Imaging apparatus and method
    2.
    发明授权
    Imaging apparatus and method 有权
    成像设备及方法

    公开(公告)号:US07174037B2

    公开(公告)日:2007-02-06

    申请号:US10220479

    申请日:2001-02-28

    IPC分类号: G06K9/00

    CPC分类号: G01N21/4795 G01N21/3581

    摘要: An apparatus and method for imaging a sample, the apparatus including a source for irradiating a sample with a beam of substantially continuous electromagnetic radiation having a frequency in the range 25 GHz to 100 THz; means for subdividing an area of the sample which is to be imaged into a two dimensional array of pixels; means for detecting radiation from each pixel wherein the detector is configured to detect a phase dependent quantity of the detected radiation which is measured relative to the radiation which irradiates the sample.

    摘要翻译: 一种用于对样本进行成像的装置和方法,所述装置包括用于用具有25GHz至100THz范围内的频率的基本上连续的电磁辐射束照射样品的源; 用于将待成像的样品的区域细分成二维像素阵列的装置; 用于检测来自每个像素的辐射的装置,其中所述检测器被配置为检测相对于照射所述样品的辐射测量的所述检测到的辐射的相位相关量。

    Imaging apparatus and method
    3.
    发明授权
    Imaging apparatus and method 有权
    成像设备及方法

    公开(公告)号:US07152007B2

    公开(公告)日:2006-12-19

    申请号:US10732556

    申请日:2003-12-09

    IPC分类号: G01R23/00

    摘要: A system for investigating a sample, the system including a detector having non-linear current voltage characteristics and being configured to mix two radiation signals having frequencies in the range from 25 GHz to 100 THz, one of the signals being a local oscillator signal and the other signal being a sample signal carrying information about the sample being investigated, the system further having a quantum cascade laser for providing at least the local oscillator signal.

    摘要翻译: 一种用于调查样本的系统,所述系统包括具有非线性电流电压特性的检测器,并且被配置为混合具有在25GHz至100THz范围内的频率的两个辐射信号,所述信号中的一个是本地振荡器信号, 其他信号是携带关于正在研究的样本的信息的采样信号,该系统还具有用于至少提供本地振荡器信号的量子级联激光器。

    Apparatus and method for investigating a sample
    4.
    发明授权
    Apparatus and method for investigating a sample 失效
    用于调查样品的装置和方法

    公开(公告)号:US06865014B2

    公开(公告)日:2005-03-08

    申请号:US10240341

    申请日:2001-03-29

    CPC分类号: G01N21/3581

    摘要: An apparatus for investigating a sample, the apparatus comprising an emitter (1) for irradiating the sample (27) with a beam of emitted electromagnetic radiation; and a detector (49) for detecting the radiation reflected from the sample, wherein there is an optically non-linear member (15) which functions as both an active part of the emitter and an active part of the detector, said emitter and detector using the same part of the optically non-linear member (15). The electromagnetic radiation is primarily intended to be in the terahertz (THz) frequency range.

    摘要翻译: 一种用于调查样品的装置,该装置包括用于用发射的电磁辐射束照射样品(27)的发射体(1) 以及用于检测从样品反射的辐射的检测器(49),其中存在用作发射器的有源部分和检测器的有源部分的光学非线性部件(15),所述发射器和检测器使用 光学非线性构件(15)的相同部分。 电磁辐射主要是在太赫兹(THz)频率范围内。

    Apparatus and method for investigating a sample
    5.
    发明授权
    Apparatus and method for investigating a sample 有权
    用于调查样品的装置和方法

    公开(公告)号:US07214940B2

    公开(公告)日:2007-05-08

    申请号:US10466398

    申请日:2002-01-16

    IPC分类号: G01J5/02 G01N23/04

    摘要: An apparatus for investigating a sample comprising a source of a beam of radiation, a detector for detecting a beam of radiation reflected by or transmitted through a sample to be imaged, an optical subsystem for manipulating the beam between the source and detector and means for translating the optical subsystem along a first translation axis relative to the source and detector to scan the beam across the sample, wherein the source and the detector are on opposite sides of the subsystem and the beam from the source and the beam reflected or transmitted each enter and exit the subsystem in a direction parallel to the first direction of translation. The apparatus is also suitable for maintaining the relative phase of two beams of radiation, during translation of an optical subsystem.

    摘要翻译: 一种用于调查包括辐射束源的样本的检测器,用于检测由要成像的样品反射或透射的要被成像的样品的辐射束的检测器,用于操纵源和检测器之间的光束的光学子系统和用于平移的装置 所述光学子系统沿着相对于所述源的第一平移轴和所述检测器扫描横跨所述样本的所述光束,其中所述源和所述检测器位于所述子系统的相对侧上,并且来自所述源的所述光束和所述反射或透射的光束每次进入和 在平行于第一个翻译方向的方向退出子系统。 该装置还适用于在光学子系统的平移过程中维持两束辐射的相对相位。

    Imaging apparatus and method
    6.
    发明授权
    Imaging apparatus and method 有权
    成像设备及方法

    公开(公告)号:US07335883B2

    公开(公告)日:2008-02-26

    申请号:US10489542

    申请日:2002-07-29

    IPC分类号: G01N21/17

    摘要: A method of imaging a sample, the method comprising: (a) irradiating a sample with a pulse of electromagnetic radiation, said pulse having a plurality of frequencies in the range from 25 GHz to 100 THz; (b) determining a first parameter related to the amplitude of the radiation, which is either reflected from and/or transmitted by the sample, in the time domain; (c) calculating the value of the first parameter at a first time value relative to the value of the first parameter at a second time value which coincides with a physical feature of the dataset of the first parameter with respect to time; and (d) generating an image by plotting the value calculated in step (c) for different points of the sample.

    摘要翻译: 一种对样品成像的方法,所述方法包括:(a)用电磁辐射脉冲照射样品,所述脉冲具有在25GHz至100THz范围内的多个频率; (b)在时域中确定与样品反射和/或透射的辐射幅度相关的第一参数; (c)在与第一参数的数据集相对于时间的物理特征相符合的第二时间值处,相对于第一参数的值计算第一参数的值; 以及(d)通过绘制样品的不同点的步骤(c)中计算出的值来生成图像。

    Test system
    7.
    发明授权

    公开(公告)号:US10006960B2

    公开(公告)日:2018-06-26

    申请号:US13984980

    申请日:2012-02-13

    申请人: Bryan Edward Cole

    发明人: Bryan Edward Cole

    摘要: A reflectometer for allowing a test of a device, the reflectometer comprising: a source of pulsed radiation; a first photoconductive element configured to output a pulse in response to irradiation from said pulsed source; a second photoconductive element configured to receive a pulse; a transmission line arrangement configured to direct the pulse from the first photoconductive element to the device under test and to direct the pulse reflected from the device under test to the second photoconductive element; and a termination resistance provided for said transmission line configured to match the impedance of the transmission line.

    TEST SYSTEM
    8.
    发明申请
    TEST SYSTEM 有权
    测试系统

    公开(公告)号:US20140021963A1

    公开(公告)日:2014-01-23

    申请号:US13984980

    申请日:2012-02-13

    申请人: Bryan Edward Cole

    发明人: Bryan Edward Cole

    IPC分类号: G01R31/28

    摘要: A reflectometer for allowing a test of a device, the reflectometer comprising: a source of pulsed radiation; a first photoconductive element configured to output a pulse in response to irradiation from said pulsed source; a second photoconductive element configured to receive a pulse; a transmission line arrangement configured to direct the pulse from the first photoconductive element to the device under test and to direct the pulse reflected from the device under test to the second photoconductive element; and a termination resistance provided for said transmission line configured to match the impedance of the transmission line.

    摘要翻译: 一种用于允许对装置进行测试的反射计,所述反射计包括:脉冲辐射源; 第一光电导元件,被配置为响应于来自所述脉冲源的照射而输出脉冲; 配置成接收脉冲的第二光电导元件; 传输线装置,被配置为将脉冲从第一光电导元件引导到被测器件,并将从被测器件反射的脉冲引导到第二光导元件; 以及针对配置成匹配传输线路的阻抗的所述传输线路提供的终端电阻。

    SCANNING TERAHERTZ PROBE
    9.
    发明申请
    SCANNING TERAHERTZ PROBE 有权
    扫描TERAHERTZ探头

    公开(公告)号:US20110028824A1

    公开(公告)日:2011-02-03

    申请号:US12675887

    申请日:2008-08-28

    IPC分类号: A61B6/00 A61B5/00 G01J5/02

    摘要: A THz radiation probe (1) for examining an object (8), the probe comprising a first portion configured to be inserted into an opening of said object in a first direction (5), said probe further comprising at least one THz emitter (15), directing means (7) for directing THz radiation emitted from said emitter to said object via an aperture (2) located at said first portion and subsequently from said object to at least one THz detector (17) and, means for scanning said emitted THz radiation across said object in a scan direction, said scan direction having a component in said first direction (5).

    摘要翻译: 一种用于检查物体(8)的太赫兹辐射探针(1),所述探头包括构造成沿第一方向(5)插入所述物体的开口中的第一部分,所述探针还包括至少一个太赫兹发射器(15) ),用于经由位于所述第一部分并且随后从所述物体到达至少一个THz检测器(17)的孔(2)将从所述发射器发射的THz辐射引导到所述物体的引导装置(7)和用于扫描所述发射 所述扫描方向上所述物体的太赫兹辐射,所述扫描方向具有所述第一方向(5)的分量。

    Scanning terahertz probe
    10.
    发明授权
    Scanning terahertz probe 有权
    扫描太赫兹探头

    公开(公告)号:US09006660B2

    公开(公告)日:2015-04-14

    申请号:US12675887

    申请日:2008-08-28

    摘要: A THz radiation probe (1) for examining an object (8), the probe comprising a first portion configured to be inserted into an opening of said object in a first direction (5), said probe further comprising at least one THz emitter (15), directing means (7) for directing THz radiation emitted from said emitter to said object via an aperture (2) located at said first portion and subsequently from said object to at least one THz detector (17) and, means for scanning said emitted THz radiation across said object in a scan direction, said scan direction having a component in said first direction (5).

    摘要翻译: 一种用于检查物体(8)的太赫兹辐射探针(1),所述探头包括构造成沿第一方向(5)插入所述物体的开口中的第一部分,所述探针还包括至少一个太赫兹发射器(15) ),用于经由位于所述第一部分并且随后从所述物体到达至少一个THz检测器(17)的孔(2)将从所述发射器发射的THz辐射引导到所述物体的引导装置(7)和用于扫描所述发射 所述扫描方向上所述物体的太赫兹辐射,所述扫描方向具有所述第一方向(5)的分量。