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14 条记录 (耗时 0.016 秒)

    STRUCTURED LIGHT PROJECTION FOR SPECULAR SURFACES
    1.
    发明申请
    STRUCTURED LIGHT PROJECTION FOR SPECULAR SURFACES 审中-公开

    公开(公告)号：US20190226835A1

    公开(公告)日：2019-07-25

    申请号：US16256460

    申请日：2019-01-24

    申请人： CyberOptics Corporation

    发明人： Eric P. Rudd ,  Carl E. Haugan ,  Paul R. Haugen

    IPC分类号： G01B11/25 ,  G06K9/00 ,  G02B27/09 ,  H04N5/225

    摘要： A system for generating a three-dimensional height image of a reflective target includes an illumination source configured to generate a patterned illumination on the reflective target, and an imaging system configured to acquire an image of the patterned illumination on the reflective target, the illumination source and camera being aligned relative to the target such that the camera acquires a specular image of the patterned illumination. The system further including a controller coupled to the illumination source and the camera configured to generate a first height image of the target based on the acquired image, the first height image being used by the controller to determine a position, a height, and a tilt of the target and calculate an error function based on the determination to compensate the first height image for the calculated error.

    Automatic programming of solder paste inspection system
    3.
    发明授权
    Automatic programming of solder paste inspection system 有权

    公开(公告)号：US11176635B2

    公开(公告)日：2021-11-16

    申请号：US14160864

    申请日：2014-01-22

    申请人： CyberOptics Corporation

    发明人： Douglas G. Butler ,  Carl E. Haugan

    IPC分类号： G01N23/18 ,  G06T3/00 ,  G06T7/00 ,  G06K9/62

    摘要： A system for measuring solder paste stencil aperture positions and sizes is provided. The system includes at least one camera configured to acquire images of the stencil and an alignment target. A motion system generates relative motion between the at least one camera and the stencil. A controller is coupled to and controls the motion system. The controller is configured to analyze the images to generate aperture information relative to the stencil. The aperture information is provided to automatically program a solder paste inspection system. Other features and benefits that characterize embodiments of the present invention will be apparent upon reading the following detailed description and review of the associated drawings.

    THREE-DIMENSIONAL SENSOR WITH COUNTERPOSED CHANNELS
    4.
    发明申请
    THREE-DIMENSIONAL SENSOR WITH COUNTERPOSED CHANNELS 有权

    公开(公告)号：US20210088328A1

    公开(公告)日：2021-03-25

    申请号：US17113753

    申请日：2020-12-07

    申请人： CyberOptics Corporation

    发明人： Paul R. Haugen ,  Evan J. Ribnick ,  Carl E. Haugan ,  Eric P. Rudd

    IPC分类号： G01B11/25 ,  G01B11/30 ,  H04N5/372

    摘要： A method of determining dimensional information of a target surface includes generating a first point cloud corresponding to a first plurality of reconstructed surface points of the target surface generated by a first imaging system-illumination source pair of a phase profilometry system; generating a second point cloud corresponding to a second plurality of reconstructed surface points of the target surface generated by a second imaging system-illumination source pair of the phase profilometry system; generating an initial estimate of the target surface based on the first and second point clouds; and refining the initial surface estimate using positions of the first and second point clouds and geometry of the first and second imaging system-illumination source pairs to generate a final point cloud.

    Three-dimensional sensor with counterposed channels
    6.
    发明授权
    Three-dimensional sensor with counterposed channels 有权

    公开(公告)号：US11604062B2

    公开(公告)日：2023-03-14

    申请号：US17113753

    申请日：2020-12-07

    申请人： CyberOptics Corporation

    发明人： Paul R. Haugen ,  Evan J. Ribnick ,  Carl E. Haugan ,  Eric P. Rudd

    IPC分类号： G01B11/25 ,  G01B11/30 ,  H04N5/372

    摘要： A method of determining dimensional information of a target surface includes generating a first point cloud corresponding to a first plurality of reconstructed surface points of the target surface generated by a first imaging system-illumination source pair of a phase profilometry system; generating a second point cloud corresponding to a second plurality of reconstructed surface points of the target surface generated by a second imaging system-illumination source pair of the phase profilometry system; generating an initial estimate of the target surface based on the first and second point clouds; and refining the initial surface estimate using positions of the first and second point clouds and geometry of the first and second imaging system-illumination source pairs to generate a final point cloud.

    Point cloud merging from multiple cameras and sources in three-dimensional profilometry
    7.
    发明授权
    Point cloud merging from multiple cameras and sources in three-dimensional profilometry 有权

    公开(公告)号：US10346963B2

    公开(公告)日：2019-07-09

    申请号：US14850470

    申请日：2015-09-10

    申请人： CyberOptics Corporation

    发明人： Eric P. Rudd ,  Carl E. Haugan

    IPC分类号： G01B11/25 ,  G06T7/00 ,  G06T7/521 ,  G06T7/586

    摘要： A computer-implemented method of and system for measuring a three-dimensional surface are provided. The method includes projecting structured illumination on the surface and acquiring a plurality of sets of images. The sets of images are processed to obtain a plurality of point clouds. A spatial accumulator is defined. A first point cloud of the plurality of point clouds is combined with a second point cloud of the plurality of point clouds into the spatial accumulator. Spatial coordinates of the surface are generated based on the contents of the spatial accumulator.

    AUTOMATIC PROGRAMMING OF SOLDER PASTE INSPECTION SYSTEM
    8.
    发明申请
    AUTOMATIC PROGRAMMING OF SOLDER PASTE INSPECTION SYSTEM 审中-公开
    焊膏检测系统的自动编程

    公开(公告)号：US20140210993A1

    公开(公告)日：2014-07-31

    申请号：US14160864

    申请日：2014-01-22

    申请人： CyberOptics Corporation

    发明人： Douglas G. Butler ,  Carl E. Haugan

    IPC分类号： G06T7/00 ,  G06T3/00 ,  H04N7/18

    CPC分类号： G06T3/00 ,  G06K9/6255 ,  G06T7/001 ,  G06T2207/30141

    摘要： A system for measuring solder paste stencil aperture positions and sizes is provided. The system includes at least one camera configured to acquire images of the stencil and an alignment target. A motion system generates relative motion between the at least one camera and the stencil. A controller is coupled to and controls the motion system. The controller is configured to analyze the images to generate aperture information relative to the stencil. The aperture information is provided to automatically program a solder paste inspection system. Other features and benefits that characterize embodiments of the present invention will be apparent upon reading the following detailed description and review of the associated drawings.

    摘要翻译： 提供了一种用于测量焊膏孔板孔径位置和尺寸的系统。 该系统包括至少一个被配置为获取模板和对准目标的图像的照相机。 运动系统在至少一个相机和模板之间产生相对运动。 控制器耦合到并控制运动系统。 控制器被配置为分析图像以产生相对于模版的孔径信息。 提供光圈信息以自动编程焊膏检查系统。 通过阅读以下有关附图的详细描述和审查，本发明的实施例的其它特征和益处将是显而易见的。

    Structured light projection for specular surfaces
    9.
    发明授权
    Structured light projection for specular surfaces 有权

    公开(公告)号：US11073380B2

    公开(公告)日：2021-07-27

    申请号：US16256579

    申请日：2019-01-24

    申请人： CyberOptics Corporation

    发明人： Eric P. Rudd ,  Carl E. Haugan ,  Paul R. Haugen

    IPC分类号： G01B11/25 ,  G06K9/00 ,  H04N5/225 ,  G02B27/09 ,  G01B11/06

    摘要： A system for generating a three-dimensional height image of a reflective test target includes an illumination source configured to generate a patterned illumination on the test target, an imaging system configured to acquire an image of the patterned illumination on the test target, and a variable focus optical system configured to cause the camera to image the test target with at least two distinct focus positions, the illumination source and camera being aligned relative to the test target such that the camera acquires a specular image of the patterned illumination. The system further including a controller coupled to the illumination source, the camera and the variable focus optical system, the controller being configured to generate a height image of the test target based on the acquired image of the patterned illumination using at least two distinct focal positions.

    FIELD CALIBRATION OF THREE-DIMENSIONAL NON-CONTACT SCANNING SYSTEM
    10.
    发明申请
    FIELD CALIBRATION OF THREE-DIMENSIONAL NON-CONTACT SCANNING SYSTEM 审中-公开

    公开(公告)号：US20170264885A1

    公开(公告)日：2017-09-14

    申请号：US15455635

    申请日：2017-03-10

    申请人： CyberOptics Corporation

    发明人： Carl E. Haugan ,  Gregory G. Hetzler ,  David W. Duquette ,  Jean-Louis Leon Dethier ,  Eric P. Rudd

    IPC分类号： H04N13/02 ,  F16M11/20 ,  H04N17/00 ,  G06T3/00 ,  G01B11/25 ,  G06T7/80

    摘要： A three-dimensional non-contact scanning system is provided. The system includes a stage and at least one scanner configured to scan an object on the stage. A motion control system is configured to generate relative motion between the at least one scanner and the stage. A controller is coupled to the at least one scanner and the motion control system. The controller is configured to perform a field calibration where an artifact having features with known positional relationships is scanned by the at least one scanner in a plurality of different orientations to generate sensed measurement data corresponding to the features. Deviations between the sensed measurement data and the known positional relationships are determined. Based on the determined deviations, a coordinate transform is calculated for each of the at least one scanner where the coordinate transform reduces the determined deviations.