. The liquid crystals corresponding to the first pretilt angle area have a first pretilt angle of θ1, while those corresponding to the second pretilt angle area have a second pretilt angle of θ2.
摘要:
A method of lithography patterning includes coating a resist layer on a substrate; performing an exposing process to the resist layer using a lithography tool with a numerical aperture tuned between about 0.5 and about 0.6; baking the resist layer; thereafter performing a first developing process to the resist layer for a first period of time; and performing a second developing process to the resist layer for a second period of time.
摘要:
An overdrive apparatus applied to a display system is provided. The overdrive apparatus includes an indication unit, an access circuit and a plurality of memories. The indication unit provides an indication signal corresponding to a scan line of an image frame. The access unit reads a first overdrive table from a first memory among the memories, and loads a second overdrive table to a second memory among the memories according to the indication signal. The first overdrive table and the second overdrive table respectively correspond to a first region and a second region of the image frame.
摘要:
A fabrication method for a liquid crystal display. A pair of substrates is provided. An alignment layer is formed on the respective substrates. An energy beam is irradiated on a predetermined area of at least one of the alignment layers. The alignment layer is rubbed to form a first pretilt-angle area in the predetermined area exposed to the energy beam, and a second pretilt-angle area not exposed to the energy beam. The pair of substrates are bonded with a preset gap therebetween, and a liquid crystal layer is inserted between the substrates. The liquid crystals corresponding to the first pretilt angle area have a first pretilt angle of θ1, while those corresponding to the second pretilt angle area have a second pretilt angle of θ2.
摘要:
A polymer gel display, fabrication method and operating structure thereof. Display is enabled by utilizing the flexing characteristic of a polymer-gel sheet. A pair of substrates is separated by a predetermined gap, and a polymer-gel sheet of a first color disposed therebetween, having two ends fixed, a center area flexible and contacting no more than one of the substrates. A fluid layer of a second color is disposed between the substrates, displaying its color via the substrate not contacting the polymer-gel sheet. An external electric field is applied to the polymer-gel sheet, flexing the polymer-gel sheet toward the substrate until making contact and the first color of the polymer-gel sheet is displayed via the substrate.
摘要:
A liquid crystal display (LCD) panel and a fabricating method thereof are described. First, a first substrate and a second substrate are provided. A liquid crystal monomer layer is then formed on the surface of at least one of the first and second substrates. Next, a curing step is performed to the liquid crystal monomer layer to induce a polymerization reaction, so as to form a liquid crystal polymer layer. Thereafter, the first and second substrates are assembled and a liquid crystal layer is filled between the first and second substrates.
摘要:
A method of lithography patterning includes coating a resist layer on a substrate; performing an exposing process to the resist layer using a lithography tool with a numerical aperture tuned between about 0.5 and about 0.6; baking the resist layer; thereafter performing a first developing process to the resist layer for a first period of time; and performing a second developing process to the resist layer for a second period of time.